Works matching DE "ION bombardment"

Results: 2073

Comprehensive Study of Proton and Heavy Ion-Induced Damages for Cascode GaN-Based HEMTs.

Published in:

Electronics (2079-9292), 2025, v. 14, n. 13, p. 2653, doi. 10.3390/electronics14132653

By:

Huang, Huixiang;
Wu, Zhipeng;
Peng, Chao;
Shen, Hanxin;
Wu, Xiaoqiang;
Yang, Jianqun;
Lei, Zhifeng;
Cui, Xiuhai;
Ma, Teng;
Zhang, Zhangang;
He, Yujuan;
Chen, Yiqiang;
Lu, Guoguang

Publication type:

Article

Investigating the multifunctionality of Cu2+ doped LaSrMnO3: understanding structural, optical, and magnetic responses.

Published in:

Zeitschrift für Physikalische Chemie, 2025, v. 239, n. 7, p. 1069, doi. 10.1515/zpch-2024-0871

By:

Srinivasan, Padmavathi;
Andichamy, Murugeswari;
Sahadevan, Jhelai;
Prakash, Nithesa;
Chandrasekaran, Saravanan;
Balaraman, Nirmal Kumar;
Sankaran, Esakki Muthu

Publication type:

Article

Enhanced OER performance in La2∕3 Sr1∕3CoO3 through surface defect engineering by Ar ion bombardment.

Published in:

Modern Physics Letters B, 2025, v. 39, n. 31, p. 1, doi. 10.1142/S0217984925501933

By:

Gao, Wenqi;
Liu, Huan;
Guo, Jinrui;
Han, Yue;
Wang, Jiaqing;
Wang, Qinglong;
He, Bin;
Lü, Weiming

Publication type:

Article

Reductive Catalytic Fractionation of Lignocellulosic Biomass: The Impact of Impurities in Catalyst.

Published in:

ChemSusChem, 2025, v. 18, n. 13, p. 1, doi. 10.1002/cssc.202500199

By:

Zhu, Yiping;
Huang, Haiyun;
Gou, Haibin;
Sun, Shuaihao;
Liao, Yuhe

Publication type:

Article

Ion concentrations in CSF and serum are differentially and precisely regulated Open Access.

Published in:

Brain Communications, 2025, v. 7, n. 3, p. 1, doi. 10.1093/braincomms/fcaf201

By:

Lyckenvik, Tim;
Forsberg, My;
Johansson, Kalle;
Axelsson, Markus;
Zetterberg, Henrik;
Blennow, Kaj;
Illes, Sebastian;
Wasling, Pontus;
Hanse, Eric

Publication type:

Article

Modification of polyethylene by high energy ion or electron beam -- structural, micromechanical and conductivity studies of the surface layer.

Published in:

Polimery, 2007, v. 52, n. 5, p. 329, doi. 10.14314/polimery.2007.329

By:

Bieliński, Dariusz M.;
Ślusarczyk, Czesław;
Jagielski, Jacek;
Lipiński, Piotr

Publication type:

Article

Laser-Induced Plasma Atomic and Ionic Emission During Target Ablation.

Published in:

International Journal of Nanoscience, 2021, v. 20, n. 5, p. 1, doi. 10.1142/S0219581X21500447

By:

Abdalameer, Nisreen Kh.;
Mazhir, Sabah N.

Publication type:

Article

INFLUENCE OF TUNGSTEN CONTENT IN W-DLC NANOCOMPOSITE THIN FILMS PREPARED BY HYBRID TARGET BIASED ION BEAM ASSISTED DEPOSITION TECHNIQUE.

Published in:

International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 851, doi. 10.1142/S0219581X11009295

By:

BHARATHY, P. VIJAI;
NATARAJ, D.;
MANGALARAJ, D.;
KIRAN, M. S. R. N.;
SILVESTRE-ALBERO, J.;
YANG, Q.

Publication type:

Article

CHANGES OF RIPPLE MORPHOLOGY OF CLEAVED Si SURFACE BY LOW-ENERGY Ar+ ION BEAM SPUTTERING.

Published in:

International Journal of Nanoscience, 2011, v. 10, n. 3, p. 495, doi. 10.1142/S0219581X11008319

By:

PAHLOVY, S. A.;
MAHMUD, S. F.;
YANAGIMOTO, K.;
MIYAMOTO, I.

Publication type:

Article

EFFECT OF SWIFT HEAVY ION IRRADIATION ON THE STRUCTURAL AND MORPHOLOGICAL ASPECTS OF COPPER FERRITE NANOPARTICLES.

