Works matching DE "PERMITTIVITY measurement"
1
- Nanophotonics (21928606), 2025, v. 14, n. 10, p. 1673, doi. 10.1515/nanoph-2025-0060
- Lassen, Henrik B.;
- Carstensen, William V.;
- Miakota, Denys I.;
- Ghimire, Ganesh;
- Canulescu, Stela;
- Jepsen, Peter U.;
- Kelleher, Edmund J. R.
- Article
2
- Revista Cubana de Física, 2013, v. 30, n. 1, p. 19
- VÁZQUEZ, O.;
- FUNDORA, A.;
- SIQUEIROS, J. M.
- Article
3
- Journal of Electronic Materials, 2025, v. 54, n. 2, p. 1381, doi. 10.1007/s11664-024-11602-y
- Li, Yuhan;
- Yang, Junliang;
- Huang, Shengxiang;
- Deng, Lianwen;
- He, Longhui
- Article
4
- Journal of Electronic Materials, 2024, v. 53, n. 7, p. 3541, doi. 10.1007/s11664-024-11060-6
- Das, Gouree Shankar;
- Buragohain, Akash;
- Beria, Yatish
- Article
5
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 19425, doi. 10.1007/s10854-018-0071-4
- Khatua, Deeptimayee;
- Choudhary, R. N. P.;
- Achary, P. Ganga Raju
- Article
6
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 15994, doi. 10.1007/s10854-018-9685-9
- Xu, Ciqun;
- Qu, Yunpeng;
- Fan, Guohua;
- Xie, Peitao;
- Ren, Huan;
- Chen, Jiaqi;
- Liu, Yao;
- Wu, Yulin;
- Fan, Runhua
- Article
7
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 12, p. 10154, doi. 10.1007/s10854-018-9061-9
- Taïbi, K.;
- Si-Ahmed, F.;
- Bidault, O.;
- Millot, N.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 2, p. 1246, doi. 10.1007/s10854-017-8027-7
- Qu, Yunpeng;
- Xie, Peitao;
- Fan, Guohua;
- Liu, Yao;
- Wu, Yulin;
- Zhang, Lei;
- Fan, Runhua
- Article
9
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 24, p. 19090, doi. 10.1007/s10854-017-7863-9
- Ren, Haishen;
- Xie, Tianyi;
- Dang, Mingzhao;
- Yao, Xiaogang;
- Jiang, Shaohu;
- Zhao, Xiangyu;
- Lin, Huixing;
- Luo, Lan
- Article
10
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 15907, doi. 10.1007/s10854-017-7486-1
- Jain Ruth, D.;
- Sundarakannan, B.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 18, p. 13621, doi. 10.1007/s10854-017-7202-1
- Klygach, D.;
- Vakhitov, M.;
- Zherebtsov, D.;
- Kudryavtsev, O.;
- Knyazev, N.;
- Malkin, A.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3474, doi. 10.1007/s10854-016-5945-8
- Luo, W.;
- Wu, Q.;
- Wu, C.;
- Yu, Y.;
- Shuai, Y.;
- Zhang, W.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 10, p. 10627, doi. 10.1007/s10854-016-5159-0
- Chen, Zhuo;
- Shan, Xinping;
- Li, Guangyao;
- Huang, Ning;
- Hao, Hua;
- Liu, Hanxing
- Article
14
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5233, doi. 10.1007/s10854-016-4418-4
- Kumar, Ranjit;
- Zulfequar, M.;
- Senguttuvan, T.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2836, doi. 10.1007/s10854-015-4098-5
- Li, Fuyun;
- Zeng, Min;
- Yu, Hongtao;
- Xu, Hui;
- Li, Jing
- Article
16
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 5892, doi. 10.1007/s10854-015-3158-1
- Fang, Liang;
- Wei, Zhenhai;
- Guo, Huanhuan;
- Sun, Yihua;
- Tang, Ying;
- Li, Chunchun
- Article
17
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 853, doi. 10.1007/s10854-014-2474-1
- Chen, Yih-Chien;
- Weng, Min-Zhe
- Article
18
