Works matching IS 03615235 AND DT 2004 AND VI 33 AND IP 3
1
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 241, doi. 10.1007/s11664-004-0186-7
- Polyakov, A. Y.;
- Smirnov, N. B.;
- Govorkov, A. V.;
- Kim, Jihyun;
- Ren, F.;
- Thaler, G. T.;
- Frazier, R. M.;
- Gila, B. P.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Buyanova, I. A.;
- Rudko, G. Y.;
- Chen, W. M.;
- C.-C. Pan, W. M.;
- G.-T. Chen, W. M.;
- J.-I. Chyi, W. M.;
- Zavada, J. M.
- Article
2
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 229, doi. 10.1007/s11664-004-0185-8
- Article
3
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 224, doi. 10.1007/s11664-004-0184-9
- Uddin, M. A.;
- Chan, H. P.;
- Chow, C. K.;
- Chan, Y. C.
- Article
4
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 218, doi. 10.1007/s11664-004-0183-x
- Yanfu Yan, G.;
- Jianping Liu;
- Yaowu Shi, G.;
- Zhidong Xia, G.
- Article
5
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 171, doi. 10.1007/s11664-004-0176-9
- M. D. Cheng, Pavel;
- S. F. Yen, Pavel;
- T. H. Chuang, Pavel
- Article
6
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 213, doi. 10.1007/s11664-004-0182-y
- C. A. Wang, Paul K.;
- D. A. Shiau, Paul K.;
- Murphy, P. G.;
- O'Brien, P. W.;
- R. K. Huang, P. W.;
- Connors, M. K.;
- Anderson, A. C.;
- Donetsky, D.;
- Anikeev, S.;
- Belenky, G.;
- Depoy, D. M.;
- Nichols, G.
- Article
7
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 157, doi. 10.1007/s11664-004-0174-y
- Pei-Un Wu, Pavel;
- Meng-Kuang Huang, Pavel;
- Chiapyng Lee;
- Shyh-Rong Tzan, Pavel
- Article
8
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 203, doi. 10.1007/s11664-004-0180-0
- Chia-Ken Leong, D. D. L.;
- Chung, D. D. L.
- Article
9
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 181, doi. 10.1007/s11664-004-0177-8
- Wen-Rong Chang;
- Yean-Kuen Fang;
- Shyh-Fann Ting;
- Shin-Fang Chen, Pavel;
- Chun-Yu Lin;
- Sheng-Beng Hwang, Pavel;
- Cheng-Nan Chang
- Article
10
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 207, doi. 10.1007/s11664-004-0181-z
- Zhenghua An, D. D. L.;
- Miao Zhang, D. D. L.;
- Fu, Ricky K. Y.;
- Chu, Paul K.;
- Chenglu Lin
- Article
11
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 162, doi. 10.1007/s11664-004-0175-x
- Article
12
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 194, doi. 10.1007/s11664-004-0179-6
- Zongrong Liu, H. R.;
- Chung, D. D. L.
- Article
13
- Journal of Electronic Materials, 2004, v. 33, n. 3, p. 185, doi. 10.1007/s11664-004-0178-7
- Ahrenkiel, S. P.;
- Wanlass, M. W.;
- Carapella, J. J.;
- Gedvilas, L. M.;
- Keyes, B. M.;
- Ahrenkiel, R. K.;
- Moutinho, H. R.
- Article