Found: 68
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PFIB and STEM EBIC: A Potent Combination for Operando TEM of Electronic Devices.
- Published in:
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.785
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- Article
Mapping Moiré Potentials with STEM EBIC Imaging.
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- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.774
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- Article
Detecting Chemical Shifts with Energy Dispersive Spectroscopy.
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- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.143
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- Article
Nano-PUND and STEM EBIC Imaging for Ferroelectric Polarization Mapping.
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- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.074
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- Article
Chasing Down Leads: Imaging Conductivity Networks in a FinFET Processor.
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- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.072
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- Article
Spectrum Imaging of a Lithium Ion Battery Anode Using Thin Fluid Cells.
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- 2023
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- Abstract
Mapping Conductivity in the TEM with SEEBIC.
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- 2023
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- Abstract
Emission-Based Temperature Mapping with STEM EBIC.
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- 2023
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- Abstract
Separation of EBIC Modes with Two-Channel STEM EBIC.
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- 2022
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- Abstract
In Situ Transmission Kikuchi Diffraction Observation of Thin-Film GST Crystal Phase and Grain Evolution.
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- 2022
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- Abstract
Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC.
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- 2022
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- Abstract
A Low-Noise, Two-Channel STEM EBIC Metrology System.
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- 2022
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- Abstract
Detecting Temperature-Induced Strain Changes using In Situ Transmission Kikuchi Diffraction.
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- 2022
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- Abstract
Imaging Soft and Hard Dielectric Breakdown in Resistive Switching.
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- 2021
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- Abstract
Modern STEM EBIC: Emerging Modes and Methods.
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- 2021
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- Abstract
Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS).
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- 2021
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- Abstract
Determining Lattice Parameters by Curve-Fitting Transmission Kikuchi Diffraction Patterns.
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- 2021
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- Abstract
Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction.
- Published in:
- 2021
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- Abstract
Technique and Computational Improvements in 4D STEM and Cross-Correlation Analysis.
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- 2021
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- Abstract
In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress.
- Published in:
- 2021
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- Abstract
In Situ Visualization of the Electron Wind Force in the Elastic Regime.
- Published in:
- 2021
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- Abstract
Modern STEM EBIC: Emerging Modes and Methods.
- Published in:
- 2021
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- Publication type:
- Abstract
Imaging Soft and Hard Dielectric Breakdown in Resistive Switching.
- Published in:
- 2021
- By:
- Publication type:
- Abstract
Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS).
- Published in:
- 2021
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- Publication type:
- Abstract
Determining Lattice Parameters by Curve-Fitting Transmission Kikuchi Diffraction Patterns.
- Published in:
- 2021
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- Publication type:
- Abstract
Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction.
- Published in:
- 2021
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- Publication type:
- Abstract
Technique and Computational Improvements in 4D STEM and Cross-Correlation Analysis.
- Published in:
- 2021
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- Publication type:
- Abstract
In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress.
- Published in:
- 2021
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- Abstract
In Situ Visualization of the Electron Wind Force in the Elastic Regime.
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- 2021
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- Abstract
STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles.
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- 2020
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- Abstract
Nanoparticle Temperature Measurements for MEMS Heater Calibration.
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- 2020
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- Abstract
Fingerprinting the Phases of Thin Film Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> with EELS.
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- 2020
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- Abstract
Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging.
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- 2020
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- Abstract
Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM.
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- 2020
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- Abstract
STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles.
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- 2020
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- Abstract
Nanoparticle Temperature Measurements for MEMS Heater Calibration.
- Published in:
- 2020
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- Publication type:
- Abstract
Fingerprinting the Phases of Thin Film Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> with EELS.
- Published in:
- 2020
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- Abstract
Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging.
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- 2020
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- Publication type:
- Abstract
Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM.
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- 2020
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- Abstract
Electromigration of Copper in Lithographically-Defined Aluminum Nanowires.
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- Microscopy & Microanalysis, 2019, p. 2190, doi. 10.1017/S1431927618011431
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- Article
Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure.
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- Microscopy & Microanalysis, 2019, p. 1846, doi. 10.1017/S1431927618009716
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- Article
Scanning TEM EBIC Imaging of Resistive Memory Switching Processes.
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- Microscopy & Microanalysis, 2019, p. 1806, doi. 10.1017/S1431927618009510
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- Article
Scanning TEM Electron Beam Induced Current Imaging in Water.
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- 2019
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- Abstract
Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure.
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- 2018
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- Abstract
Scanning TEM EBIC Imaging of Resistive Memory Switching Processes.
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- 2018
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- Abstract
Scanning TEM Electron Beam Induced Current Imaging in Water.
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- 2018
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- Abstract
Electromigration of Copper in Lithographically-Defined Aluminum Nanowires.
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- 2018
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- Abstract
Plasmon Energy Mapping in Aluminum and Indium with Sub-Nanometer Resolution.
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- Microscopy & Microanalysis, 2017, v. 23, p. 378, doi. 10.1017/S1431927617002574
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- Article
STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO<sub>2</sub>.
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- Microscopy & Microanalysis, 2017, v. 23, p. 1428, doi. 10.1017/S1431927617007802
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- Publication type:
- Article
Temperature-dependent signals in STEM Electron Beam-Induced Current (EBIC) Imaging.
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- Microscopy & Microanalysis, 2017, v. 23, p. 1506, doi. 10.1017/S1431927617008194
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- Article