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 927, doi. 10.1007/s10854-014-2484-z
- Zhu, Weixin;
- Zhang, Yao;
- Yang, Yixi;
- Zhou, Dong;
- Yang, Chengtao
- Article
19
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 916, doi. 10.1007/s10854-014-2482-1
- Niu, Benben;
- Ma, Weibing;
- Li, Qiang;
- Chen, Tiankai;
- Huan, Zhengli;
- Meng, Xueyuan;
- Ma, Jianqiang
- Article
20
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 998, doi. 10.1007/s10854-014-2495-9
- Cai, Haocheng;
- Li, Lingxia;
- Sun, Hao;
- Gao, Zhengdong;
- Lv, Xiaosong
- Article
21
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5218, doi. 10.1007/s10854-014-2291-6
- Paul, Biplab;
- Halder, Kumaresh;
- Roy, Debasis;
- Bagchi, Biswajoy;
- Bhattacharya, Alakananda;
- Das, Sukhen
- Article
22
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5546, doi. 10.1007/s10854-014-2342-z
- Sharma, Updesh;
- Dutta, Shankar
- Article
23
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5601, doi. 10.1007/s10854-014-2349-5
- Zhang, Jing;
- Wang, Lixi;
- Zhang, Qitu
- Article
24
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 11, p. 4896, doi. 10.1007/s10854-014-2250-2
- Kumar, Manish;
- Shankar, S.;
- Thakur, O.;
- Ghosh, Anup
- Article
25
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 11, p. 4841, doi. 10.1007/s10854-014-2242-2
- Cai, Wei;
- Fu, Chunlin;
- Chen, Gang;
- Deng, Xiaoling;
- Gao, Rongli;
- Liu, Kaihua
- Article
26
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 11, p. 4856, doi. 10.1007/s10854-014-2244-0
- Prasad, K.;
- Priyanka;
- AmarNath, K.;
- Chandra, K.;
- Kulkarni, A.
- Article
27
- Journal of Solid State Electrochemistry, 2016, v. 20, n. 6, p. 1673, doi. 10.1007/s10008-016-3139-1
- Mardare, Andrei;
- Grill, Carina;
- Pötzelberger, Isabella;
- Etzelstorfer, Tanja;
- Stangl, Julian;
- Hassel, Achim
- Article
28
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 10, p. 909, doi. 10.1134/S1061830921100107
- Li, Zhen;
- Qi, Jinjin;
- Meng, Zhaozong;
- Wang, Ping;
- Soutis, Constantinos;
- Gibson, Andrew
- Article
29
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 6, p. 500, doi. 10.1134/S1061830921060085
- Kaz'min, A. I.;
- Fedyunin, P. A.;
- Fedyunin, D. P.
- Article
30
- Measurement Techniques, 2023, v. 66, n. 8, p. 553, doi. 10.1007/s11018-023-02267-w
- Egorov, V. N.;
- Tokareva, E. Yu.;
- Prokop'eva, E. K.;
- Malay, I. M.;
- Tuyen, L. Q.
- Article
31
- Measurement Techniques, 2020, v. 63, n. 7, p. 580, doi. 10.1007/s11018-020-01826-9
- Generalov, V. M.;
- Safatov, A. S.;
- Kruchinina, M. V.;
- Gromov, A. A.;
- Buryak, G. A.;
- Generalov, K. V.;
- Kruchinin, V. N.
- Article
32
- Measurement Techniques, 2017, v. 60, n. 1, p. 1, doi. 10.1007/s11018-017-1140-4
- Altaev, O.;
- Egorov, V.;
- Kashchenko, M.;
- Masalov, V.;
- Tokareva, E.
- Article
33
- Measurement Techniques, 2015, v. 58, n. 9, p. 975, doi. 10.1007/s11018-015-0828-6
- Article
34
- Measurement Techniques, 2014, v. 57, n. 9, p. 1077, doi. 10.1007/s11018-014-0583-0
- Kotel'nikov, I.;
- Osadchii, V.;
- Kos'min, D.;
- Kanareikin, A.;
- Nenasheva, E.;
- Kozyrev, A.
