Works matching IS 03615235 AND DT 2019 AND VI 48 AND IP 11
1
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7593, doi. 10.1007/s11664-019-07604-w
- Kumar, Rahul;
- Anish Raj, K.;
- Mitra, Sagar;
- Bhargava, Parag
- Article
2
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7539, doi. 10.1007/s11664-019-07599-4
- Jamadade, V. S.;
- Pagare, P. K.;
- Gaikwad, Dhanshri S.;
- Burungale, A. S.;
- Sawant, V. S.
- Article
3
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7533, doi. 10.1007/s11664-019-07591-y
- Kaltzoglou, Andreas;
- Manolis, Georgios K.;
- Elsenety, Mohamed M.;
- Koutselas, Ioannis;
- Psycharis, Vassilis;
- Kontos, Athanassios G.;
- Falaras, Polycarpos
- Article
4
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7526, doi. 10.1007/s11664-019-07590-z
- Holgate, Tim C.;
- Bennett, Russell;
- Renomeron, Lynda;
- Keyser, Steven;
- Chi, Ike;
- Ni, Jennifer;
- Yu, Kevin;
- Caillat, Thierry;
- Pinkowski, Stanley
- Article
5
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7507, doi. 10.1007/s11664-019-07589-6
- Ahmad, Khalil;
- Ahmad, M. Ashfaq;
- Raza, Rizwan;
- Khan, M. Ajaml;
- Rehman, Zohaib Ur;
- Abbas, Ghazanfar
- Article
6
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7479, doi. 10.1007/s11664-019-07588-7
- Mahmoudi, Samaneh;
- Azim Araghi, Mohammad Esmaeil
- Article
7
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7515, doi. 10.1007/s11664-019-07582-z
- Arif, Suneela;
- Faraz, Ahmad
- Article
8
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7474, doi. 10.1007/s11664-019-07575-y
- Qing, Zhenjun;
- Li, Haiyan;
- Zhao, Chenglin
- Article
9
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7465, doi. 10.1007/s11664-019-07574-z
- Chahrour, Khaled M.;
- Yam, F. K.;
- Ahmed, Naser M.;
- Hashim, M. R.;
- Elfadill, Nezar G.;
- Al-Diabat, Ahmad M.;
- Lim, H. S.
- Article
10
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 6940, doi. 10.1007/s11664-019-07573-0
- Article
11
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7460, doi. 10.1007/s11664-019-07572-1
- Soma, Savita;
- Sonth, Mahesh V.;
- Gowre, Sanjaykumar C.
- Article
12
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7452, doi. 10.1007/s11664-019-07571-2
- Li, Pengzhen;
- Fu, Yao;
- Tao, Huajie;
- Zhou, Hongqing
- Article
13
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7404, doi. 10.1007/s11664-019-07569-w
- Article
14
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7396, doi. 10.1007/s11664-019-07568-x
- Mahmoud, M. H.;
- Taha, T. A.
- Article
15
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7495, doi. 10.1007/s11664-019-07563-2
- Vigneselvan, S.;
- Manikandan, V.;
- Petrila, Iulian;
- Vanitha, A.;
- Chandrasekaran, J.
- Article
16
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7411, doi. 10.1007/s11664-019-07558-z
- Meng, Lingju;
- Xu, Qiwei;
- Dan, Li;
- Wang, Xihua
- Article
17
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7551, doi. 10.1007/s11664-019-07555-2
- Wolf, Mario;
- Menekse, Kaan;
- Mundstock, Alexander;
- Hinterding, Richard;
- Nietschke, Frederik;
- Oeckler, Oliver;
- Feldhoff, Armin
- Article
18
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7292, doi. 10.1007/s11664-019-07554-3
- Article
19
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7345, doi. 10.1007/s11664-019-07553-4
- Wei, Chao;
- Gu, Xiuquan;
- Li, Kun;
- Song, Jian;
- Zhao, Yulong;
- Qiang, Yinghuai
- Article
20
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7389, doi. 10.1007/s11664-019-07567-y
- Kumar, Rahul;
- Anish Raj, K.;
- Mita, Sagar;
- Bhargava, Parag
- Article
21
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7378, doi. 10.1007/s11664-019-07566-z
- Truong, Thao Kim;
- Van Doan, Thuan;
- Tran, Huy Hong;
- Van Le, Hieu;
- Lam, Vinh Quang;
- Tran, Hai Nguyen;
- Cao, Thi Minh;
- Van Pham, Viet
- Article
22
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7372, doi. 10.1007/s11664-019-07565-0
- Angelico, João C.;
- Neto, Nilton F. A.;
- Da Silva, José H. Dias
- Article
23
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7366, doi. 10.1007/s11664-019-07562-3
- Article
24
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7360, doi. 10.1007/s11664-019-07561-4
- Article
25
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7352, doi. 10.1007/s11664-019-07560-5
- Chen, Chong;
- Liu, Qi;
- Li, Wei;
- Dong, Shoufeng;
- Geng, Mengru;
- Cheng, Jianfeng
- Article
26
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7487, doi. 10.1007/s11664-019-07559-y
- Ramezani, Zeinab;
- Orouji, Ali A.;
- Ghoreishi, S. Amir;
- Amiri, I. S.
- Article
27
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7336, doi. 10.1007/s11664-019-07552-5
- Article
28
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7441, doi. 10.1007/s11664-019-07551-6
- Sharma, Sumeet Kumar;
- Chauhan, Vishal S.;
- Jain, Satish C.
