Works matching IS 03615235 AND DT 2015 AND VI 44 AND IP 12
Results: 37
Restricted-Access Al-Mediated Material Transport in Al Contacting of PureGaB Ge-on-Si p n Diodes.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4676, doi. 10.1007/s11664-015-4008-x
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Investigation of the Photocurrent in Hot-Wall-Epitaxy-Grown BaInS Layers.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4787, doi. 10.1007/s11664-015-4019-7
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Structural, Dielectric, and Electrical Properties of BiPbFe(ZrTi)O.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4794, doi. 10.1007/s11664-015-4020-1
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Relaxor Behavior and Dielectric Properties of Bi(ZnNb)O-Modified BaTiO Ceramics.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4804, doi. 10.1007/s11664-015-4023-y
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The Performance of Silicon Solar Cells Exposed to a Simulated Low Earth Orbit Plasma Environment: Laboratory Ground Tests.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4740, doi. 10.1007/s11664-015-4031-y
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Laser Direct Writing of Conductive Silver Micropatterns on Transparent Flexible Double-Decker-Shaped Polysilsesquioxane Film Using Silver Nanoparticle Ink.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4811, doi. 10.1007/s11664-015-4033-9
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Structural Characterization and Compositional Dependence of Optical Properties of GeSeTeSb ( x = 0, 2, 4, 6, 8) Glassy Alloys.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4747, doi. 10.1007/s11664-015-4035-7
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Effect of Titanium Content on Dielectric and Energy Storage Properties of (Pb,La,Sr)(Zr,Sn,Ti)O Ceramics.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4819, doi. 10.1007/s11664-015-4038-4
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Temperature-Dependent Modeling and Performance Evaluation of Multi-Walled CNT and Single-Walled CNT as Global Interconnects.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4825, doi. 10.1007/s11664-015-4040-x
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Compensation for Cracks Formed on an Electrochemically Deposited CuInSe Absorption Layer.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4779, doi. 10.1007/s11664-015-4042-8
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Perpendicular Growth Characteristics of Cu-Sn Intermetallic Compounds at the Surface of 99Sn-1Cu/Cu Solder Interconnects.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4836, doi. 10.1007/s11664-015-4043-7
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Effects of PbO-BO Glass Doping on the Sintering Temperature and Piezoelectric Properties of 0.35Pb (NiNb)O-0.65Pb(ZrTi)O Ceramics.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4846, doi. 10.1007/s11664-015-4044-6
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Optical, Electrical, and UV Photoresponse Properties of Fluorine-Doped ZnO Thin Films Grown on Flexible Mica Substrates.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4717, doi. 10.1007/s11664-015-4047-3
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Ab Initio Investigation of the Structural, Electronic and Optical Properties of Cubic GaAsP Ternary Alloys Under Hydrostatic Pressure.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4684, doi. 10.1007/s11664-015-4048-2
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Study of the Electrocaloric Effect in the Relaxor Ferroelectric Ceramic 0.75PMN-0.25PT.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4852, doi. 10.1007/s11664-015-4051-7
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Effect of Temperature on Formation and Stability of Shallow Trap at a Dielectric Interface of the Multilayer.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4655, doi. 10.1007/s11664-015-4052-6
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Effects of La Addition on Properties of SrNbO Thermoelectric Ceramics.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4857, doi. 10.1007/s11664-015-4053-5
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Thermal and Electric Cloaking Effect in Concentric Composite Made of Homogeneous Bulk and Porous Semiconductors.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4663, doi. 10.1007/s11664-015-4056-2
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Alkali Silicate Glass Coatings for Mitigating the Risks of Tin Whiskers.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4864, doi. 10.1007/s11664-015-4057-1
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First Principles Study of Linear and Nonlinear Optical Properties of 2-Aminofluorene (CHN).
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4940, doi. 10.1007/s11664-015-4060-6
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Tune-Ability of Physical Properties of Nanocrystalline CuZnSe Thin Films with Copper Concentration.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4754, doi. 10.1007/s11664-015-4064-2
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ZnO-Based Solar Blind Ultraviolet-B Photodetectors Using MgZnO Absorption Layer.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4722, doi. 10.1007/s11664-015-4068-y
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Cobalt Nanoparticle Inks for Printed High Frequency Applications on Polycarbonate.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4884, doi. 10.1007/s11664-015-4072-2
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Low Temperature Photosensitive Polyimide Based Insulating Layer Formation for Microelectromechanical Systems Applications.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4891, doi. 10.1007/s11664-015-4076-y
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Two-Step Reactive Aid Sintering of BaZrYO Proton-Conducting Ceramics.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4898, doi. 10.1007/s11664-015-4078-9
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Photocurrent Properties of Undoped and Pb-Doped SnS Nanostructures Grown Using Electrodeposition Method.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4734, doi. 10.1007/s11664-015-4079-8
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Phase Equilibria of the Ternary Sn-Zn-Co System at 250°C and 500°C.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4907, doi. 10.1007/s11664-015-4084-y
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Thermal Behavior of Ag Micro/Nano Wires Formed by Low-Temperature Sintering of Ag Nanoparticles.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4920, doi. 10.1007/s11664-015-4086-9
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Laser Drilling and Conducting Film Formation of Vias in Silicon.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4928, doi. 10.1007/s11664-015-4097-6
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Porous Anatase TiO Thin Films for NH Vapour Sensing.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4726, doi. 10.1007/s11664-015-4099-4
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CuZnSnS Films Grown on Flexible Substrates by Dip Coating Using a Methanol-Based Solution: Electronic Properties and Devices.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4760, doi. 10.1007/s11664-015-4103-z
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Effects of Bonding Conditions on Bondability Using Zn/Al/Zn Clad Solder.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4769, doi. 10.1007/s11664-015-4105-x
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Catalytic Graphitization for Preparation of Porous Carbon Material Derived from Bamboo Precursor and Performance as Electrode of Electrical Double-Layer Capacitor.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4933, doi. 10.1007/s11664-015-4106-9
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Reduction in the Band Gap of Manganese-Doped Zinc Oxide: Role of the Oxidation State.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4710, doi. 10.1007/s11664-015-4117-6
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GaN High-Electron-Mobility Transistor with WN/Cu Gate for High-Power Applications.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4700, doi. 10.1007/s11664-015-4118-5
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Nonradiative Recombination, Carrier Localization, and Emission Efficiency of AlGaN Epilayers with Different Al Content.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4706, doi. 10.1007/s11664-015-4132-7
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In Situ Polymerization and Characterization of Highly Conducting Polypyrrole Fish Scales for High-Frequency Applications.
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- Journal of Electronic Materials, 2015, v. 44, n. 12, p. 4669, doi. 10.1007/s11664-015-3907-1
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