- Article
35
- Fluid Dynamics, 2023, v. 58, n. 3, p. 497, doi. 10.1134/S0015462823600177
- Maslov, S. A.;
- Natyaganov, V. L.
- Article
36
- Bioengineering (Basel), 2024, v. 11, n. 7, p. 699, doi. 10.3390/bioengineering11070699
- Wang, Jiajia;
- Gao, Yunyu;
- Xin, Sherman Xuegang
- Article
37
- Acta Universitatis Lodziensis Folia Biologica et Oecologica, 2024, v. 18, p. 11, doi. 10.18778/1730-2366.18.04
- SAMOLEJ, KAMILA;
- BARTOSIK, MAKSYMILIAN;
- ŚLOT, MACIEJ
- Article
38
- Photonics, 2025, v. 12, n. 3, p. 283, doi. 10.3390/photonics12030283
- Article
39
- Pakistan Journal of Scientific & Industrial Research Series A: Physical Sciences, 2017, v. 60, n. 2 A, p. 85, doi. 10.52763/pjsir.phys.sci.60.2.2017.85.89
- Avaznia, Cyrus;
- Moradi, Gholamreza
- Article
40
- Journal of Asian Ceramic Societies, 2020, v. 8, n. 4, p. 1147, doi. 10.1080/21870764.2020.1824317
- Tang, Zhen-Xun;
- Ge, Peng-Zu;
- Tang, Xin-Gui;
- Liu, Qiu-Xiang;
- Jiang, Yan-Ping
- Article
41
- 2020
- Misra, Shikhar;
- Kalaswad, Matias;
- Zhang, Di;
- Wang, Haiyan
- Report
42
- Discrete & Continuous Dynamical Systems - Series S, 2017, v. 10, n. 4, p. 745, doi. 10.3934/dcdss.2017038
- Escher, Joachim;
- Lienstromberg, Christina
- Article
43
- Physica Status Solidi - Rapid Research Letters, 2016, v. 10, n. 4, p. 328, doi. 10.1002/pssr.201600043
- Bérardan, David;
- Franger, Sylvain;
- Dragoe, Diana;
- MeENa, Arun Kumar;
- Dragoe, Nita
- Article
44
- Annals of the Faculty of Engineering Hunedoara - International Journal of Engineering, 2022, n. 1, p. 61
- VESZELOVSZKI RÓBERTNÉ KOVÁCS, Petra;
- GREZNÁR, Márk;
- NAGY, Valéria
- Article
45
- Progress in Electromagnetics Research M, 2022, v. 111, p. 235, doi. 10.2528/pierm22052501
- Yun-Rui Wang;
- Hong-Gang Hao
- Article
46
- Progress in Electromagnetics Research M, 2020, n. 91, p. 155, doi. 10.2528/pierm20020102
- Benali, Lahcen Ait;
- Terhzaz, Jaouad;
- Tribak, Abdelwahed;
- Mediavilla, Angel
- Article
47
- Progress in Electromagnetics Research M, 2019, v. 87, p. 115, doi. 10.2528/pierm19100902
- Tabatadze, Vasil;
- Karaçuha, Kamil;
- Karaçuha, Ertuğrul
- Article
48
- Progress in Electromagnetics Research M, 2019, v. 86, p. 71, doi. 10.2528/pierm19080606
- Serdyuk, Vladimir M.;
- Titovitsky, Joseph A.
- Article
49
- Progress in Electromagnetics Research M, 2019, v. 84, p. 1, doi. 10.2528/pierm19061802
- Minghui Ding;
- Yanqing Liu;
- Xinru Lu;
- Yifeng Li;
- Weizhong Tang
- Article
50
- Progress in Electromagnetics Research M, 2018, v. 66, p. 183
- Frasch, Jonathan L.;
- Rothwell, Edward J.;
- Chahal, Premjeet;
- Doroshewitz, John
- Article