- Article
29
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7328, doi. 10.1007/s11664-019-07550-7
- Morsy, M.;
- Yahia, I. S.;
- Zahran, H. Y.;
- Meng, F.;
- Ibrahim, M.
- Article
30
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7543, doi. 10.1007/s11664-019-07549-0
- Guo, Meiqing;
- Meng, Weijia;
- Zhang, Xiaogang;
- Bai, Zhongchao;
- Wang, Genwei;
- Wang, Zhihua;
- Yang, Fuqian
- Article
31
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7320, doi. 10.1007/s11664-019-07536-5
- Zhou, Chunyan;
- Wang, Huan;
- Huang, Tianjiao;
- Zhang, Xiaoshan;
- Shi, Zhongfeng;
- Zhou, Liya;
- Lan, Yuwei;
- Tang, Guo
- Article
32
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7573, doi. 10.1007/s11664-019-07534-7
- Kutilainen, Terho;
- Pudas, Marko;
- Ashworth, Mark A.;
- Lehto, Tero;
- Wu, Liang;
- Wilcox, Geoffrey D.;
- Wang, Jing;
- Collander, Paul;
- Hokka, Jussi
- Article
33
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7270, doi. 10.1007/s11664-019-07543-6
- Ren, Zhaokun;
- Liu, Liwu;
- Zhang, Mingyan;
- Liu, Yanju;
- Leng, Jinsong
- Article
34
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7250, doi. 10.1007/s11664-019-07542-7
- Yu, Ji;
- Wei, Hai-Yan;
- Yang, Zhen-Yu;
- Cai, Jian-Xin
- Article
35
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7239, doi. 10.1007/s11664-019-07539-2
- Yesuraj, J.;
- Elanthamilan, E.;
- Muthuraaman, B.;
- Suthanthiraraj, S. Austin;
- Merlin, J. Princy
- Article
36
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7427, doi. 10.1007/s11664-019-07548-1
- Article
37
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7282, doi. 10.1007/s11664-019-07547-2
- Yen, Nguyen Hai;
- Ha, Nguyen Hoang;
- Thanh, Pham Thi;
- Thanh, Tran Dang;
- Ngoc, Nguyen Huy;
- Dan, Nguyen Huy
- Article
38
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7585, doi. 10.1007/s11664-019-07546-3
- Zhang, H. X.;
- Dai, J. J.;
- Sun, C. X.;
- Li, S. Y.;
- Zhang, H. L.;
- Yu, H. J.;
- Chen, C. Z.
- Article
39
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7263, doi. 10.1007/s11664-019-07545-4
- Fang, Hao;
- Wang, Zhijun;
- Chen, Qiao;
- Wang, Yongqian
- Article
40
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7258, doi. 10.1007/s11664-019-07544-5
- Jiang, Daguo;
- Ye, Yuanxiu;
- Yao, Weibo;
- Zeng, Dongwen;
- Zhou, Jie;
- Liu, Lina;
- Wen, Yufeng
- Article
41
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 6949, doi. 10.1007/s11664-019-07540-9
- Moriwaki, Takeshi;
- Sasagawa, Kazuhiko;
- Sugawara, Yusuke;
- Fujisaki, Kazuhiro;
- Mineta, Takahiro
- Article
42
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7312, doi. 10.1007/s11664-019-07541-8
- Koh, Yee Rui;
- Yazawa, Kazuaki;
- Shakouri, Ali;
- Nagahama, Takuma;
- Maeda, Shinichi;
- Isaji, Tadayuki;
- Kasai, Yoshinori
- Article
43
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7226, doi. 10.1007/s11664-019-07537-4
- Tabtimsai, Chanukorn;
- Wanno, Banchob;
- Utairueng, Apinya;
- Promchamorn, Phongchat;
- Kumsuwan, Ukrit
- Article
44
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7192, doi. 10.1007/s11664-019-07533-8
- Bhorde, Ajinkya;
- Waykar, Ravindra;
- Nair, Shruthi;
- Borate, Haribhau;
- Pandharkar, Subhash;
- Aher, Rahul;
- Waghmare, Ashish;
- Vairale, Priti;
- Naik, Dhirsing;
- Jadkar, Sandesh
- Article
45
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7562, doi. 10.1007/s11664-019-07532-9
- Mohd Zubir, Noor Suhana;
- Zhang, Hongqiang;
- Zou, Guisheng;
- Bai, Hailin;
- Deng, Zhongyang;
- Feng, Bin;
- Wu, Aiping;
- Liu, Lei;
- Zhou, Y. Norman
- Article
46
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7131, doi. 10.1007/s11664-019-07525-8
- Buldurun, Kenan;
- Gündüz, Bayram;
- Turan, Nevin;
- Çolak, Naki
- Article
47
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7076, doi. 10.1007/s11664-019-07524-9
- Chen, Fan;
- Zhang, Lin-Qing;
- Wang, Peng-Fei
- Article
48
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7177, doi. 10.1007/s11664-019-07529-4
- Lu, Yongcheng;
- Li, Yuanxun;
- Peng, Rui;
- Su, Hua;
- Tao, Zhihua;
- Chen, Daming
- Article
49
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7169, doi. 10.1007/s11664-019-07528-5
- Article
50
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7302, doi. 10.1007/s11664-019-07526-7
- Nasr, A.;
- Aly, Abou El-Maaty M.;
- Sharaf, Abdelhameed
- Article