Works matching DE "METROLOGY"


Results: 2005
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    Manipulation of Vehicle Scales in Legal Metrology.

    Published in:
    Akademika, 2025, v. 95, n. 1, p. 459, doi. 10.17576/akad-2025-9501-26
    By:
    • RAMLEY, ASMAZATUL ADAWIYAH;
    • BIN ABD RAHMAN, MOHAMAD RIZAL;
    • SHUKUR, ZARINA;
    • IBRAHIM, MUHAMMAD AZWAN
    Publication type:
    Article
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    White beam topography of 300 mm Si wafers.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 269, doi. 10.1007/s10854-007-9480-5
    By:
    • Danilewsky, A. N.;
    • Wittge, J.;
    • Rack, A. T.;
    • Weitkamp, T.;
    • Simon, R.;
    • Baumbach, T.;
    • McNally, P.
    Publication type:
    Article
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    Band offset diagnostics of advanced dielectrics.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 73, doi. 10.1007/s10854-007-9558-0
    By:
    • Edelman, Piotr;
    • Wilson, Marshall;
    • D’Amico, John;
    • Savtchouk, Alexandre;
    • Lagowski, Jacek
    Publication type:
    Article
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    Optical metrology for digital manufacturing: a review.

    Published in:
    International Journal of Advanced Manufacturing Technology, 2022, v. 120, n. 7/8, p. 4271, doi. 10.1007/s00170-022-09084-5
    By:
    • Catalucci, Sofia;
    • Thompson, Adam;
    • Piano, Samanta;
    • Branson III, David T.;
    • Leach, Richard
    Publication type:
    Article
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    Fluid thermostats made by NPP Etalon.

    Published in:
    Chemical & Petroleum Engineering, 2013, v. 49, n. 3/4, p. 259, doi. 10.1007/s10556-013-9736-2
    By:
    • Emel'yanchenko, P.
    Publication type:
    Article
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    Control-enhanced non-Markovian quantum metrology.

    Published in:
    Communications Physics, 2024, v. 7, n. 1, p. 1, doi. 10.1038/s42005-024-01758-8
    By:
    • Yang, Xiaodong;
    • Long, Xinyue;
    • Liu, Ran;
    • Tang, Kai;
    • Zhai, Yue;
    • Nie, Xinfang;
    • Xin, Tao;
    • Li, Jun;
    • Lu, Dawei
    Publication type:
    Article
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