Works matching IS 00222720 AND DT 2001 AND VI 203 AND IP 1
Results: 17
In situ observation of oxygen deficiency occurring during electron irradiation in high T<sub>c</sub> superconductor YBa<sub>2</sub>Cu<sub>3</sub>O<sub>y</sub>.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 2, doi. 10.1046/j.1365-2818.2001.00842.x
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- Article
In situ observation and interferometric characterization of solid–liquid interface morphology in directionally growing transparent model systems.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 119, doi. 10.1046/j.1365-2818.2001.00900.x
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Dislocation mobility and electronic effects in semiconductor compounds.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 72, doi. 10.1046/j.1365-2818.2001.00901.x
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In situ observation of the initial growth process of carbon nanotubes by time-resolved high resolution transmission electron microscopy.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 40, doi. 10.1046/j.1365-2818.2001.00902.x
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Atomic force microscopy observations of in situ deformed materials: application to single crystals and thin films on substrates.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 99, doi. 10.1046/j.1365-2818.2001.00903.x
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In situ optical microscopic recording of slip line development during plastic deformation of Cu–15at%Al single crystals with high resolution – estimation of dislocation velocities.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 108, doi. 10.1046/j.1365-2818.2001.00904.x
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In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 17, doi. 10.1046/j.1365-2818.2001.00905.x
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In situ transmission electron microscopy studies and real-time digital imaging.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 128, doi. 10.1046/j.1365-2818.2001.00907.x
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High-voltage electron microscope high-temperature in situ straining experiments to study dislocation dynamics in intermetallics and quasicrystals.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 68, doi. 10.1046/j.1365-2818.2001.00908.x
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In situ observation of superdislocation motion in pre-strained Ni<sub>3</sub>Ge single crystals.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 57, doi. 10.1046/j.1365-2818.2001.00910.x
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Dynamic chemical mapping near a Si/SiO<sub>2</sub> interface at elevated temperatures using plasmon-loss images.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 12, doi. 10.1046/j.1365-2818.2001.00911.x
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Direct observation of a Ti/Cu interface with atomic displacement under electron irradiation.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 34, doi. 10.1046/j.1365-2818.2001.00912.x
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Precursor effects of martensitic transformations in Ti-based alloys studied by electron microscopy with energy filtering.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 22, doi. 10.1046/j.1365-2818.2001.00913.x
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In situ observations of unusual dislocation mechanisms in the intermetallic alloy Ti<sub>3</sub>Al.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 90, doi. 10.1046/j.1365-2818.2001.00914.x
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Is plastic flow always controlled by dislocation mobility? An answer from in situ transmission electron microscopy straining tests.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 84, doi. 10.1046/j.1365-2818.2001.00915.x
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Quantitative measurements in in situ straining experiments in transmission electron microscopy.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 47, doi. 10.1046/j.1365-2818.2001.00916.x
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Editorial.
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- Journal of Microscopy, 2001, v. 203, n. 1, p. 1, doi. 10.1046/j.1365-2818.2001.00927.x
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- Article