Works matching IS 20474938 AND DT 2018 AND VI 7 AND IP 2
1
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 2, p. 91, doi. 10.1049/iet-bmt.2017.0065
- Poddar, Arnab;
- Sahidullah, Md;
- Saha, Goutam
- Article
2
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 2, p. 145, doi. 10.1049/iet-bmt.2017.0044
- Liew, Siaw‐Hong;
- Choo, Yun‐Huoy;
- Low, Yin Fen;
- Mohd Yusoh, Zeratul I.
- Article
3
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 2, p. 153, doi. 10.1049/iet-bmt.2017.0041
- Ahmadi, Neda;
- Akbarizadeh, Gholamreza
- Article
4
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 2, p. 163, doi. 10.1049/iet-bmt.2017.0036
- Lai, Kenneth;
- Kanich, Ondřej;
- Dvořák, Michal;
- Drahanský, Martin;
- Yanushkevich, Svetlana;
- Shmerko, Vlad
- Article
5
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 2, p. 125, doi. 10.1049/iet-bmt.2016.0200
- Lejbølle, Aske R.;
- Nasrollahi, Kamal;
- Moeslund, Thomas B.
- Article
6
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 2, p. 136, doi. 10.1049/iet-bmt.2016.0191
- Czajka, Adam;
- Bowyer, Kevin W.;
- Ortiz, Estefan
- Article
7
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 2, p. 116, doi. 10.1049/iet-bmt.2016.0176
- Nabila, Mansouri;
- Mohammed, Aouled Issa;
- Yousra, Ben Jemaa
- Article
8
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 2, p. 102, doi. 10.1049/iet-bmt.2016.0088
- Schuch, Patrick;
- Schulz, Simon;
- Busch, Christoph
- Article