Works matching IS 03615235 AND DT 2017 AND VI 46 AND IP 3
1
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1427, doi. 10.1007/s11664-016-5167-0
- Dalawai, S.;
- Shinde, T.;
- Gadkari, A.;
- Tarwal, N.;
- Jang, J.;
- Vasambekar, P.
- Article
2
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1439, doi. 10.1007/s11664-016-5173-2
- Asghari, Zahra;
- Eshghi, Hosein
- Article
3
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1444, doi. 10.1007/s11664-016-5174-1
- Rawat, Pankaj;
- Park, Hwanjoo;
- Hwang, Junphil;
- Kim, Woochul
- Article
4
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1451, doi. 10.1007/s11664-016-5175-0
- Guan, Anxiang;
- Wang, Guofang;
- Xia, Siyu;
- Zhang, Xinguo;
- Hu, Xiaoxi;
- Zhou, Liya;
- Meng, Yingbin;
- Yao, Chunying;
- Pan, Haiman
- Article
5
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1458, doi. 10.1007/s11664-016-5176-z
- Mesrane, A.;
- Mahrane, A.;
- Rahmoune, F.;
- Oulebsir, A.
- Article
6
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1466, doi. 10.1007/s11664-016-5178-x
- Li, Jie;
- Hu, Wenbo;
- Wei, Qiang;
- Wu, Shengli;
- Hua, Xing;
- Zhang, Jintao
- Article
7
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1476, doi. 10.1007/s11664-016-5180-3
- Tseng, Zong-Liang;
- Chen, Lung-Chien;
- Tang, Jian-Fu;
- Shih, Meng-Fu;
- Chu, Sheng-Yuan
- Article
8
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1481, doi. 10.1007/s11664-016-5184-z
- Chen, Wei-Liang;
- Kuo, Dong-Hau;
- Tuan, Thi
- Article
9
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1488, doi. 10.1007/s11664-016-5185-y
- Wang, Sea-Fue;
- Hsu, Chia-Chun;
- Chu, Jinn;
- Liu, Yi-Xin;
- Chen, Liang-Wei
- Article
10
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1497, doi. 10.1007/s11664-016-5186-x
- Article
11
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1504, doi. 10.1007/s11664-016-5189-7
- Huang, J.;
- Zhou, M.;
- Zhang, X.
- Article
12
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1516, doi. 10.1007/s11664-016-5190-1
- Thakur, Anjali;
- Patial, Balbir;
- Thakur, Nagesh
- Article
13
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1525, doi. 10.1007/s11664-016-5192-z
- Singh, Vijay;
- Sivaramaiah, G.;
- Rao, J.;
- Singh, N.;
- Mohapatra, M.;
- Singh, P.;
- Pathak, M.;
- Dhoble, S.
- Article
14
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1532, doi. 10.1007/s11664-016-5193-y
- Chen, Peiyang;
- Liu, Zhifeng;
- Geng, Xuemin;
- Wang, Jialu;
- Zhang, Min;
- Liu, Junqi;
- Yan, Lu
- Article
15
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1539, doi. 10.1007/s11664-016-5194-x
- Wei, Hongmei;
- Wang, Jinxing;
- Yang, Shengwei;
- Wang, Weifang;
- Hou, Dewen;
- Li, Tengfei
- Article
16
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1546, doi. 10.1007/s11664-016-5195-9
- Zhao, Chuan-Zhen;
- Fu, Qiang;
- Wei, Tong;
- Wang, Sha-Sha;
- Lu, Ke-Qing
- Article
17
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1552, doi. 10.1007/s11664-016-5198-6
- Cai, Lanlan;
- Li, Peng;
- Luo, Qi;
- Zhai, Pengcheng;
- Zhang, Qingjie
- Article
18
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1567, doi. 10.1007/s11664-016-5199-5
- Rezali, F.;
- Rasid, M.;
- Othman, N.;
- Hatta, S.;
- Soin, N.
- Article
19
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1576, doi. 10.1007/s11664-016-5200-3
- Chen, Chuantong;
- Nagao, Shijo;
- Zhang, Hao;
- Jiu, Jinting;
- Sugahara, Tohru;
- Suganuma, Katsuaki;
- Iwashige, Tomohito;
- Sugiura, Kazuhiko;
- Tsuruta, Kazuhiro
- Article
20
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1587, doi. 10.1007/s11664-016-5201-2
- Wong, Chin;
- Dahari, Zuraini;
- Jumali, Mohammad;
- Mohamed, Khairudin;
- Mohamed, Julie
- Article
21
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1598, doi. 10.1007/s11664-016-5202-1
- Wang, Yongqian;
- Yang, Xiande;
- Ye, Ting;
- Xu, Chao;
- Xia, Fan;
- Meng, Dawei
- Article
22
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1607, doi. 10.1007/s11664-016-5203-0
- Philippi, Bastian;
- Matoy, Kurt;
- Zechner, Johannes;
- Kirchlechner, Christoph;
- Dehm, Gerhard
- Article
23
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1612, doi. 10.1007/s11664-016-5204-z
- Barchuk, M.;
- Lukin, G.;
- Zimmermann, F.;
- Röder, C.;
- Motylenko, M.;
- Pätzold, O.;
- Heitmann, J.;
- Kortus, J.;
- Rafaja, D.
