Works matching Rutherford Backscattering Spectroscopy

Results: 323

Determination of the Oxygen Concentration in GDP Thin Films Using Rutherford Backscattering Spectroscopy.

Published in:

Fusion Science & Technology, 2021, v. 77, n. 6, p. 446, doi. 10.1080/15361055.2021.1927624

By:

Ma, Xiaojun;
Wang, Qi;
Wang, Zongwei;
Wan, Xiangyu

Publication type:

Article

Solid–liquid interface analysis with in‐situ Rutherford backscattering and electrochemical impedance spectroscopy.

Published in:

Surface & Interface Analysis: SIA, 2020, v. 52, n. 12, p. 1111, doi. 10.1002/sia.6835

By:

Bergmann, Ute;
Apelt, Sabine;
Khojasteh, Nasrin B.;
Heller, René

Publication type:

Article

Study of silicon implanted with zinc and oxygen ions via Rutherford backscattering spectroscopy.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2014, v. 8, n. 4, p. 794, doi. 10.1134/S1027451014040302

By:

Privezentsev, V.;
Kulikauskas, V.;
Zatekin, V.;
Petrov, D.;
Makunin, A.;
Shemukhin, A.;
Lutzau, A.;
Putrik, A.

Publication type:

Article

Investigation of the long-range effect of light irradiation by means of Rutherford backscattering/ion channeling spectroscopy.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 2, p. 239, doi. 10.1134/S1027451009020128

By:

Levshunova, V.;
Mendeleva, Yu.;
Pokhil, G.;
Tetelbaum, D.;
Chernykh, P.

Publication type:

Article

Rutherford backscattering spectroscopy and structural analysis of DC reactive magnetron sputtered titanium nitride thin films on glass substrates.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 1, p. 335, doi. 10.1007/s10854-015-3759-8

By:

Ajenifuja, Emmanuel;
Osinkolu, Gabriel;
Yisau Fasasi, A.;
Pelemo, David;
Obiajunwa, E.

Publication type:

Article

X-Ray Photoelectron and Rutherford Backscattering Spectroscopy of Silicon Hyperdoped with Selenium.

Published in:

Journal of Applied Spectroscopy, 2024, v. 91, n. 3, p. 586, doi. 10.1007/s10812-024-01758-0

By:

Komarov, F. F.;
Wang, Ting;
Vlasukova, L. A.;
Parkhomenko, I. N.;
Milchanin, O. V.

Publication type:

Article

Investigation of HfO2 Thin Films on Si by X-ray Photoelectron Spectroscopy, Rutherford Backscattering, Grazing Incidence X-ray Diffraction and Variable Angle Spectroscopic Ellipsometry.

Published in:

Crystals (2073-4352), 2018, v. 8, n. 6, p. 248, doi. 10.3390/cryst8060248

By:

Luo, Xuguang;
Li, Yao;
Yang, Hong;
Liang, Yuanlan;
He, Kaiyan;
Sun, Wenhong;
Lin, Hao-Hsiung;
Yao, Shude;
Lu, Xiang;
Wan, Lingyu;
Feng, Zhechuan

Publication type:

Article

A Comparison of Rutherford Backscattering Spectroscopy and X-Ray Diffraction to Determine the Composition of Thick InGaN Epilayers.

Published in:

Physica Status Solidi (B), 2001, v. 228, n. 1, p. 41, doi. 10.1002/1521-3951(200111)228:1<41::AID-PSSB41>3.0.CO;2-N

By:

Srinivasan, S.;
Liu, R.;
Bertram, F.;
Ponce, F.A.;
Tanaka, S.;
Omiya, H.;
Nakagawa, Y.

Publication type:

Article

Barrier-type anodic films on aluminium in aqueous borate solutions: 2-Film compositions by Rutherford backscattering spectroscopy and nuclear reaction methods.

Published in:

Surface & Interface Analysis: SIA, 1983, v. 5, n. 6, p. 252, doi. 10.1002/sia.740050606

By:

Skeldon, P.;
Shimizu, K.;
Thompson, G. E.;
Wood, G. C.

