Works matching Metrology
Results: 5000
Solved and Unsolved Problems of the Metrology of Chemical Analysis.
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- Journal of Analytical Chemistry, 2019, v. 74, n. 9, p. 839, doi. 10.1134/S1061934819090053
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Application of the time-invariant linear filter approximation to parametrization of surface metrology with high-quality x-ray optics.
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- Optical Engineering, 2014, v. 53, n. 8, p. 1, doi. 10.1117/1.OE.53.8.084102
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Nondestructive metrology by optical coherence tomography empowering manufacturing iterations of layered polymeric optical materials.
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- Optical Engineering, 2013, v. 52, n. 11, p. 1, doi. 10.1117/1.OE.52.11.112111
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- Article
Neue Wege der metrologischen Rückführbarkeit in der Längen- und Koordinatenmesstechnik.
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- Technisches Messen, 2019, v. 86, n. 9, p. 487, doi. 10.1515/teme-2019-0092
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Harmonization of Law in the Application of Legal Metrology.
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- Pertanika Journal of Social Sciences & Humanities, 2020, v. 28, n. 2, p. 1199
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AN INNOVATIVE APPROACH OF METROLOGY FOR HIGH PRECISION AND QUALITY MACHINING TOOL ASSESSMENT IN THE INTEGRATED PRODUCTION ENGINEERING.
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- Annals of DAAAM & Proceedings, 2015, v. 26, n. 1, p. 0787, doi. 10.2507/26th.daaam.proceedings.110
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- Article
PECULIARITIES OF ADMINISTRATIVE LEGAL REGULATION OF METROLOGY.
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- Jurisprudence / Jurisprudencija, 2012, v. 19, n. 4, p. 1515
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ORGANIZAŢIA INTERNAŢIONALĂ DE METROLOGIE LEGALĂ - Consolidând calea spre un Sistem Metrologic Global.
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- Revista Metrologie, 2012, v. 59, n. 3/4, p. 6
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LOOKING TO THE FUTURE OF EUROPEAN METROLOGY.
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- Revista Metrologie, 2011, v. 58, n. 3, p. 4
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Identifying and visualizing part-to-part variation with spatially dense optical dimensional metrology data.
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- Journal of Quality Technology, 2019, v. 51, n. 1, p. 3, doi. 10.1080/00224065.2018.1541380
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National Measurement System and National Metrology Infrastructure: Analysis of Documents D1 of the International Organization of Legal Metrology.
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- Measurement Techniques, 2023, v. 65, n. 12, p. 876, doi. 10.1007/s11018-023-02163-3
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Research and development of metrological standards for thermophysical properties of solids in the National Metrology Institute of Japan.
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- High Temperatures - High Pressures, 2010, v. 39, n. 4, p. 279
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A digital metrology process model (MPM) for measuring planning and data analysis and its application with a computer-aided system.
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- International Journal of Advanced Manufacturing Technology, 2017, v. 92, n. 5-8, p. 1967, doi. 10.1007/s00170-017-0294-1
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The Digitalisation of a National Metrology System.
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- Quality Innovation Prosperity / Kvalita Inovácia Prosperita, 2023, v. 27, n. 3, p. 75, doi. 10.12776/QIP.V27I3.1922
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Thermal compensation for large volume metrology and structures.
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- International Journal of Metrology & Quality Engineering, 2017, v. 8, n. 21, p. 1, doi. 10.1051/ijmqe/2017004
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Realisation of the metre by using a femtosecond laser frequency comb: applications in optical frequency metrology.
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- International Journal of Metrology & Quality Engineering, 2017, v. 8, n. 16, p. 1, doi. 10.1051/ijmqe/2017008
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Establishing an applied training session in metrology at an agricultural engineering school (CIRAD, Montpellier, France).
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- International Journal of Metrology & Quality Engineering, 2014, v. 5, n. 4, p. N.PAG, doi. 10.1051/ijmqe/2014018
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Evaluation of metrology technologies for free form surfaces.
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- International Journal of Metrology & Quality Engineering, 2012, p. 55, doi. 10.1051/ijmqe/2012002
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At-wavelength metrology of an X-ray mirror using a downstream wavefront modulator.
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- Journal of Synchrotron Radiation, 2024, v. 31, n. 3, p. 432, doi. 10.1107/S1600577524002157
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Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis.
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- Journal of Synchrotron Radiation, 2017, v. 24, n. 1, p. 196, doi. 10.1107/S1600577516016568
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DABAM: an open-source database of X-ray mirrors metrology.
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- 2016
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- Product Review
X-ray pulse wavefront metrology using speckle tracking.
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- Journal of Synchrotron Radiation, 2015, v. 22, n. 4, p. 886, doi. 10.1107/S1600577515005433
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Two-dimensional in situ metrology of X-ray mirrors using the speckle scanning technique.
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- Journal of Synchrotron Radiation, 2015, v. 22, n. 4, p. 925, doi. 10.1107/S1600577515006657
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Wool metrology research and development to date.
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- Textile Progress, 2015, v. 47, n. 3, p. 163, doi. 10.1080/00405167.2015.1108543
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Advanced environmental control as a key component in the development of ultrahigh accuracy ex situ metrology for x-ray optics.
