Works matching IS 03615235 AND DT 2012 AND VI 41 AND IP 10
1
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2785, doi. 10.1007/s11664-012-2062-1
- Maloney, P.G.;
- DeWames, R.;
- Pellegrino, J.G.;
- Billman, C.;
- Arias, J.M.;
- Edwall, D.D.;
- Lee, D.;
- Khurgin, J.
- Article
2
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2824, doi. 10.1007/s11664-012-1947-3
- Shintri, Shashidhar;
- Rao, Sunil;
- Wijewarnasuriya, Priyalal;
- Trivedi, Sudhir;
- Bhat, Ishwara
- Article
3
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2795, doi. 10.1007/s11664-012-1991-z
- Kim, Kwang-Chon;
- Baek, Seung;
- Kim, Hyun;
- Song, Jin;
- Kim, Jin-Sang
- Article
4
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2745, doi. 10.1007/s11664-012-1924-x
- Li, Jin;
- Gayles, Jacob;
- Kioussis, Nicholas;
- Zhang, Z.;
- Grein, C.;
- Aqariden, F.
- Article
5
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2816, doi. 10.1007/s11664-012-1978-9
- Antoszewski, J.;
- Umana-Membreno, G.A.;
- Faraone, L.
- Article
6
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2730, doi. 10.1007/s11664-012-1990-0
- Barrière, Florence;
- Druart, Guillaume;
- Guérineau, Nicolas;
- Rommeluère, Sylvain;
- Mugnier, Laurent;
- Gravrand, Olivier;
- Baier, Nicolas;
- Lhermet, Nicolas;
- Destefanis, Gérard;
- Derelle, Sophie
- Article
7
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2759, doi. 10.1007/s11664-012-1984-y
- Sharp, James;
- Pulfrey, David;
- Umana-Membreno, Gilberto;
- Faraone, Lorenzo;
- Dell, John
- Article
8
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2874, doi. 10.1007/s11664-012-1922-z
- Washington, Aaron;
- Teague, Lucile;
- Duff, Martine;
- Burger, Arnold;
- Groza, Michael;
- Buliga, Vladimir
- Article
9
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2838, doi. 10.1007/s11664-012-2001-1
- Moravec, P.;
- Tomashik, Z.;
- Ivanits'ka, V.;
- Tomashik, V.;
- Franc, J.;
- Mašek, K.;
- Höschl, P.
- Article
10
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2908, doi. 10.1007/s11664-012-2007-8
- Hossain, A.;
- Bolotnikov, A.E.;
- Camarda, G.S.;
- Gul, R.;
- Kim, K.H.;
- Kisslinger, K.;
- Yang, G.;
- Zhang, L.H.;
- James, R.B.
- Article
11
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2846, doi. 10.1007/s11664-012-2012-y
- Rago, P.B.;
- Suarez, E.N.;
- Jain, F.C.;
- Ayers, J.E.
- Article
12
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2928, doi. 10.1007/s11664-012-1970-4
- Rothman, Johan;
- Mollard, Laurent;
- Bosson, Sylvie;
- Vojetta, Gautier;
- Foubert, Kevin;
- Gatti, Sylvain;
- Bonnouvrier, Gwladys;
- Salveti, Frederic;
- Kerlain, Alexandre;
- Pacaud, Olivier
- Article
13
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2886, doi. 10.1007/s11664-012-1992-y
- Itsuno, Anne;
- Phillips, Jamie;
- Velicu, Silviu
- Article
14
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2917, doi. 10.1007/s11664-012-2032-7
- Chen, Yuanping;
- Simingalam, Sina;
- Brill, Gregory;
- Wijewarnasuriya, Priyalal;
- Dhar, Nibir;
- Kim, Jae;
- Smith, David
- Article
15
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2912, doi. 10.1007/s11664-012-2013-x
- Yang, G.;
- Bolotnikov, A.E.;
- Fochuk, P.M.;
- Cui, Y.;
- Camarda, G.;
- Hossain, A.;
- Kim, K.;
- Horace, J.;
- McCall, B.;
- Gul, R.;
- Kopach, O.V.;
- Egarievwe, S.U.;
- James, R.B.
- Article
16
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2725, doi. 10.1007/s11664-012-2006-9
- Lhuillier, Emmanuel;
- Keuleyan, Sean;
- Liu, Heng;
- Guyot-Sionnest, Philippe
- Article
17
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2937, doi. 10.1007/s11664-012-2053-2
- Vilela, M.F.;
- Pribil, G.K.;
- Olsson, K.R.;
- Lofgreen, D.D.