Publication type:

Article

Investigation of the interaction of Greek dolomitic marble with metal aqueous solutions using rutherford backscattering and X-ray photoelectron spectroscopy.

Published in:

Journal of Radioanalytical & Nuclear Chemistry, 2007, v. 272, n. 2, p. 339, doi. 10.1007/s10967-007-0526-1

By:

Godelitsas, A.;
Kokkoris, M.;
Misaelides, P.

Publication type:

Article

Rutherford Backscattering Spectroscopy Study of the Kinetics of Oxidation of (Mg, Fe)2SiO4.

Published in:

Journal of the American Ceramic Society, 1988, v. 71, n. 7, p. 540, doi. 10.1111/j.1151-2916.1988.tb05917.x

By:

WU, TONG;
KOHLSTEDT, D. L.

Publication type:

Article

Kinetics of the Growth of Spinel on Alumina Using Rutherford Backscattering Spectroscopy.

Published in:

Journal of the American Ceramic Society, 1987, v. 70, n. 7, p. C-149, doi. 10.1111/j.1151-2916.1987.tb05691.x

By:

Simpson, Y. Kouh;
Colgan, E. G.;
Carter, C. B.

Publication type:

Article

Accuracy of energy dispersive x-ray composition analysis of YBCO films on yttrium-containing substrates as compared to Rutherford backscattering spectroscopy.

Published in:

Journal of Materials Science, 2000, v. 35, n. 2, p. 443, doi. 10.1023/A:1004723519096

By:

Mustapha, Z.;
Chan, Siu-Wai;
Lam, A.;
Gerhardt, R.

Publication type:

Article

Chemical Analysis with High Spatial Resolution by Rutherford Backscattering and Raman Confocal Spectroscopies: Surface Hierarchically Structured Glasses.

Published in:

Journal of the American Ceramic Society, 2013, v. 96, n. 6, p. 1783, doi. 10.1111/jace.12397

By:

Reinosa, Julián Jiménez;
Marero, David Martín y;
Campo, Adolfo;
la Rubia, Miguel Ángel;
Fernández, José Francisco;
Dickey, E. C.

Publication type:

Article

Influence of the Charge State of Xenon Ions on the Depth Distribution Profile Upon Implantation into Silicon.

Published in:

Semiconductors, 2019, v. 53, n. 8, p. 1011, doi. 10.1134/S1063782619080062

By:

Balakshin, Yu. V.;
Kozhemiako, A. V.;
Petrovic, S.;
Erich, M.;
Shemukhin, A. A.;
Chernysh, V. S.

Publication type:

Article

Surface and interface roughness estimations by X-ray reflectivity and RBS measurements.

Published in:

Surface & Interface Analysis: SIA, 2014, v. 46, n. 12/13, p. 1208, doi. 10.1002/sia.5644

By:

Fujii, Y.;
Nakajima, K.;
Suzuki, M.;
Kimura, K.

Publication type:

Article

Fe-Mg diffusion in spinel: New experimental data and a point defect model.

Published in:

American Mineralogist, 2015, v. 100, n. 10, p. 2112, doi. 10.2138/am-2015-5109

By:

Vogt, Katharina;
Dohmen, Ralf;
Chakraborty, Sumit

Publication type:

Article

Bipolar Switching Behavior of ZnO Thin Films Deposited by Metalorganic Chemical Vapor Deposition at Various Growth Temperatures.

Published in:

Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4175, doi. 10.1007/s11664-015-3935-x

By:

Bae, Seonho;
Kim, Dae-Sik;
Jung, Seojoo;
Jeong, Woo;
Lee, Jee;
Cho, Seunghee;
Park, Junsung;
Byun, Dongjin

Publication type:

Article

Solid State Reaction and Operational Stability of Ruthenium Schottky Contact-on-6H-SiC Under Argon Annealing.