Published in:

International Journal of Nanoscience, 2011, v. 10, n. 1/2, p. 111, doi. 10.1142/S0219581X11007417

By:

BALAJI, M.;
PADIYAN, D. PATHINETTAM;
RAJA, M. MANIVEL;
ASOKAN, K.;
KANJILAL, D.

Publication type:

Article

ELECTRICAL TRANSPORT CHARACTERISTICS OF FOCUSED ION BEAM FABRICATED Au, Cu NANOWIRES.

Published in:

International Journal of Nanoscience, 2011, v. 10, n. 1/2, p. 7, doi. 10.1142/S0219581X11007521

By:

RAJPUT, NITUL S.;
SINGH, ABHISHEK K.;
SHUKLA, NEERAJ;
KULKARNI, VISHWAS N.

Publication type:

Article

STUDY OF ION BEAM SYNTHESIZED YSi2-x LAYERS.

Published in:

International Journal of Nanoscience, 2010, v. 9, n. 6, p. 549, doi. 10.1142/S0219581X10007228

By:

RACHID, AYACHE;
ABDERRAHMANE, BOUABELLOU;
FRANK, EICHHORN

Publication type:

Article

SYNTHESIS OF ALLOY METAL NANOCLUSTERS IN SILICA GLASS BY SEQUENTIAL ION IMPLANTATION.

Published in:

International Journal of Nanoscience, 2007, v. 6, n. 6, p. 423, doi. 10.1142/S0219581X07005000

By:

JOSEPH, B.;
LENKA, H. P.;
KUIRI, P. K.;
MAHAPATRA, D. P.;
KESAVAMOORTHY, R.

Publication type:

Article

Y-TYPE PHOTONIC CRYSTAL WAVEGUIDE WITH MINIMUM BRANCHES SPACE.

Published in:

International Journal of Nanoscience, 2006, v. 5, n. 6, p. 743, doi. 10.1142/S0219581X0600508X

By:

SHOUZHEN HAN;
JIE TIAN;
CHENG REN;
XINGSHENG XU;
ZHIYUAN LE;
BINGYING CHENG;
DAOZHONG ZHANG

Publication type:

Article

TWO-DIMENSIONAL SILICON-BASED PHOTONIC CRYSTAL SLAB WITH PARTIAL AIR-BRIDGE.

Published in:

International Journal of Nanoscience, 2006, v. 5, n. 6, p. 683, doi. 10.1142/S0219581X06004991

By:

JIE TIAN;
SHOU-ZHEN HAN;
BING-YING CHENG;
SHUAI FENG;
ZHI-YUAN LI;
CHENG REN;
DAO-ZHONG ZHANG;
AI-ZI JIN

Publication type:

Article

DIRECT FORMATION OF NANOPORE ARRAY VIA FOCUSED ION BEAM FINE MILLING AND SURFACE COATING TECHNIQUES.

Published in:

International Journal of Nanoscience, 2006, v. 5, n. 4/5, p. 529, doi. 10.1142/S0219581X06004747

By:

FU, YONGQI;
NGOI, BRYAN KOK ANN;
ZHOU, WEI;
LOH, THIAN FATT

Publication type:

Article

INVESTIGATION OF THERMAL EFFECT OF MICROSTRUCTURES FABRICATED VIA FOCUSED ION BEAM RASTER SCANNING.

Published in:

International Journal of Nanoscience, 2005, v. 4, n. 4, p. 537, doi. 10.1142/S0219581X05003280

By:

YONGQI FU;
HAIXIA QIAN;
NGOI, BRYAN KOK ANN;
WEI ZHOU

Publication type:

Article

EFFECT OF GRAIN SIZE ON SURFACE MORPHOLOGY AFTER FOCUSED ION BEAM MICRO-MACHINING FOR CEMENTED CARBIDES.

Published in:

International Journal of Nanoscience, 2005, v. 4, n. 4, p. 767, doi. 10.1142/S0219581X05003309

By:

HOSOKAWA, HIROYUKI;
NAKAJIMA, TAKESHI;
SHIMOJIMA, KOJI;
MABUCHI, MAMORU

Publication type:

Article

ION BEAM LITHOGRAPHY AND NANOFABRICATION:: A REVIEW.

Published in:

International Journal of Nanoscience, 2005, v. 4, n. 3, p. 269, doi. 10.1142/S0219581X05003139

By:

Watt, F.;
Bettiol, A. A.;
van Kan, J. A.;
Teo, E. J.;
Breese, M. B. H.

Publication type:

Article

MODIFICATION OF GROWTH MODE OF Ge ON Si BY PULSED LOW-ENERGY ION-BEAM IRRADIATION.

