Works matching DE "REFLECTION high energy electron diffraction"


Results: 48
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    Remark to the Intensity Measurement of RHEED.

    Published in:
    Instruments & Experimental Techniques, 2005, v. 48, n. 5, p. 679, doi. 10.1007/s10786-005-0122-y
    By:
    • Nemcsics, Á.;
    • Olde, J.;
    • Geyer, M.;
    • Reshöft, K.
    Publication type:
    Article
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    Terahertz emission increase in GaAs films exhibiting structural defects grown on Si (100) substrates using a two-layered LTG-GaAs buffer system.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 10, p. 13825, doi. 10.1007/s10854-021-05958-8
    By:
    • Gonzales, Karl Cedric;
    • Prieto, Elizabeth Ann;
    • Catindig, Gerald Angelo;
    • De Los Reyes, Alexander;
    • Faustino, Maria Angela;
    • Tumanguil-Quitoras, Mae Agatha;
    • Husay, Horace Andrew;
    • Vasquez, John Daniel;
    • Somintac, Armando;
    • Estacio, Elmer;
    • Salvador, Arnel
    Publication type:
    Article
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    Supercell RHEED Calculations.

    Published in:
    Surface Review & Letters, 1999, v. 6, n. 3/4, p. 451, doi. 10.1142/S0218625X99000457
    By:
    • Maksym, P. A.
    Publication type:
    Article
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