Works matching IS 03615235 AND DT 2005 AND VI 34 AND IP 3
1
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. L12, doi. 10.1007/s11664-005-0221-3
- Catchmark, Jeffrey M.;
- Lavallee, Guy P.;
- Rogosky, Michael;
- Youngchul Lee
- Article
2
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. L9, doi. 10.1007/s11664-005-0220-4
- Yow-Jon Lin;
- Chou-Wei Hsu;
- Yao-Ming Chen;
- Yung-Chi Wang
- Article
4
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 311, doi. 10.1007/s11664-005-0218-y
- Ogawa, T.;
- Kaga, R.;
- Ohsawa, T.
- Article
5
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 299, doi. 10.1007/s11664-005-0217-z
- Lopez, Edwin P.;
- Vianco, Paul T.;
- Rejent, Jerome A.
- Article
6
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 294, doi. 10.1007/s11664-005-0216-0
- Wartenberg, Scott A.;
- Gang Zhao;
- Liu, Qing H.
- Article
7
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 287, doi. 10.1007/s11664-005-0215-1
- Zongrong Liu;
- Chung, D. D. L.
- Article
8
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 282, doi. 10.1007/s11664-005-0214-2
- Ching-Ting Lee;
- Hong-Wei Chen;
- Fu-Tsai Hwang;
- Hsin-Ying Lee
- Article
9
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 272, doi. 10.1007/s11664-005-0213-3
- Chia-Tai Kuo;
- Ming-Chuen Yip;
- Kuo-Ning Chiang;
- Chingfu Tsou
- Article
10
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 266, doi. 10.1007/s11664-005-0212-4
- Yi Li;
- Kyoung-Sik Moon;
- Wong, C. P.
- Article
11
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 248, doi. 10.1007/s11664-005-0211-5
- Bozack, M. J.;
- Johnson, R. W.
- Article
12
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 240, doi. 10.1007/s11664-005-0210-6
- Koike, Kunihiko;
- Izumi, Koichi;
- Nakamura, Sadaki;
- Inoue, Goichi;
- Kurokawa, Akira;
- Ichimura, Shingo
- Article
13
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 232, doi. 10.1007/s11664-005-0209-z
- Hobbs, L.;
- Eddie, I.;
- Erwin, G.;
- Bryce, A. C.;
- De La Rue, R. M.;
- Roberts, J. S.;
- Krauss, T. F.;
- McComb, D. W.;
- Mackenzie, M.
- Article
14
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 225, doi. 10.1007/s11664-005-0208-0
- Srivastav, V.;
- Pal, R.;
- Sharma, B. L.;
- Mittal, V.;
- Gopal, V.;
- Vyas, H. P.
- Article
15
- Journal of Electronic Materials, 2005, v. 34, n. 3, p. 217, doi. 10.1007/s11664-005-0207-1
- Bo Li;
- Yaowu Shi;
- Yongping Lei;
- Fu Guo;
- Zhidong Xia;
- Bin Zong
- Article