Works matching IS 03615235 AND DT 2014 AND VI 43 AND IP 3
1
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 761, doi. 10.1007/s11664-013-2936-x
- Allam, Ali;
- Boulet, Pascal;
- Record, Marie-Christine
- Article
2
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 780, doi. 10.1007/s11664-013-2957-5
- Lee, Hsin-Ying;
- Ye, Wan-Yi;
- Lin, Yung-Hao;
- Lou, Li-Ren;
- Lee, Ching-Ting
- Article
3
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 671, doi. 10.1007/s11664-013-2669-x
- Kpobie, W.;
- Bonfoh, N.;
- Dreistadt, C.;
- Fendler, M.;
- Lipinski, P.
- Article
4
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 648, doi. 10.1007/s11664-013-2662-4
- Kaabi, Abderrahmen;
- Bienvenu, Yves;
- Ryckelynck, David;
- Pierre, Bertrand
- Article
5
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 724, doi. 10.1007/s11664-013-2912-5
- Peng, J.;
- Zheng, X.;
- Gong, Y.;
- Zhan, K.;
- Dai, Z.
- Article
6
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 740, doi. 10.1007/s11664-013-2924-1
- Purahmad, Mohsen;
- Stroscio, Michael;
- Dutta, Mitra
- Article
7
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 802, doi. 10.1007/s11664-013-2809-3
- Mollard, L.;
- Bourgeois, G.;
- Lobre, C.;
- Gout, S.;
- Viollet-Bosson, S.;
- Baier, N.;
- Destefanis, G.;
- Gravrand, O.;
- Barnes, J.;
- Milesi, F.;
- Kerlain, A.;
- Rubaldo, L.;
- Manissadjian, A.
- Article
8
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 702, doi. 10.1007/s11664-013-2876-5
- Rmili, W.;
- Deffarges, M.P.;
- Chalon, F.;
- Ma, Z.;
- Leroy, R.
- Article
9
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 658, doi. 10.1007/s11664-013-2666-0
- Ma, Z.;
- Chalon, F.;
- Leroy, R.;
- Ranganathan, N.;
- Beake, B.D.
- Article
10
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 685, doi. 10.1007/s11664-013-2710-0
- Parès, G.;
- Crecy, F.;
- Anciant, R.
- Article
11
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 746, doi. 10.1007/s11664-013-2949-5
- Alam, M.;
- Pulavarthy, R.;
- Bielefeld, J.;
- King, S.;
- Haque, M.
- Article
12
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 755, doi. 10.1007/s11664-013-2952-x
- Zhou, Xiujuan;
- Zhou, Changrong;
- Zhou, Qin;
- Yang, Huabin;
- Cen, Zhenyong;
- Cheng, Jun;
- Cao, Lei;
- Fan, Qiaolan
- Article
13
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 732, doi. 10.1007/s11664-013-2923-2
- Rout, Jyoshna;
- Parida, B.N.;
- Das, Piyush;
- Choudhary, R.
- Article
14
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 791, doi. 10.1007/s11664-013-2943-y
- Echendu, O.;
- Dharmadasa, I.
- Article
15
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 717, doi. 10.1007/s11664-013-2956-6
- Geranmayeh, A.R.;
- Mahmudi, R.;
- Khalatbari, F.;
- Kashi, N.;
- Nayyeri, G.
- Article
16
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 786, doi. 10.1007/s11664-013-2920-5
- Zhao, Z.;
- Wang, B.;
- Sui, Y.;
- Xu, W.;
- Li, X.;
- Yu, G.
- Article
17
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 708, doi. 10.1007/s11664-013-2964-6
- Belhenini, Soufyane;
- Tougui, Abdellah;
- Bouchou, Abdelhake;
- Mohan, Ranganathan;
- Dosseul, Franck
- Article
18
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 774, doi. 10.1007/s11664-013-2953-9
- Ishizaki, Toshitaka;
- Akedo, Kunio;
- Satoh, Toshikazu;
- Watanabe, Ryota
- Article
19
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 695, doi. 10.1007/s11664-013-2718-5
- Drevin-Bazin, A.;
- Lacroix, F.;
- Barbot, J.
- Article
20
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 641, doi. 10.1007/s11664-013-2843-1
- Le Priol, A.;
- Le Bourhis, E.;
- Renault, P.-O.;
- Muller, P.;
- Sik, H.
- Article