Published in:

International Journal of Nanoscience, 2004, v. 3, n. 1/2, p. 19, doi. 10.1142/S0219581X04001778

By:

Dvurechenskii, A. V.;
Smagina, J. V.;
Zinovyev, V. A.;
Teys, S. A.;
Gutakovskii, A. K.;
Groetzschel, R.

Publication type:

Article

TWO-DIMENSIONAL ORDERED POROUS STRUCTURES FOR PHOTONIC CRYSTALS OBTAINED USING DEEP ANODIC ETCHING AND FOCUSED ION BEAM TECHNIQUES.

Published in:

International Journal of Nanoscience, 2004, v. 3, n. 1/2, p. 81, doi. 10.1142/S0219581X04001845

By:

Gavrilin, E. Yu.;
Gorbatov, Yu. B.;
Starkov, V. V.;
Vyatkin, A. F.

Publication type:

Article

FABRICATION AND MODELING OF MICROCHANNEL MILLING USING FOCUSED ION BEAM.

Published in:

International Journal of Nanoscience, 2003, v. 2, n. 4/5, p. 375, doi. 10.1142/S0219581X03001425

By:

Tseng, A.A.;
Leedladharan, B.;
Li, B.;
Insua, I.;
Chen, C.D.

Publication type:

Article

Oxygen-Free Highly Conductive Graphene Papers.

Published in:

Advanced Functional Materials, 2014, v. 24, n. 31, p. 4878, doi. 10.1002/adfm.201304284

By:

Šimek, Petr;
Sofer, Zdeněk;
Jankovský, Ondřej;
Sedmidubský, David;
Pumera, Martin

Publication type:

Article

Adjustment of the selenium amount during ion beam sputtering deposition of CIS thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 897, doi. 10.1007/s10854-009-0013-2

By:

Ping Fan;
Guang-Xing Liang;
Zhuang-Hao Zheng;
Xing-Min Cai;
Dong-Ping Zhang

Publication type:

Article

The kinetics of conductivity type conversion in HgCdTe by ion beam milling.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 10, p. 965, doi. 10.1007/s10854-007-9428-9

By:

Shaw, Derek;
Capper, Peter

Publication type:

Article

Model-based analysis of the silica glass film etch mechanism in CF4/O2 inductively coupled plasma.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 10, p. 957, doi. 10.1007/s10854-007-9425-z

By:

Mansu Kim;
Nam-Ki Min;
Alexander Efremov;
Hyun Woo Lee;
Chi-Sun Park;
Kwang-Ho Kwon

Publication type:

Article

Early stage donor-vacancy clusters in germanium.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 7, p. 769, doi. 10.1007/s10854-006-9069-4

By:

Coutinho, José;
Torres, Vitor;
Öberg, Sven;
Carvalho, Alexandra;
Janke, Colin;
Jones, Robert;
Briddon, Patrick

Publication type:

Article

In-Situ STEM Study of Recrystallization in Amorphous SrTiO3.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.835

By:

Ghosh, Supriya;
Guo, Silu;
Mkhoyan, K Andre

Publication type:

Article

Crystallographic Orientations of Cracks Formed in SiGe/Ge/Si(111).

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.267

By:

Tajima, Kota;
Yamanaka, Junji;
Arimoto, Keisuke;
Hara, Kosuke O;
Wagatsuma, Youya;
Sawano, Kentarou

Publication type:

Article

Latest Developments in Post-FIB Concentrated Ar Ion Beam Milling of TEM Specimens with Large Electron-transparent Areas.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.1091

By:

Bonifacio, C S;
Nowakowski, P;
Ray, M L;
Fischione, P E

Publication type:

Article

New Approach for High Quality Cross Sectioning in Tablets using Broad Argon Ion Beam with LN2 Sample Cooling.

Published in:

Microscopy & Microanalysis, 2019, p. 1424, doi. 10.1017/S1431927618007602

By:

Kawano, Rintaro;
Hasebe, Yuji;
Yamaguchi, Yuuki;
Manabe, Noriyoshi;
Erdman, Natasha;
Asahina, Shunsuke

Publication type:

Article

Use of Focused Ion Beam as a Sample Preparation Tool for Cryo-Electron Tomography.

Published in:

2019

By:

Záchej, Samuel;
Havránková, Jana;
Rosíková, Kristýna;
Váńa, Rostislav;
Havelka, Miloslav

Publication type:

Abstract

Low-Energy Argon Broad Ion Beam and Narrow Ion Beam Milling of In Situ Lift-Out FIB Specimens.

Published in:

2019

By:

Campin, M.J.;
Bonifacio, C.S.;
Fischione, P.E.

Publication type:

Abstract

Investigation of slice thickness for FIB tomography in a plasma focused ion beam system.

