Works matching IS 00222720 AND DT 1999 AND VI 195 AND IP 3
Results: 10
A comparison of grain imaging and measurement using horizontal orientation and colour orientation contrast imaging, electron backscatter pattern and optical methods.
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- Journal of Microscopy, 1999, v. 195, n. 3, p. 186, doi. 10.1046/j.1365-2818.1999.00571.x
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- Article
Problems in determining the misorientation axes, for small angular misorientations, using electron backscatter diffraction in the SEM.
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- Journal of Microscopy, 1999, v. 195, n. 3, p. 217, doi. 10.1046/j.1365-2818.1999.00572.x
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Influence of grain orientations on the initiation of fatigue damage in an Al–Li alloy.
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- Journal of Microscopy, 1999, v. 195, n. 3, p. 239, doi. 10.1046/j.1365-2818.1999.00573.x
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Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI).
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- Journal of Microscopy, 1999, v. 195, n. 3, p. 197, doi. 10.1046/j.1365-2818.1999.00574.x
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- Article
Crystallographic analysis of facets using electron backscatter diffraction.
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- Journal of Microscopy, 1999, v. 195, n. 3, p. 226, doi. 10.1046/j.1365-2818.1999.00577.x
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Quantitative metallography by electron backscattered diffraction.
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- Journal of Microscopy, 1999, v. 195, n. 3, p. 170, doi. 10.1046/j.1365-2818.1999.00578.x
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Electron backscatter diffraction of grain and subgrain structures — resolution considerations.
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- Journal of Microscopy, 1999, v. 195, n. 3, p. 212, doi. 10.1046/j.1365-2818.1999.00579.x
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- Article
Electron backscatter diffraction: applications for nuclear materials.
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- Journal of Microscopy, 1999, v. 195, n. 3, p. 233, doi. 10.1046/j.1365-2818.1999.00580.x
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- Article
Source point calibration from an arbitrary electron backscattering pattern.
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- Journal of Microscopy, 1999, v. 195, n. 3, p. 204, doi. 10.1046/j.1365-2818.1999.00581.x
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- Article
Introduction.
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- Journal of Microscopy, 1999, v. 195, n. 3, p. 169, doi. 10.1046/j.1365-2818.1999.00626.x
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- Article