- Article
18
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2738, doi. 10.1007/s11664-012-2054-1
- Chai, J.;
- Lee, K.-K.;
- Doyle, K.;
- Dinan, J.H.;
- Myers, T.H.
- Article
19
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2714, doi. 10.1007/s11664-012-2035-4
- Cervera, C.;
- Ribet-Mohamed, I.;
- Taalat, R.;
- Perez, J.P.;
- Christol, P.;
- Rodriguez, J.B.
- Article
20
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2857, doi. 10.1007/s11664-012-2055-0
- Wei, Jean;
- Murray, Joel;
- Barnes, Jacob;
- Gonzalez, Leonel;
- Guha, Shekhar
- Article
21
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2925, doi. 10.1007/s11664-012-2057-y
- Wehner, J.G.A.;
- Smith, E.P.G.;
- Radford, W.;
- Mears, C.L.
- Article
22
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2880, doi. 10.1007/s11664-012-2045-2
- Zhang, Yang;
- Duan, Ziqing;
- Li, Rui;
- Ku, Chieh-Jen;
- Reyes, Pavel;
- Ashrafi, Almamun;
- Lu, Yicheng
- Article
23
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2852, doi. 10.1007/s11664-012-2069-7
- Zhao, W.;
- Brill, G.;
- Chen, Y.;
- Smith, David
- Article
24
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2799, doi. 10.1007/s11664-012-2085-7
- Lee, Kyoung-Keun;
- Doyle, Kevin;
- Chai, Jessica;
- Dinan, John;
- Myers, Thomas
- Article
25
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2971, doi. 10.1007/s11664-012-2089-3
- Benson, J.D.;
- Bubulac, L.O.;
- Smith, P.J.;
- Jacobs, R.N.;
- Markunas, J.K.;
- Jaime-Vasquez, M.;
- Almeida, L.A.;
- Stoltz, A.;
- Arias, J.M.;
- Brill, G.;
- Chen, Y.;
- Wijewarnasuriya, P.S.;
- Farrell, S.;
- Lee, U.
- Article
26
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2766, doi. 10.1007/s11664-012-2093-7
- Jóźwikowski, K.;
- Kopytko, M.;
- Rogalski, A.
- Article
27
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2899, doi. 10.1007/s11664-012-2056-z
- Fahey, S.;
- Bommena, R.;
- Kodama, R.;
- Sporken, R.;
- Sivananthan, S.
- Article
28
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2965, doi. 10.1007/s11664-012-2088-4
- Lennon, C.M.;
- Almeida, L.A.;
- Jacobs, R.N.;
- Markunas, J.K.;
- Smith, P.J.;
- Arias, J.;
- Brown, A.E.;
- Pellegrino, J.
- Article
29
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2943, doi. 10.1007/s11664-012-2087-5
- Kerlain, A.;
- Bonnouvrier, G.;
- Rubaldo, L.;
- Decaens, G.;
- Reibel, Y.;
- Abraham, P.;
- Rothman, J.;
- Mollard, L.;
- De Borniol, E.
- Article
30
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2833, doi. 10.1007/s11664-012-2100-z
- Colegrove, E.;
- Banai, R.;
- Blissett, C.;
- Buurma, C.;
- Ellsworth, J.;
- Morley, M.;
- Barnes, S.;
- Gilmore, C.;
- Bergeson, J.;
- Dhere, R.;
- Scott, M.;
- Gessert, T.;
- Sivananthan, Siva
- Article
31
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2828, doi. 10.1007/s11664-012-2113-7
- Wenisch, J.;
- Eich, D.;
- Lutz, H.;
- Schallenberg, T.;
- Wollrab, R.;
- Ziegler, J.
- Article
32
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2867, doi. 10.1007/s11664-012-2104-8
- Gemain, F.;
- Robin, I.C.;
- Brochen, S.;
- De Vita, M.;
- Gravrand, O.;
- Lusson, A.
- Article
33
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2893, doi. 10.1007/s11664-012-2126-2
- Aqariden, F.;
- Tari, S.;
- Nissanka, K.;
- Li, Jin;
- Kioussis, N.;
- Pimpinella, R.;
- Dobrowolska, M.
