Works matching DE "SILICON spectra"
1
- Revista Cubana de Física, 2008, v. 25, n. 2A, p. 75
- Cheben, P.;
- Delâge, A.;
- Densmore, A.;
- Janz, S.;
- Lamontagne, B.;
- Lapointe, J.;
- Post, E.;
- Schmid, J.;
- Waldron, P.;
- Xu, D.-X.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3891, doi. 10.1007/s10854-016-6002-3
- Sharma, Prachi;
- Tripathi, Nishant;
- Gupta, Navneet
- Article
3
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 4, p. 1751, doi. 10.1007/s10854-014-1794-5
- Li, Jiayan;
- Jia, Pengjun;
- Li, Yaqiong;
- Cao, Panpan;
- Liu, Yao;
- Tan, Yi
- Article
4
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 9, p. 1610, doi. 10.1007/s10854-012-0637-5
- Shi, Qiwu;
- Huang, Wanxia;
- Zhang, Yaxin;
- Qiao, Shen;
- Wu, Jing;
- Zhao, Dong;
- Yan, Jiazhen
- Article
5
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 175, doi. 10.1007/s10854-007-9184-x
- Costea, S.;
- Kherani, N. P.;
- Zukotynski, S.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 111, doi. 10.1007/s10854-007-9156-1
- Gharghi, M.;
- Sivoththaman, S.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 443, doi. 10.1007/s10854-007-9252-2
- Toyama, Toshihiko;
- Suzuki, Tetsuya;
- Ogane, Akiyoshi;
- Ota, Jun;
- Okamoto, Hiroaki
- Article
8
- Measurement Techniques, 2015, v. 58, n. 3, p. 256, doi. 10.1007/s11018-015-0695-1
- Gavrilenko, V.;
- Karabanov, D.;
- Kuzin, A.;
- Mityukhlyaev, V.;
- Mikhutkin, A.;
- Todua, P.;
- Filippov, M.;
- Baimukhametov, T.;
- Vasil'ev, A.
- Article
9
- Measurement Techniques, 2013, v. 56, n. 9, p. 1031, doi. 10.1007/s11018-013-0325-8
- Kovalev, A.;
- Liberman, A.;
- Mikryukov, A.;
- Moskalyuk, S.;
- Ulanovskii, M.
- Article
10
- Inorganic Materials, 2004, v. 40, n. 11, p. 1127, doi. 10.1023/B:INMA.0000048208.41695.b9
- Bardyshev, N. I.;
- Mokrushin, A. D.;
- Puryaeva, T. P.;
- Serebryakova, N. V.;
- Starkov, V. V.
- Article
11
- Inorganic Materials, 2003, v. 39, n. 4, p. 313, doi. 10.1023/A:1023253326523
- Sobolev, V. Val.;
- Timonov, A. P.;
- Sobolev, V. V.
- Article
12
- Physica Status Solidi - Rapid Research Letters, 2013, v. 7, n. 7, p. 481, doi. 10.1002/pssr.201307151
- Li, Galina V.;
- Astrova, Ekaterina V.;
- Dyakov, Sergey A.;
- Baldycheva, Anna;
- Perova, Tatiana S.;
- Tikhodeev, Sergey G.;
- Gippius, Nikolay A.
- Article
13
- Annals of the Faculty of Engineering Hunedoara - International Journal of Engineering, 2011, v. 9, n. 3, p. 411
- Article
14
- Modern Physics Letters B, 2017, v. 31, n. 33, p. -1, doi. 10.1142/S0217984917503158
- Article
15
- European Journal of Organic Chemistry, 2013, v. 2013, n. 26, p. 5814, doi. 10.1002/ejoc.201300932
- Lu, Xing;
- Li, Li;
- Yang, Wei;
- Jiang, Kezhi;
- Yang, Ke‐Fang;
- Zheng, Zhan‐Jiang;
- Xu, Li‐Wen
- Article
16
- Lasers in Engineering (Old City Publishing), 2014, v. 29, n. 3/4, p. 175
- BI, J.;
- CHEN, G.-B.;
- JIN, G.-Y.;
- ZHANG, X.-H.
