Works matching DE "SEMICONDUCTOR defects"
1
- Solid State Technology, 2000, v. 43, n. 6, p. 159
- Grenon, Brian J.;
- Peters, Charles R.;
- Bhattacharyya, Kaustuve
- Article
2
- Solid State Technology, 1998, v. 41, n. 7, p. 249
- Article
3
- Solid State Technology, 1998, v. 41, n. 3, p. 86
- Gross, Charlie;
- Jensen, David
- Article
4
- Solid State Technology, 1998, v. 41, n. 1, p. 30
- Article
5
- Journal of Electronic Materials, 2025, v. 54, n. 6, p. 4319, doi. 10.1007/s11664-025-11770-5
- Powell, Eli;
- Nagesha, Meghana;
- Manley, Robert G.;
- Zhu, Bin;
- Hirschman, Karl D.
- Article
6
- Chemistry - A European Journal, 2021, v. 27, n. 3, p. 1127, doi. 10.1002/chem.202004068
- Sato, Shunsuke;
- Tanaka, Sei'ichi;
- Yamanaka, Ken‐ichi;
- Saeki, Shu;
- Sekizawa, Keita;
- Suzuki, Tomiko M.;
- Morikawa, Takeshi;
- Onda, Ken
- Article
7
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 6, p. 2395, doi. 10.1007/s10854-014-1947-6
- Londos, C.;
- Sgourou, E.;
- Hall, D.;
- Chroneos, A.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 3, p. 875, doi. 10.1007/s10854-012-0842-2
- Thongbai, Prasit;
- Vangchangyia, Somsack;
- Swatsitang, Ekaphan;
- Amornkitbamrung, Vittaya;
- Yamwong, Teerapon;
- Maensiri, Santi
- Article
9
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 8, p. 718, doi. 10.1007/s10854-008-9793-z
- Article
10
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 79, doi. 10.1007/s10854-008-9616-2
- Hahn, T.;
- Schmerler, S.;
- Hahn, S.;
- Niklas, J. R.;
- Gruendig-Wendrock, B.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 500, doi. 10.1007/s10854-007-9370-x
- Pakhomov, Georgy L.;
- Kosterin, Dmitry A.;
- Pakhomov, Lev G.;
- Guo, Tzung-Fang
- Article
12
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 315, doi. 10.1007/s10854-007-9338-x
- Article
13
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 12, p. 1235, doi. 10.1007/s10854-007-9131-x
- Jun Shen;
- Yongchang Liu;
- Yajing Han;
- Houxiu Gao
- Article
14
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 12, p. 1171, doi. 10.1007/s10854-007-9276-7
- Ponce, Miguel Adolfo;
- Parra, Rodrigo;
- Castro, Miriam S.;
- Aldao, Celso M.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 12, p. 1197, doi. 10.1007/s10854-007-9277-6
- Reddy, K. M.;
- Hays, J.;
- Kundu, S.;
- Dua, L. K.;
- Biswas, P. K.;
- Wang, C.;
- Shutthanandan, V.;
- Engelhard, M. H.;
- Mathew, X.;
- Punnoose, A.
- Article
16
- Journal of Solid State Electrochemistry, 2009, v. 13, n. 8, p. 1267, doi. 10.1007/s10008-008-0661-9
- Christopher Burba;
- Roger Frech;
- Lennart Häggström;
- Anton Nytén;
- John Thomas
- Article
17
- Journal of Solid State Electrochemistry, 2009, v. 13, n. 1, p. 171, doi. 10.1007/s10008-008-0614-3
- Sándor Bodor;
- Justin Zook;
- Ernő Lindner
- Article
18
- Journal of Solid State Electrochemistry, 2008, v. 12, n. 12, p. 1619, doi. 10.1007/s10008-008-0538-y
- Nupur Sinha;
- N. Munichandraiah
- Article
19
- Inorganic Materials, 2005, v. 41, n. 10, p. 1118, doi. 10.1007/s10789-005-0270-2
- Enyashin, A. N.;
- Ivanovskii, A. L.
- Article
20
- Electronic Materials, 2024, v. 5, n. 4, p. 239, doi. 10.3390/electronicmat5040016
- Article
21
- Advanced Electronic Materials, 2021, v. 7, n. 3, p. 1, doi. 10.1002/aelm.202000908
- Article
22
- Advanced Electronic Materials, 2020, v. 6, n. 12, p. 1, doi. 10.1002/aelm.202000594
- Saha, Jewel Kumer;
- Bukke, Ravindra Naik;
- Jang, Jin
- Article
23
- Advanced Electronic Materials, 2017, v. 3, n. 6, p. 1, doi. 10.1002/aelm.201600496
- Suihkonen, Sami;
- Pimputkar, Siddha;
- Sintonen, Sakari;
- Tuomisto, Filip
- Article
24
- AIMS Materials Science, 2023, v. 10, n. 5, p. 767, doi. 10.3934/matersci.2023043
- Article
25
- AIMS Materials Science, 2016, v. 3, n. 2, p. 425, doi. 10.3934/matersci.2016.2.425
- Cebriano, Teresa;
- Hidalgo, Pedro;
- Nogales, Emilio;
- Piqueras, Javier;
- Méndez, Bianchi;
- López, Iñaki
- Article
26
- Minerals (2075-163X), 2021, v. 11, n. 6, p. 596, doi. 10.3390/min11060596
- Wang, Shuhao;
- Shen, Junfeng;
- Du, Baisong;
- Xu, Kexin;
- Zhang, Zhengshuai;
- Liu, Chengyu
- Article
27
- Communications on Pure & Applied Analysis, 2017, v. 16, n. 6, p. 2133, doi. 10.3934/cpaa.2017106
- Article
28
- Journal of Nanotechnology, 2016, p. 1, doi. 10.1155/2016/8073593
- Article
29
- Advances in Condensed Matter Physics, 2011, p. 1, doi. 10.1155/2011/910967
- Al-Douri, Ala J.;
- Al-Shakily, F. Y.;
- Alnajjar, Abdalla A.;
- Alias, Maysoon F. A.
