Works matching IS 20474938 AND DT 2016 AND VI 5 AND IP 4
1
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 4, p. 305, doi. 10.1049/iet-bmt.2016.0010
- Das, Abhijit;
- Ferrer, Miguel A.;
- Pal, Umapada;
- Pal, Srikanta;
- Diaz, Moises;
- Blumenstein, Michael
- Article
2
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 4, p. 276, doi. 10.1049/iet-bmt.2015.0118
- Martinho‐Corbishley, Daniel;
- Nixon, Mark S.;
- Carter, John N.
- Article
3
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 4, p. 297, doi. 10.1049/iet-bmt.2015.0057
- Simón, Marc Oliu;
- Corneanu, Ciprian;
- Nasrollahi, Kamal;
- Nikisins, Olegs;
- Escalera, Sergio;
- Sun, Yunlian;
- Li, Haiqing;
- Sun, Zhenan;
- Moeslund, Thomas B.;
- Greitans, Modris
- Article
4
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 4, p. 263, doi. 10.1049/iet-bmt.2015.0035
- Sadhya, Debanjan;
- Singh, Sanjay Kumar;
- Chakraborty, Bodhi
- Article
5
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 4, p. 284, doi. 10.1049/iet-bmt.2015.0033
- Abbas, Sherif N.;
- Abo–Zahhad, Mohammed;
- Ahmed, Sabah M.;
- Farrag, Mohammed
- Article