Low-voltage characteristics of MgO-CaO films as a protective layer for AC plasma display panels by e-beam evaporation.

Jinhui Cho; Rakhwan Kim; Kyoung-Woo Lee; Choongyong Son; Geun-Young Yeom; Hee Jae Kim; Jung-Yeul Kim; Jong-Wan Park

The MgO-CaO composites films were prepared by e-beam evaporation to improve both operating voltages and memory coefficient of a protective layers for AC plasma display panels (PDPs). The effects of CaO addition to the conventional MgO films on both the electrical properties and the structural changes of the Mg1−xCaxO thin films deposited on the slide glass substrates were investigated. Atomic force microscopy (AFM) results revealed that the Mg0.8Ca0.2O film had a very rough surface due to the formation of a second phase on the surface. By adding controlled amount of CaO, the Mg-Ca-O films showed a firing voltage of 176 V that is lower than that of the conventional 100% MgO film. The deposition rates of 40–100 nm/min were obtained as a function of [CaO/(MgO + CaO)] ratio of the evaporation source materials.

MAGNESIUM oxide; PLASMA displays; ELECTRIC properties of metallic films; SURFACE roughness; ATOMIC force microscopy

Journal of Materials Science, 1999, Vol 34, Issue 20, p5055

0022-2461

Academic Journal

10.1023/A:1004748714098