- Article
30
- EE: Evaluation Engineering, 2010, v. 49, n. 3, p. 36
- Article
31
- 2022
- Thoan, Nguyen Hoang;
- Khoa, Bui Viet;
- Dung, Dang Duc
- Literature Review
32
- Journal of Superconductivity & Novel Magnetism, 2010, v. 23, n. 5, p. 823, doi. 10.1007/s10948-010-0720-1
- Lee, H. K.;
- Bae, S. M.;
- Choi, Y. N.
- Article
33
- Journal of Superconductivity & Novel Magnetism, 2009, v. 22, n. 4, p. 373, doi. 10.1007/s10948-008-0398-9
- Qin, Zhengping;
- Jin, Gang;
- Cai, Chuanbing;
- Cao, Shixun;
- Yao, Xin;
- Zhang, Jincang
- Article
34
- Journal of Superconductivity & Novel Magnetism, 2009, v. 22, n. 4, p. 337, doi. 10.1007/s10948-008-0440-y
- Häfliger, P.;
- Khasanov, R.;
- Lortz, R.;
- Petrović, A.;
- Togano, K.;
- Baines, C.;
- Graneli, B.;
- Keller, H.
- Article
35
- AAPP Physical, Mathematical & Natural Sciences / Atti della Accademia Peloritana dei Pericolanti: Classe di Scienze Fisiche, Matematiche e Naturali, 2019, v. 97, p. A8-1, doi. 10.1478/AAPP.97S2A8
- MAZZEO, MARIA PAOLA;
- RESTUCCIA, LILIANA
- Article
36
- Optica Applicata, 2005, v. 35, n. 3, p. 537
- SZERLING, ANNA;
- KOSIEL, KAMIL;
- WÓJCIK-JEDLIŃSKA, ANNA;
- PŁUSKA, MARIUSZ;
- BUGAJSKI, MACIEJ
- Article
37
- Optical & Quantum Electronics, 2022, v. 54, n. 12, p. 1, doi. 10.1007/s11082-022-04248-9
- Alioueche, A.;
- Benmerkhi, A.;
- Bouchemat, M.
- Article
38
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 229, doi. 10.1007/s10836-011-5271-2
- Thibeault, C.;
- Hariri, Y.;
- Hobeika, C.
- Article
39
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 375, doi. 10.1007/s10836-012-5292-5
- Article
40
- Journal of Electronic Testing, 2008, v. 24, n. 5, p. 481, doi. 10.1007/s10836-007-5059-6
- Ramyanshu Datta;
- Ravi Gupta;
- Antony Sebastine;
- Jacob Abraham;
- Manuel dâAbreu
- Article
41
- Journal of Electronic Testing, 2008, v. 24, n. 1-3, p. 203, doi. 10.1007/s10836-007-5020-8
- Kyriakos Christou;
- Maria Michael;
- Spyros Tragoudas
- Article
42
- Optics & Spectroscopy, 2021, v. 129, n. 9, p. 1055, doi. 10.1134/S0030400X21080026
- Article
43
- Optics & Spectroscopy, 2011, v. 110, n. 5, p. 748, doi. 10.1134/S0030400X11050122
- Rumyantsev, V.;
- Fedorov, S.;
- Gumennik, K.
- Article
44
- Journal of the Korea Institute of Information & Communication Engineering, 2023, v. 27, n. 6, p. 772, doi. 10.6109/jkiice.2023.27.6.772
- Article
45
- Catalysts (2073-4344), 2023, v. 13, n. 2, p. 269, doi. 10.3390/catal13020269
- Chang, Xinye;
- Fan, Huiqing;
- Lei, Lin;
- Wu, Xiaobo;
- Wang, Weijia;
- Ma, Longtao
- Article
46
- Catalysts (2073-4344), 2023, v. 13, n. 1, p. 172, doi. 10.3390/catal13010172
- Xu, Yandong;
- Liao, Jianjun;
- Zhang, Linlin;
- Li, Yakun;
- Ge, Chengjun
- Article
47
- Catalysts (2073-4344), 2020, v. 10, n. 4, p. 397, doi. 10.3390/catal10040397
- Elahifard, Mohammadreza;
- Sadrian, Mohammad Reza;
- Mirzanejad, Amir;
- Behjatmanesh-Ardakani, Reza;
- Ahmadvand, Seyedsaeid
- Article
48
- Applied Physics A: Materials Science & Processing, 2007, v. 89, n. 3, p. 695, doi. 10.1007/s00339-007-4160-0
- Article
49
- Applied Physics A: Materials Science & Processing, 2003, v. 77, n. 6, p. 839, doi. 10.1007/s00339-003-2103-y
- Article
50
- Applied Physics A: Materials Science & Processing, 2003, v. 77, n. 6, p. 779, doi. 10.1007/s00339-003-2212-7
- Suárez-García, A.;
- Gonzalo, J.;
- Afonso, C.N.
- Article