- Article
17
- Journal of Thermal Spray Technology, 2009, v. 18, n. 3, p. 427, doi. 10.1007/s11666-009-9326-1
- Yaran Niu;
- Xuanyong Liu;
- Xuebin Zheng;
- Heng Ji;
- Chuanxian Ding
- Article
18
- Turkish Journal of Chemistry, 2009, v. 33, n. 3, p. 385, doi. 10.3906/kim-0805-45
- Pourmousavi, Seied Ali;
- Zinati, Zahra
- Article
19
- Instruments & Experimental Techniques, 2013, v. 56, n. 1, p. 32, doi. 10.1134/S0020441213010090
- Muminov, R.;
- Saymbetov, A.;
- Toshmurodov, Yo.
- Article
20
- Applied Physics A: Materials Science & Processing, 1997, v. 64, n. 4, p. 357, doi. 10.1007/s003390050490
- Krotkus, A.;
- Pačebutas, V.;
- Kavaliauskas, J.;
- Subačius, I.;
- Grigoras, K.;
- Šimkienė, I.
- Article
21
- Molecular Physics, 2005, v. 103, n. 5, p. 611, doi. 10.1080/00268970512331316012
- Davy, Randall;
- Skoumbourdis, Evangelos;
- Dinsmore, David
- Article
22
- Canadian Journal of Physics, 2004, v. 82, n. 1, p. 75, doi. 10.1139/p03-121
- Ech-chamikh, E.;
- Aboudihab, I.;
- Azizan, M.;
- Essafti, A.;
- Ijdiyaou, Y.
- Article
23
- Semiconductors, 2017, v. 51, n. 2, p. 178, doi. 10.1134/S1063782617020154
- Privezentsev, V.;
- Kirilenko, E.;
- Goryachev, A.;
- Batrakov, A.
- Article
24
- Semiconductors, 2008, v. 42, n. 6, p. 655, doi. 10.1134/S1063782608060055
- Article
25
- Semiconductors, 2003, v. 37, n. 1, p. 57, doi. 10.1134/1.1538540
- Astrova, E.V.;
- Korovin, L.I.;
- Lang, I.G.;
- Remenyuk, A.D.;
- Shuman, V.B.
- Article
26
- Chemistry & Industry, 2010, n. 12, p. 23
- Article
27
- Journal of Electronic Materials, 2018, v. 47, n. 9, p. 5148, doi. 10.1007/s11664-018-6337-z
- Lorenzi, Bruno;
- Dettori, Riccardo;
- Dunham, Marc T.;
- Melis, Claudio;
- Tonini, Rita;
- Colombo, Luciano;
- Sood, Aditya;
- Goodson, Kenneth E.;
- Narducci, Dario
- Article
28
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3204, doi. 10.1007/s11664-014-3286-z
- Lee, Seung-Yun;
- Bang, Ki;
- Lim, Jung
- Article
29
- Journal of Electronic Materials, 2010, v. 39, n. 6, p. 719, doi. 10.1007/s11664-010-1138-z
- Tokuda, Yutaka;
- Nagae, Youichi;
- Sakane, Hitoshi;
- Ito, Jyoji
- Article
30
- Journal of Electronic Materials, 2009, v. 38, n. 11, p. 2343, doi. 10.1007/s11664-009-0907-z
- Taylor, P. J.;
- Dhar, N. K.;
- Harris, E.;
- Swaminathan, V.;
- Chen, Y.;
- Jesser, W. A.
- Article
31
- Journal of Electronic Materials, 2008, v. 37, n. 2, p. 176, doi. 10.1007/s11664-007-0307-1
- Chen, Y. W.;
- Jiang, S. H.;
- Shao, B. X.;
- Wang, W.;
- Wang, R. C.
- Article
32
- Materialwissenschaft und Werkstoffechnik, 2016, v. 47, n. 2/3, p. 120, doi. 10.1002/mawe.201600479
- Buchenko, V. V.;
- Goloborodko, A. A.;
- Afanasieva, T. V.
- Article
33
- Astronomy & Astrophysics / Astronomie et Astrophysique, 2015, v. 574, p. 1, doi. 10.1051/0004-6361/201424394
- Del Zanna, G.;
- Fernández-Menchero, L.;
- Badnell, N. R.
- Article
34
- Technical Physics, 2012, v. 57, n. 2, p. 305, doi. 10.1134/S1063784212020156
- Len'shin, A.;
- Kashkarov, V.;
- Turishchev, S.;
- Smirnov, M.;
- Domashevskaya, E.