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- Optical Engineering, 2015, v. 54, n. 10, p. 104104-1, doi. 10.1117/1.OE.54.10.104104
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Optical displacement metrology using alternating direction Moire.
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- Optical Engineering, 2014, v. 53, n. 8, p. 1, doi. 10.1117/1.OE.53.8.084101
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Real-time position and orientation measurement with occlusion handling for distributed optical large-scale metrology systems.
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- Optical Engineering, 2013, v. 52, n. 11, p. 1, doi. 10.1117/1.OE.52.11.114101
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Calibration and alignment of metrology system for the Nuclear Spectroscopic Telescope Array mission.
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- Optical Engineering, 2012, v. 51, n. 4, p. 1, doi. 10.1117/1.OE.51.4.043605
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Toward a cyber-physical manufacturing metrology model for industry 4.0.
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- AI EDAM, 2021, v. 35, n. 1, p. 20, doi. 10.1017/S0890060420000347
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The coherence function and its information content for optical metrology.
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- Technisches Messen, 2022, v. 89, n. 6, p. 397, doi. 10.1515/teme-2022-0048
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Zeptometer Metrology Using the Casimir Effect.
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- Journal of Low Temperature Physics, 2022, v. 208, n. 1/2, p. 147, doi. 10.1007/s10909-021-02650-3
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Legal Metrology in Electrotechnical Expertise Practices at Courts on Electrical Energy Bills Forgery Cases.
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- Measurements, 2009, v. 44, n. 2, p. 9
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Harmonization of the EU and Lithuanian Normative Documents in Legal Metrology.
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- Measurements, 2009, v. 43, n. 1, p. 5
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Use of microbial indicators combined with environmental factors coupled with metrology tools for discrimination and classification of Luzhou-flavoured pit muds.
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- Journal of Applied Microbiology, 2017, v. 123, n. 4, p. 933, doi. 10.1111/jam.13544
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Quantum Optics Parity Effect on Generalized NOON States and Its Implications for Quantum Metrology.
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- Annalen der Physik, 2022, v. 534, n. 12, p. 1, doi. 10.1002/andp.202200304
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An improved virtual metrology method in chemical vapor deposition systems via multitask gaussian processes and adaptive active learning.
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- International Journal of Advanced Manufacturing Technology, 2022, v. 122, n. 7/8, p. 3149, doi. 10.1007/s00170-022-10115-4
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Optical metrology for digital manufacturing: a review.
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- International Journal of Advanced Manufacturing Technology, 2022, v. 120, n. 7/8, p. 4271, doi. 10.1007/s00170-022-09084-5
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Role of National Metrology Institutes for Comparable Measurements
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- Communications in Soil Science & Plant Analysis, 2006, v. 37, n. 15-20, p. 2095, doi. 10.1080/00103620600812607
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Data Analytics for Noise Reduction in Optical Metrology of Reflective Planar Surfaces.
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- Machines, 2022, v. 10, n. 1, p. 25, doi. 10.3390/machines10010025
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Experimental demonstration of topological bounds in quantum metrology.
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- National Science Review, 2024, v. 11, n. 10, p. 1, doi. 10.1093/nsr/nwae065
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A Model of Global Cooperation to Enable Intelligent Metrology Applications by Means of an Integrated Teleoperation System.
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- International Journal of Online Engineering, 2015, v. 11, n. 3, p. 14, doi. 10.3991/ijoe.v11i3.4545
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3D Model-Based Large-Volume Metrology Supporting Smart Manufacturing and Digital Twin Concepts.
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- Metrology, 2023, v. 3, n. 1, p. 29, doi. 10.3390/metrology3010002
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Simulation of an Aeronautical Product Assembly Process Driven by a Metrology Aided Virtual Approach.
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- Metrology, 2022, v. 2, n. 4, p. 427, doi. 10.3390/metrology2040026
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Methodology to Evaluate the Performance of Portable Photogrammetry for Large-Volume Metrology.
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- Metrology, 2022, v. 2, n. 3, p. 320, doi. 10.3390/metrology2030020
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Arctic metrology: calibration of radiosondes ground check sensors in Ny-Ålesund.
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- Meteorological Applications, 2015, v. 22, p. 854, doi. 10.1002/met.1506
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Automatic virtual metrology for wheel machining automation.
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- International Journal of Production Research, 2016, v. 54, n. 21, p. 6367, doi. 10.1080/00207543.2015.1109724
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Allocating metrology capacity to multiple heterogeneous machines.
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- International Journal of Production Research, 2016, v. 54, n. 20, p. 6082, doi. 10.1080/00207543.2016.1187775
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Metrology in chemistry – a rocky road.
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- Microchimica Acta, 2008, v. 162, n. 1/2, p. 35, doi. 10.1007/s00604-007-0909-6
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Measurement-based quantum correlation in mixed-state quantum metrology.
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- Quantum Information Processing, 2018, v. 17, n. 12, p. 1, doi. 10.1007/s11128-018-2110-8
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Quantum Dots Microstructural Metrology: From Time‐Resolved Spectroscopy to Spatially Resolved Electron Microscopy.
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- Particle & Particle Systems Characterization, 2020, v. 37, n. 12, p. 1, doi. 10.1002/ppsc.202000192
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