Works matching IS 00135194 AND DT 2013 AND VI 49 AND IP 17
1
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1175, doi. 10.1049/el.2013.1988
- Sun, H.C.;
- Zhong, Z.;
- Guo, Y.X.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.0469
- Article
3
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.2251
- J. I. Moon;
- I. K. Cho;
- S. M. Kim;
- Y.-B. Jung
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.0835
- Quan Guo;
- Lei Zhang;
- Sheng Wang;
- Zhang Yi
- Article
6
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1045, doi. 10.1049/el.2013.2568
- Article
7
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1044, doi. 10.1049/el.2013.2569
- Article
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.2283
- Turki, B. M.;
- Parker, E. A.;
- Batchelor, J. C.;
- Ziai, M. A.;
- Sanchez-Romaguera, V.;
- Yeates, S. G.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1652
- Vazquez-Uzal, D.;
- Gabrielli, C.;
- Perrot, H.;
- Rodriguez-Pardo, L.;
- Rose, D.;
- Sel, O.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1183, doi. 10.1049/el.2013.2186
- Article
12
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.2156
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.2125
- Li-Jie Xu;
- Yong-Xin Guo;
- Wen Wu
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.2088
- Article
15
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.2058
- Chin-I. Yeh;
- Wu-Shiung Feng;
- Chia-Hsun Chen
- Article
16
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.2050
- Calvo, B.;
- Azcona, C.;
- Medrano, N.;
- Celma, S.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.2007
- Pelletti, C.;
- Bianconi, G.;
- Mittra, R.;
- Shen, Z.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1979
- Amini, M. H.;
- Hassani, H. R.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1920
- F. Lin;
- Y.-C. Jiao;
- Z. Zhang
- Article
20
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1865
- Shurong Dong;
- Lei Zhong;
- Jie Zeng;
- Wei Guo;
- Hongwei Li;
- Jun Wang;
- Zhiguang Guo;
- Juin J. Liou
- Article
21
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1856
- Yong Heng;
- Xubo Guo;
- Bisong Cao;
- Zhijun Ying;
- Bin Wei;
- Xiaoping Zhang;
- Guoyong Zhang;
- Xiaoke Song;
- Jingchen Wang
- Article
22
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1762
- Article
23
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1729
- Xuefei Zhang;
- Qimei Cui;
- Yulong Shi;
- Xiaofeng Tao
- Article
24
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1725
- R. Feng;
- Q. Li;
- Q. Zhang;
- J. Qin
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1692
- S.-L. Chen;
- G.-A. Luo;
- T.-L. Lin
- Article
26
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1661
- Article
27
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1642
- Article
28
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1637
- Article
29
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1599
- Article
30
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1178, doi. 10.1049/el.2013.1582
- Smith, G.E.;
- Garry, J.L.;
- Ewing, R.L.;
- Baker, C.J.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1587
- J. Hong;
- S. Park;
- S. Jeong;
- M. Hahn
- Article
32
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1464
- Qingming Leng;
- Ruimin Hu;
- Chao Liang;
- Yimin Wang
- Article
33
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1444
- Article
34
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1376
- Jiangbing Du;
- Fangfang Yan
- Article
35
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1340
- S. W. Guan;
- C. W. Kuo;
- H. Y. Wang;
- C. S. Hsu;
- S. M. Wu;
- C. C. Wang
- Article
36
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1173
- Balieiro, A.;
- P. Yoshioka;
- Dias, K.;
- Cordeiro, C.;
- Cavalcanti, D.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1114
- W. B. Li;
- S. H. Song;
- F. Luo
- Article
38
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.1093
- Millán, I.;
- Palacios, D.;
- Burdío, J.;
- Acero, J.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.0977
- X. Jin;
- Z.-H. Zhang;
- L. Wang;
- B.-R. Guan
- Article
40
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.0966
- Article
41
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.0893
- C. K. Tung;
- S. H. Shieh;
- C. H. Cheng
- Article
42
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.0727
- J. Yan;
- Y. Li;
- Q. Yin;
- W. Hong
- Article
43
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1180, doi. 10.1049/el.2013.1844
- Feng, Cunqian;
- Zhang, Linrang;
- Zhang, Dong;
- Guo, Yiduo
- Article
44
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.0641
- Q. T. An;
- L. Sun;
- L. Z. Sun
- Article
45
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1, doi. 10.1049/el.2013.0564
- Xin Qiu;
- Wenxin Huang;
- Feifei Bu;
- Yuwen Hu
- Article
46
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1176, doi. 10.1049/el.2012.3744
- Chu, Xiu Qin;
- Lin, Yong Jia;
- Pan, Bo Hua;
- Zhang, Songsong
- Article
47
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1188, doi. 10.1049/el.2013.1209
- Li, Wenchao;
- Wang, Xuezhi;
- Wang, Xinmin;
- Moran, Bill
- Article
48
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1186, doi. 10.1049/el.2013.0011
- Lu, Tao;
- Ge, Jianhua;
- Yang, Ye;
- Gao, Yang
- Article
49
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1184, doi. 10.1049/el.2013.2449
- Gomes, M.;
- Dinis, R.;
- Silva, V.;
- Cercas, F.;
- Tomlinson, M.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 17, p. 1152, doi. 10.1049/el.2013.1993
- Savaux, V.;
- Louët, Y.;
- Djoko‐Kouam, M.;
- Skrzypczak, A.
- Article