Works matching IS 20474938 AND DT 2017 AND VI 6 AND IP 2
1
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 43, doi. 10.1049/iet-bmt.2016.0090
- Omar Al-Nima, Raid Rafi;
- Dlay, Satnam S.;
- Al-Sumaidaee, Saadoon A. M.;
- Wai Lok Woo;
- Chambers, Jonathon A.
- Article
2
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 117, doi. 10.1049/iet-bmt.2016.0073
- Arakala, Arathi;
- Davis, Stephen A.;
- Hao Hao;
- Horadam, Kathy J.
- Article
3
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 108, doi. 10.1049/iet-bmt.2016.0076
- Deshpande, Anand;
- Patavardhan, Prashant
- Article
4
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 79, doi. 10.1049/iet-bmt.2015.0024
- Bhuiyan, Alauddin;
- Hussain, Akter;
- Mian, Ajmal;
- Wong, Tien Y.;
- Ramamohanarao, Kotagiri;
- Kanagasingam, Yogesan
- Article
5
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 43, doi. 10.1049/iet-bmt.2016.0090
- Al‐Nima, Raid Rafi Omar;
- Dlay, Satnam S.;
- Al‐Sumaidaee, Saadoon A.M.;
- Woo, Wai Lok;
- Chambers, Jonathon A.
- Article
6
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 89, doi. 10.1049/iet-bmt.2016.0061
- Adamovic, Sasa;
- Milosavljevic, Milan;
- Veinovic, Mladen;
- Sarac, Marko;
- Jevremovic, Aleksandar
- Article
7
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 70, doi. 10.1049/iet-bmt.2016.0046
- Loka, Hans;
- Zois, Elias;
- Economou, George
- Article
8
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 97, doi. 10.1049/iet-bmt.2015.0091
- Tankasala, Sriram Pavan;
- Doynov, Plamen;
- Chrihalmeanu, Simona;
- Derakhshani, Reza
- Article
9
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 53, doi. 10.1049/iet-bmt.2015.0082
- Article
10
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 129, doi. 10.1049/iet-bmt.2015.0072
- Balazia, Michal;
- Plataniotis, Konstantinos N.
- Article
11
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 61, doi. 10.1049/iet-bmt.2015.0059
- Haraksim, Rudolf;
- Ramos, Daniel;
- Meuwly, Didier
- Article
12
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 108, doi. 10.1049/iet-bmt.2016.0076
- Deshpande, Anand;
- Patavardhan, Prashant
- Article
13
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 117, doi. 10.1049/iet-bmt.2016.0073
- Arakala, Arathi;
- Davis, Stephen. A.;
- Hao, Hao;
- Horadam, Kathy J.
- Article
14
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 89, doi. 10.1049/iet-bmt.2016.0061
- Adamovic, Sasa;
- Milosavljevic, Milan;
- Veinovic, Mladen;
- Sarac, Marko;
- Jevremovic, Aleksandar
- Article
15
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 70, doi. 10.1049/iet-bmt.2016.0046
- Loka, Hans;
- Zois, Elias;
- Economou, George
- Article
16
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 97, doi. 10.1049/iet-bmt.2015.0091
- Tankasala, Sriram Pavan;
- Doynov, Plamen;
- Chrihalmeanu, Simona;
- Derakhshani, Reza
- Article
17
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 53, doi. 10.1049/iet-bmt.2015.0082
- Article
18
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 129, doi. 10.1049/iet-bmt.2015.0072
- Balazia, Michal;
- Plataniotis, Konstantinos N.
- Article
19
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 61, doi. 10.1049/iet-bmt.2015.0059
- Haraksim, Rudolf;
- Ramos, Daniel;
- Meuwly, Didier
- Article
20
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 2, p. 79, doi. 10.1049/iet-bmt.2015.0024
- Bhuiyan, Alauddin;
- Hussain, Akter;
- Mian, Ajmal;
- Wong, Tien Y.;
- Ramamohanarao, Kotagiri;
- Kanagasingam, Yogesan
- Article