- Article
35
- Applied Physics A: Materials Science & Processing, 2015, v. 120, n. 1, p. 161, doi. 10.1007/s00339-015-9064-9
- Zaporozhchenko, A.;
- Chernov, S.;
- Odnodvorets, L.;
- Stetsenko, B.;
- Nepijko, S.;
- Elmers, H.;
- Schönhense, G.
- Article
36
- Applied Physics A: Materials Science & Processing, 2011, v. 105, n. 4, p. 795, doi. 10.1007/s00339-011-6651-2
- Smith, Matthew;
- Winkler, Mark;
- Sher, Meng-Ju;
- Lin, Yu-Ting;
- Mazur, Eric;
- Gradečak, Silvija
- Article
37
- Applied Physics A: Materials Science & Processing, 2011, v. 104, n. 3, p. 987, doi. 10.1007/s00339-011-6483-0
- Salingue, Nils;
- Hess, Peter
- Article
38
- European Physical Journal C -- Particles & Fields, 2017, v. 77, n. 1, p. 1, doi. 10.1140/epjc/s10052-017-4609-z
- Heller, M.;
- Schioppa, E. jr;
- Porcelli, A.;
- Pujadas, I. Troyano;
- Ziȩtara, K.;
- della Volpe, D.;
- Montaruli, T.;
- Cadoux, F.;
- Favre, Y.;
- Aguilar, J. A.;
- Christov, A.;
- Prandini, E.;
- Rajda, P.;
- Rameez, M.;
- Bilnik, W.;
- Błocki, J.;
- Bogacz, L.;
- Borkowski, J.;
- Bulik, T.;
- Frankowski, A.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 13, p. 1025, doi. 10.1049/el.2015.1265
- Cecchetti, R.;
- Piersanti, S.;
- de Paulis, F.;
- Orlandi, A.;
- Fan, J.
- Article
40
- Turkish Journal of Physics, 2012, v. 36, n. 2, p. 197, doi. 10.3906/fiz-1107-7
- Abdulrida, Moafak Cadim;
- Abdul-Ameer, Nidhal Moosa;
- Abdul-Hakeem, Shatha Mohammad
- Article
41
- Energy Technology, 2015, v. 3, n. 7, p. 699, doi. 10.1002/ente.201500034
- Van Havenbergh, Kristof;
- Turner, Stuart;
- Driesen, Kris;
- Bridel, Jean‐Sébastien;
- Van Tendeloo, Gustaaf
- Article
42
- Scientific Reports, 2015, p. 7910, doi. 10.1038/srep07910
- Meng, Lala;
- Zhang, Xiaofei;
- Tang, Yusheng;
- Su, Kehe;
- Kong, Jie
- Article
43
- Scientific Reports, 2015, p. 7659, doi. 10.1038/srep07659
- Li, Bing;
- Yao, Fei;
- Bae, Jung Jun;
- Chang, Jian;
- Zamfir, Mihai Robert;
- Le, Duc Toan;
- Pham, Duy Tho;
- Yue, Hongyan;
- Lee, Young Hee
- Article
44
- Nature Communications, 2018, v. 9, n. 1, p. 1, doi. 10.1038/s41467-018-04350-1
- Okawachi, Yoshitomo;
- Gaeta, Alexander L.;
- Yu, Mengjie;
- Griffith, Austin G.;
- Picqué, Nathalie;
- Lipson, Michal
- Article
45
- Journal of Chromatographic Science, 2012, v. 50, n. 2, p. 91, doi. 10.1093/chromsci/bmr033
- Emara, Samy;
- Kamal, Maha;
- Abdel Kawi, Mohamed
- Article
46
- Nature Photonics, 2009, v. 3, n. 4, p. 190, doi. 10.1038/nphoton.2009.39
- Article
47
- Bulletin of the Korean Chemical Society, 2017, v. 38, n. 11, p. 1362, doi. 10.1002/bkcs.11294
- Article
48
- Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 905, doi. 10.1017/S1431927612001134
- Carvajal, Joan J.;
- Bilousov, Oleksandr V.;
- Drouin, Dominique;
- Aguiló, Magdalena;
- Díaz, Francesc;
- Rojo, J. Carlos
- Article
49
- Nature, 1994, v. 368, n. 6467, p. 133, doi. 10.1038/368133a0
- Canham, L.T.;
- Cullis, A.G.
- Article
50
- Technical Physics Letters, 2017, v. 43, n. 6, p. 527, doi. 10.1134/S1063785017060128
- Article