Works matching DE "MERCURY cadmium telluride detectors"
1
- Optical Engineering, 2014, v. 53, n. 8, p. 1, doi. 10.1117/1.OE.53.8.081906
- Beck, Jeffrey D.;
- Mike Kinch;
- Xiaoli Sun
- Article
2
- Optical Engineering, 2014, v. 53, n. 8, p. 1, doi. 10.1117/1.OE.53.8.081905
- Beck, Jeffrey D.;
- Scritchfield, Richard;
- Mitra, Pradip;
- Sullivan III, William W.;
- Gleckler, Anthony D.;
- Strittmatter, Robert;
- Martin, Robert J.
- Article
3
- Optical Engineering, 2011, v. 50, n. 6, p. 060101, doi. 10.1117/1.3596724
- Article
4
- Optical Engineering, 2011, v. 50, n. 6, p. 061010, doi. 10.1117/1.3578405
- Breiter, Rainer;
- Ihle, Tobias;
- Wendler, Joachim C.;
- Lutz, Holger;
- Rutzinger, Stefan;
- Schallenberg, Timo;
- Hofmann, Karl C.;
- Ziegler, Johann
- Article
5
- Scientific Reports, 2020, v. 10, n. 1, p. 1, doi. 10.1038/s41598-020-62433-w
- Li, Fangzhe;
- Deng, Jie;
- Zhou, Jing;
- Chu, Zeshi;
- Yu, Yu;
- Dai, Xu;
- Guo, Huijun;
- Chen, Lu;
- Guo, Shangkun;
- Lan, Mengke;
- Chen, Xiaoshuang
- Article
6
- Metrology & Measurement Systems, 2017, v. 24, n. 4, p. 729, doi. 10.1515/mms-2017-0055
- Martyniuk, Piotr;
- Kopytko, Małgorzata;
- Madejczyk, Paweł;
- Henig, Aleksandra;
- Grodecki, Kacper;
- Gawron, Waldemar;
- Rutkowski, Jarosław
- Article
7
- Journal of Electronic Materials, 2015, v. 44, n. 9, p. 3076, doi. 10.1007/s11664-015-3822-5
- Jacobs, R.;
- Jaime Vasquez, M.;
- Lennon, C.;
- Nozaki, C.;
- Almeida, L.;
- Pellegrino, J.;
- Arias, J.;
- Taylor, C.;
- Wissman, B.
- Article
8
- Journal of Electronic Materials, 2015, v. 44, n. 9, p. 3163, doi. 10.1007/s11664-015-3858-6
- Pawluczyk, J.;
- Piotrowski, J.;
- Pusz, W.;
- Koźniewski, A.;
- Orman, Z.;
- Gawron, W.;
- Piotrowski, A.
- Article
9
- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2808, doi. 10.1007/s11664-014-3081-x
- Schuster, Jonathan;
- Bellotti, Enrico
- Article
10
- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3070, doi. 10.1007/s11664-014-3252-9
- Vallone, Marco;
- Goano, Michele;
- Bertazzi, Francesco;
- Ghione, Giovanni;
- Wollrab, Richard;
- Ziegler, Johann
- Article
11
- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2955, doi. 10.1007/s11664-014-3160-z
- Ballet, P.;
- Thomas, C.;
- Baudry, X.;
- Bouvier, C.;
- Crauste, O.;
- Meunier, T.;
- Badano, G.;
- Veillerot, M.;
- Barnes, J.;
- Jouneau, P.;
- Levy, L.
- Article
12
- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3025, doi. 10.1007/s11664-014-3185-3
- Gravrand, O.;
- Baier, N.;
- Ferron, A.;
- Rochette, F.;
- Berthoz, J.;
- Rubaldo, L.;
- Cluzel, R.
- Article
13
- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 3065, doi. 10.1007/s11664-014-3226-y
- Rubaldo, Laurent;
- Brunner, Alexandre;
- Berthoz, Jocelyn;
- Péré-Laperne, N.;
- Kerlain, A.;
- Abraham, P.;
- Bauza, D.;
- Reimbold, G.;
- Gravrand, Olivier
- Article
14
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2785, doi. 10.1007/s11664-012-2062-1
- Maloney, P.G.;
- DeWames, R.;
- Pellegrino, J.G.;
- Billman, C.;
- Arias, J.M.;
- Edwall, D.D.;
- Lee, D.;
- Khurgin, J.
- Article
15
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2928, doi. 10.1007/s11664-012-1970-4
- Rothman, Johan;
- Mollard, Laurent;
- Bosson, Sylvie;
- Vojetta, Gautier;
- Foubert, Kevin;
- Gatti, Sylvain;
- Bonnouvrier, Gwladys;
- Salveti, Frederic;
- Kerlain, Alexandre;
- Pacaud, Olivier
- Article
16
- Optical & Quantum Electronics, 2014, v. 46, n. 10, p. 1283, doi. 10.1007/s11082-013-9850-6
- Ye, Z.;
- Zhang, P.;
- Li, Y.;
- Chen, Y.;
- Zhou, S.;
- Huang, Y.;
- Sun, C.;
- Lin, C.;
- Hu, X.;
- Ding, R.;
- He, L.
- Article
17
- Optical & Quantum Electronics, 2014, v. 46, n. 10, p. 1277, doi. 10.1007/s11082-013-9841-7
- Feng, Ali;
- Li, Guang;
- He, Gang;
- Sun, Zhaoqi
- Article
18
- Optical & Quantum Electronics, 2014, v. 46, n. 10, p. 1303, doi. 10.1007/s11082-013-9860-4
- Martyniuk, Piotr;
- Gawron, Waldemar;
- Pusz, Wioletta;
- Stanaszek, Dariusz;
- Rogalski, Antoni
- Article