Works matching IS 20474938 AND DT 2017 AND VI 6 AND IP 3
1
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 3, p. 200, doi. 10.1049/iet-bmt.2016.0037
- Murphy, Thomas M.;
- Broussard, Randy;
- Schultz, Robert;
- Rakvic, Ryan;
- Ngo, Hau
- Article
2
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 3, p. 232, doi. 10.1049/iet-bmt.2016.0112
- Veluchamy, S.;
- Karlmarx, L.R.
- Article
3
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 3, p. 183, doi. 10.1049/iet-bmt.2016.0087
- Gottschlich, Carsten;
- Tams, Benjamin;
- Huckemann, Stephan
- Article
4
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 3, p. 165, doi. 10.1049/iet-bmt.2016.0081
- Article
5
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 3, p. 191, doi. 10.1049/iet-bmt.2016.0043
- Troncoso‐Pastoriza, Francisco;
- García‐Mateo, Carmen;
- Fairhurst, Michael
- Article
6
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 3, p. 157, doi. 10.1049/iet-bmt.2016.0022
- Mohd Asaari, Mohd Shahrimie;
- Suandi, Shahrel Azmin;
- Rosdi, Bakhtiar Affendi
- Article
7
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 3, p. 139, doi. 10.1049/iet-bmt.2016.0017
- Kumar, Santosh;
- Singh, Sanjay Kumar
- Article
8
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 3, p. 173, doi. 10.1049/iet-bmt.2016.0008
- Sandhya, Mulagala;
- Prasad, Munaga V.N.K.
- Article
9
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 3, p. 224, doi. 10.1049/iet-bmt.2016.0007
- Ghiani, Luca;
- Hadid, Abdenour;
- Marcialis, Gian Luca;
- Roli, Fabio
- Article
10
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 3, p. 211, doi. 10.1049/iet-bmt.2016.0002
- Cintas, Celia;
- Quinto‐Sánchez, Mirsha;
- Acuña, Victor;
- Paschetta, Carolina;
- de Azevedo, Soledad;
- Cesar Silva de Cerqueira, Caio;
- Ramallo, Virginia;
- Gallo, Carla;
- Poletti, Giovanni;
- Bortolini, Maria Catira;
- Canizales‐Quinteros, Samuel;
- Rothhammer, Francisco;
- Bedoya, Gabriel;
- Ruiz‐Linares, Andres;
- Gonzalez‐José, Rolando;
- Delrieux, Claudio
- Article