- Article
34
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2754, doi. 10.1007/s11664-012-2121-7
- Yasuda, K.;
- Niraula, M.;
- Fujimura, N.;
- Tachi, T.;
- Inuzuka, H.;
- Namba, S.;
- Muramatsu, S.;
- Kondo, T.;
- Agata, Y.
- Article
35
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2719, doi. 10.1007/s11664-012-2129-z
- Carmody, M.;
- Yulius, A.;
- Edwall, D.;
- Lee, D.;
- Piquette, E.;
- Jacobs, R.;
- Benson, D.;
- Stoltz, A.;
- Markunas, J.;
- Almeida, A.;
- Arias, J.
- Article
36
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2957, doi. 10.1007/s11664-012-2122-6
- Reddy, M.;
- Wilde, J.;
- Peterson, J.;
- Lofgreen, D.D.;
- Johnson, S.M.
- Article
37
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2790, doi. 10.1007/s11664-012-2130-6
- Dandekar, Niru;
- Chivas, Robert;
- Silverman, Scott;
- Kou, Xiaolu;
- Goorsky, Mark
- Article
38
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2949, doi. 10.1007/s11664-012-2106-6
- Stoltz, A.;
- Benson, J.;
- Jacobs, R.;
- Smith, P.;
- Almeida, L.;
- Carmody, M.;
- Farrell, S.;
- Wijewarnasuriya, P.;
- Brill, G.;
- Chen, Y.
- Article
39
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2775, doi. 10.1007/s11664-012-2161-z
- Jain, F.;
- Karmakar, S.;
- Chan, P.-Y.;
- Suarez, E.;
- Gogna, M.;
- Chandy, J.;
- Heller, E.
- Article
40
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2975, doi. 10.1007/s11664-012-2169-4
- Jaime-Vasquez, M.;
- Jacobs, R.N.;
- Nozaki, C.;
- Benson, J.D.;
- Almeida, L.A.;
- Arias, J.;
- Pellegrino, J.
- Article
41
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2810, doi. 10.1007/s11664-012-2176-5
- Chan, P.-Y.;
- Suarez, E.;
- Gogna, M.;
- Miller, B.I.;
- Heller, E.K.;
- Ayers, J.E.;
- Jain, F.C.
- Article
42
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2981, doi. 10.1007/s11664-012-2168-5
- Schuster, Jonathan;
- Keasler, Craig;
- Reine, Marion;
- Bellotti, Enrico
- Article
43
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2671, doi. 10.1007/s11664-012-2182-7
- D'Souza, A.I.;
- Robinson, E.;
- Ionescu, A.C.;
- Okerlund, D.;
- Lyon, T.J.;
- Sharifi, H.;
- Roebuck, M.;
- Yap, D.;
- Rajavel, R.D.;
- Dhar, N.;
- Wijewarnasuriya, P.S.;
- Grein, C.
- Article
44
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2686, doi. 10.1007/s11664-012-2181-8
- Gravrand, O.;
- Mollard, L.;
- Boulade, O.;
- Moreau, V.;
- Sanson, E.;
- Destefanis, G.
- Article
45
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2700, doi. 10.1007/s11664-012-2189-0
- Aqariden, F.;
- Elsworth, J.;
- Zhao, J.;
- Grein, C.H.;
- Sivananthan, S.
- Article
46
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2679, doi. 10.1007/s11664-012-2187-2
- Guidry, D.H.;
- Morath, C.P.;
- Cowan, V.M.;
- Cardimona, D.A.
- Article
47
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2661, doi. 10.1007/s11664-012-2236-x
- Sivananthan, S.;
- Dhar, N.;
- Anter, Y.
- Article
48
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2707, doi. 10.1007/s11664-012-2218-z
- Jacobs, R.N.;
- Nozaki, C.;
- Almeida, L.A.;
- Jaime-Vasquez, M.;
- Lennon, C.;
- Markunas, J.K.;
- Benson, D.;
- Smith, P.;
- Zhao, W.F.;
- Smith, D.J.;
- Billman, C.;
- Arias, J.;
- Pellegrino, J.
- Article
49
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2694, doi. 10.1007/s11664-012-2240-1
- Gergaud, P.;
- Jonchère, A.;
- Amstatt, B.;
- Baudry, X.;
- Brellier, D.;
- Ballet, P.
- Article
50
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2663, doi. 10.1007/s11664-012-2220-5
- Karmakar, Supriya;
- Suarez, Ernesto;
- Gogna, Mukesh;
- Jain, Faquir
- Article