Published in:

2019

By:

Van Leer, Brandon;
Kelley, Ron;
Winiarski, Bartlomiej

Publication type:

Abstract

3D Nanostructures Grown via Focused Helium Ion Beam Induced Deposition.

Published in:

Microscopy & Microanalysis, 2019, p. 332, doi. 10.1017/S1431927618002155

By:

Burch, Matthew J.;
Ievlev, Anton;
Kim, Songkil;
Belianinov, Alex;
Ovchinnikova, Olga S.;
Stanford, Michael G.;
Mahady, Kyle;
Lewis, Brett B.;
Fowlkes, Jason D.;
Rack, Philip D.

Publication type:

Article

Three-Dimensional Semiconductor Device Investigation Using Focused Ion Beam and Scanning Electron Microscopy Imaging (FIB/SEM Tomography).

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 1, p. 85, doi. 10.1017/S1431927612014031

By:

Lepinay, K.;
Lorut, F.

Publication type:

Article

FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient.

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 1, p. 79, doi. 10.1017/S1431927612013876

By:

Armigliato, Aldo;
Frabboni, Stefano;
Gazzadi, Gian Carlo;
Rosa, Rodolfo

Publication type:

Article

A Method for Producing Site-Specific TEM Specimens from Low Contrast Materials with Nanometer Precision.

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 1, p. 73, doi. 10.1017/S1431927612013311

By:

Pettersson, Henrik;
Nik, Samira;
Weidow, Jonathan;
Olsson, Eva

Publication type:

Article

Ionoluminescence in the Helium Ion Microscope.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 6, p. 1253, doi. 10.1017/S1431927612013463

By:

Boden, Stuart A.;
Franklin, Thomas M.W.;
Scipioni, Larry;
Bagnall, Darren M.;
Rutt, Harvey N.

Publication type:

Article

Enhanced Surface and In-Depth Characterization of Organic and Inorganic Materials Using XPS and Soft Depth Profiling with Argon Cluster Ion Beams.

Published in:

2012

By:

Strohmeier, B.R.;
White, R.G.;
Nunney, T.S.;
Mack, P.;
Wright, A.E.

Publication type:

Abstract

Focused Ion Beam Milled Nanochannels for Confinement Enabled DNA Single-Molecule Studies.

Published in:

2012

By:

Menard, L.;
Zhou, J.;
Woodson, M.;
Mair, C.;
Alarie, J.;
Ramsey, J.

Publication type:

Abstract

3D Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam-Scanning Electron Microscopy.

Published in:

2012

By:

Lin, J.;
Heeschen, W.;
Reffner, J.;
Hook, J.

Publication type:

Abstract

Quantitative Dopant Contrast in Scanning Electron Microscope and Helium Ion Microscope Using Focused Ion Beam Prepared Specimens.

Published in:

2012

By:

Zhang, H.;
Chen, Y.

Publication type:

Abstract

Advantages of Focused Ion Beam to Understand Redeposition, Secondary Sputtering Effects and to Create Microfluidic Structures.

Published in:

2012

By:

Saraf, L.;
Britt, D.

Publication type:

Abstract

Ion-Beam Etching Techniques in Uranium Metallography.

Published in:

2012

By:

Dekanich, S.J.;
Sanders, D.M.;
Bridges, R.;
Frafjord, J.J.

Publication type:

Abstract

Multi-Species Focused Ion Beam Processing for III-V Semiconductor Materials.

Published in:

2012

By:

Gila, B.P.;
Appleton, B.R.;
Fridmann, J.;
Sanabia, J.E.;
Mazarov, P.

Publication type:

Abstract

Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application.

Published in:

2012

By:

Kollmer, F.;
Rading, D.;
Moellers, R.;
Cramer, H.;
Paul, W.;
Niehuis, E.

Publication type:

Abstract

Microstructural and Chemical Characterization of Nanostructured TiAlSiN Coatings with Nanoscale Resolution.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 3, p. 568, doi. 10.1017/S1431927612000384

By:

Godinho, Vanda;
Rojas, Teresa C.;
Trasobares, Susana;
Ferrer, Francisco J.;
Delplancke-Ogletree, Marie-Paule;
Fernández, Asuncion

Publication type:

Article

Dependence of the Electron Beam Energy and Types of Surface to Determine EBSD Indexing Reliability in Yttria-Stabilized Zirconia.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 2, p. 371, doi. 10.1017/S1431927611012815

By:

Saraf, Laxmikant V.

Publication type:

Article

The External Ion Microbeam of the LABEC Laboratory in Florence: Some Applications to Cultural Heritage.

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. 5, p. 661, doi. 10.1017/S1431927611000092

By:

Calusi, Silvia

Publication type:

Article