Works matching IS 20474938 AND DT 2016 AND VI 5 AND IP 2
1
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 147, doi. 10.1049/iet-bmt.2015.0023
- Dang, Tran Khanh;
- Nguyen, Minh Tan;
- Truong, Quang Hai
- Article
2
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 120, doi. 10.1049/iet-bmt.2015.0010
- Thai, Duy Hoang;
- Gottschlich, Carsten
- Article
3
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 65, doi. 10.1049/iet-bmt.2015.0071
- Daugman, John;
- Downing, Cathryn
- Article
4
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 140, doi. 10.1049/iet-bmt.2015.0036
- van Dam, Chris;
- Veldhuis, Raymond;
- Spreeuwers, Luuk
- Article
5
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 131, doi. 10.1049/iet-bmt.2015.0034
- Sandhya, Mulagala;
- Prasad, Munaga V.N.K.;
- Chillarige, Raghavendra Rao
- Article
6
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 111, doi. 10.1049/iet-bmt.2015.0008
- Mahmood, Zahid;
- Ali, Tauseef;
- Khan, Samee U.
- Article
7
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 92, doi. 10.1049/iet-bmt.2015.0005
- Ortiz, Estefan;
- Bowyer, Kevin W.;
- Flynn, Patrick J.
- Article
8
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 100, doi. 10.1049/iet-bmt.2014.0086
- Lin, Chuang;
- Wang, Binghui;
- Fan, Xin;
- Ma, Yanchun;
- Liu, Huiyun
- Article
9
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 76, doi. 10.1049/iet-bmt.2014.0082
- Hui‐xian, Yang;
- Yong‐yong, Cai
- Article
10
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 47, doi. 10.1049/iet-bmt.2014.0055
- Olsen, Martin Aastrup;
- Šmida, Vladimír;
- Busch, Christoph
- Article
11
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 37, doi. 10.1049/iet-bmt.2014.0053
- Panis, Gabriel;
- Lanitis, Andreas;
- Tsapatsoulis, Nicholas;
- Cootes, Timothy F.
- Article
12
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 83, doi. 10.1049/iet-bmt.2014.0075
- Galbally, Javier;
- Satta, Riccardo
- Article