- Article
24
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1620, doi. 10.1007/s11664-016-5205-y
- Bhargava, Nupur;
- Gupta, Jay;
- Faleev, Nikolai;
- Wielunski, Leszek;
- Kolodzey, James
- Article
25
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1628, doi. 10.1007/s11664-016-5206-x
- Alshareef, Niman;
- Whitehair, Daniel;
- Xia, Chuan
- Article
26
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1637, doi. 10.1007/s11664-016-5207-9
- Das, S.;
- Pradhan, S.;
- Bhuyan, S.;
- Choudhary, R.;
- Das, P.
- Article
27
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1650, doi. 10.1007/s11664-016-5208-8
- Khusayfan, Najla;
- Khanfar, Hazem
- Article
28
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1658, doi. 10.1007/s11664-016-5209-7
- Contreras-Ruiz, J.;
- Martínez-Gallegos, S.;
- Ordoñez, E.;
- González-Juárez, J.;
- García-Rivas, J.
- Article
29
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1669, doi. 10.1007/s11664-016-5210-1
- Co, Thien;
- Tran, Tri;
- Le, Hai;
- Ho, Vu;
- Tran, Lam
- Article
30
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1674, doi. 10.1007/s11664-016-5211-0
- Li, Yan;
- Hatch, Olen;
- Liu, Pilin;
- Goyal, Deepak
- Article
31
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1683, doi. 10.1007/s11664-016-5212-z
- Rajoba, S.;
- Jadhav, L.;
- Patil, P.;
- Tyagi, D.;
- Varma, S.;
- Wani, B.
- Article
32
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1692, doi. 10.1007/s11664-016-5213-y
- Ike, Innocent;
- Sigalas, Iakovos;
- Iyuke, Sunny
- Article
33
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1714, doi. 10.1007/s11664-016-5215-9
- Sall, Thierno;
- Soucase, Bernabé;
- Mollar, Miguel;
- Sans, Juan
- Article
34
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1720, doi. 10.1007/s11664-016-5217-7
- Wang, Min;
- Gao, Feng;
- Xu, Jie;
- Zhang, Chaochao;
- Qin, Mengjie;
- Wang, Li;
- Guo, Yiting
- Article
35
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1730, doi. 10.1007/s11664-016-5219-5
- Anno, Hiroaki;
- Ueda, Takahiro;
- Okamoto, Kazuya
- Article
36
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1740, doi. 10.1007/s11664-016-5220-z
- Rahman, Jamil;
- Meang, Eun-Ji;
- Nguyen, Du;
- Seo, Won-Seon;
- Hussain, Ali;
- Kim, Myong;
- Lee, Soonil
- Article
37
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1747, doi. 10.1007/s11664-016-5224-8
- Suhir, E.;
- Yi, S.;
- Ghaffarian, R.
- Article
38
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1754, doi. 10.1007/s11664-016-5225-7
- Silva, Bismarck;
- Silva, Vítor;
- Garcia, Amauri;
- Spinelli, José
- Article
39
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1770, doi. 10.1007/s11664-016-5226-6
- Bahel, Shalini;
- Pubby, Kunal;
- Narang, Sukhleen
- Article
40
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1777, doi. 10.1007/s11664-016-5228-4
- He, Lihua;
- Zou, Xiao;
- Wang, Tao;
- Zheng, Qiaoji;
- Jiang, Na;
- Xu, Chenggang;
- Liu, Yongfu;
- Lin, Dunmin
- Article
41
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1787, doi. 10.1007/s11664-016-5229-3
- Radhika, T.;
- Raghu, N.;
- Powrnami, N.;
- Jothi Ramalingam, R.;
- Al-Lohedan, Hamad
- Article
42
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1794, doi. 10.1007/s11664-016-5230-x
- Rehman, Naveed;
- Siddiqui, Mubashir
- Article
43
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1806, doi. 10.1007/s11664-016-5232-8
- Article
44
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1811, doi. 10.1007/s11664-016-5233-7
- Varshney, Swati;
- Dhawan, S.
- Article
45
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1821, doi. 10.1007/s11664-016-5235-5
- Mughal, Asad;
- Carberry, Benjamin;
- Speck, James;
- Nakamura, Shuji;
- DenBaars, Steven
- Article
46
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1826, doi. 10.1007/s11664-016-5240-8
- Farid, Muhammad;
- Ahmad, Ishtiaq;
- Kanwal, Muddassara;
- Murtaza, Ghulam;
- Hussain, Muhammad;
- Khan, Sajjad;
- Ali, Irshad
- Article
47
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1836, doi. 10.1007/s11664-016-5245-3
- Liu, I.-Tsan;
- Hon, Min-Hsiung;
- Teoh, Lay
- Article
48
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1842, doi. 10.1007/s11664-016-5247-1
- Roondhe, Basant;
- Upadhyay, Deepak;
- Som, Narayan;
- Pillai, Sharad;
- Shinde, Satyam;
- Jha, Prafulla
- Article
49
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1849, doi. 10.1007/s11664-016-5249-z
- Zeng, Fei;
- Li, Xiaojun;
- Li, Sizhao;
- Chang, Chiating;
- Hu, Yuandong
- Article
50
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1855, doi. 10.1007/s11664-016-5250-6
- Lim, Sung;
- Seo, Jung;
- Song, Shin;
- Kim, Ki;
- Park, Seung;
- Jung, Dae
- Article