X-Ray Microscopy for Hierarchical Multi-Scale Materials.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 16, doi. 10.1017/S155192951400056X
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- Publication type:
- Article
Works matching IS 15519295 AND DT 2014 AND VI 22 AND IP 3
Results: 19
1
2
No More Epon 812: This Product Does Not Exist Today.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 50, doi. 10.1017/S1551929514000558
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- Publication type:
- Article
3
We See Through Cells Every Day.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 8, doi. 10.1017/S1551929514000546
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- Publication type:
- Article
4
When the Best Microscopes Create the Worst Images.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 73, doi. 10.1017/S1551929514000534
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- Publication type:
- Article
5
Sample Preparation for Scanning Electron Microscopy: The Surprising Case of Freeze Drying from Tertiary Butanol.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 36, doi. 10.1017/S1551929514000522
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- Publication type:
- Article
6
Aberration-Corrected S/TEM at Florida State University.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 42, doi. 10.1017/S1551929514000509
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- Publication type:
- Article
7
ProductNews.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 58, doi. 10.1017/S1551929514000443
- Publication type:
- Article
8
Calendar.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 68, doi. 10.1017/S1551929514000479
- Publication type:
- Article
9
Dear Abbe.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 72, doi. 10.1017/S1551929514000467
- Publication type:
- Article
10
Chemical Heritage and Microscopy.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 7, doi. 10.1017/S1551929514000455
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- Publication type:
- Article
11
Pioneers in Optics: Albert Einstein and Johann Nathanael Lieberkìhn.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 54, doi. 10.1017/S1551929514000492
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- Publication type:
- Article
12
NetNotes.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 60, doi. 10.1017/S1551929514000480
- Publication type:
- Article
13
MTO volume 22 issue 3 Cover and Back matter.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. b1, doi. 10.1017/S155192951400042X
- Publication type:
- Article
14
IndustryNews.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 56, doi. 10.1017/S1551929514000431
- Publication type:
- Article
15
MTO volume 22 issue 3 Cover and Front matter.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. f1, doi. 10.1017/S1551929514000418
- Publication type:
- Article
16
Scan-noise and Drift Correction in the STEM.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 40, doi. 10.1017/S1551929514000376
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- Publication type:
- Article
17
Evaluating Surface Cleaning Techniques of Stone Tools Using Laser Scanning Confocal Microscopy.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 22, doi. 10.1017/S1551929514000364
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- Publication type:
- Article
18
Dual-Lens Electron Holography for Junction Profiling and Strain Mapping of Semiconductor Devices.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 28, doi. 10.1017/S1551929514000352
- By:
- Publication type:
- Article
19
Comparison of Three Quantitative AFM Techniques.
- Published in:
- Microscopy Today, 2014, v. 22, n. 3, p. 12, doi. 10.1017/S1551929513000953
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- Publication type:
- Article