Published in:

Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3265, doi. 10.1007/s11664-015-3873-7

By:

Munthali, Kinnock;
Theron, Chris;
Auret, F.;
Coelho, Sergio;
Njoroge, Eric

Publication type:

Article

Ag-ZnO Nanocomposite Thin Film by RF-Sputtering: An Electrical and Structural Study.

Published in:

Macromolecular Symposia, 2017, v. 376, n. 1, p. n/a, doi. 10.1002/masy.201600197

By:

Singh, S. K.;
Singhal, R.;
Siva Kumar, V. V.

Publication type:

Article

Determination of the density of silicon-nitride thin films by ion-beam analytical techniques (RBS, PIXE, STIM).

Published in:

Journal of Radioanalytical & Nuclear Chemistry, 2016, v. 307, n. 1, p. 341, doi. 10.1007/s10967-015-4102-9

By:

Huszank, Robert;
Csedreki, László;
Kertész, Zsófia;
Török, Zsófia

Publication type:

Article

Nuclear physics experiments with a medical cyclotron.

Published in:

International Journal of Modern Physics: Conference Series, 2020, v. 50, p. N.PAG, doi. 10.1142/S2010194520600058

By:

Casolaro, Pierluigi;
Campajola, Luigi;
Braccini, Saverio;
De Luca, Daniela;
Ereditato, Antonio;
Häffner, Philipp Daniel;
Scampoli, Paola

Publication type:

Article

Study of Memristors Based on Silicon-Oxide Films Implanted with Zinc.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2022, v. 16, n. 3, p. 402, doi. 10.1134/S1027451022030314

By:

Privezentsev, V. V.;
Kulikauskas, V. S.;
Zatekin, V. V.;
Kiselev, D. A.;
Voronova, M. I.

Publication type:

Article

Ion-beam-induced Modifications of Nanocrystalline ZnO thin Films Grown by Atomic Layer Deposition.

Published in:

Indian Journal of Engineering & Materials Sciences, 2023, v. 30, n. 3, p. 437, doi. 10.56042/ijems.v30i3.3792

By:

Gupta, Deepika;
Sharma, Shweta;
Upadhyay, Sonica;
Sharma, S. K.;
Chauhan, Vishnu;
Kumar, Rajesh

Publication type:

Article

Effect of Zr and W Doping on Microstructures, Transition Temperature and Solar Transmittance Modulation of Thermochromic W/Zr Co-Doped VO2 Thin Films.

Published in:

Tanzania Journal of Engineering & Technology, 2024, v. 43, n. 1, p. 144, doi. 10.52339/tjet.v43i1.986

By:

Haji, Haji F.;
Mlyuka, Nuru R.;
Samiji, Margaret E.

Publication type:

Article

Medium energy, heavy and inert ion irradiation of metallic thin films: studies of surface nano-structuring and metal burrowing.

Published in:

Surface & Interface Analysis: SIA, 2016, v. 48, n. 9, p. 969, doi. 10.1002/sia.5999

By:

Kumar, Pravin;
Mal, Kedar;
Kumar, Sunil;
Sulania, Indra

Publication type:

Article

Significant Oxygen Underestimation When Quantifying Barium-Doped SrTiO Layers by Atom Probe Tomography.

Published in:

Microscopy & Microanalysis, 2024, v. 30, n. 1, p. 49, doi. 10.1093/micmic/ozad144

By:

Morris, Richard J H;
Lin, Jhao-Rong;
Scheerder, Jeroen E;
Popovici, Mihaela I;
Meersschaut, Johan;
Goux, Ludovic;
Kar, Gouri Sankar;
van der Heide, Paul;
Fleischmann, Claudia

Publication type:

Article

Energy-dependent surface nanopatterning of Si (100) for different projectiles: a tunable anisotropic wettability of ripple surface.

Published in:

Applied Nanoscience, 2023, v. 13, n. 5, p. 3189, doi. 10.1007/s13204-021-01975-5

By:

Vandana;
Kumar, Tanuj;
Ojha, Sunil;
Kumar, Shyam

Publication type:

Article

A mechanism for water splitting and hydrogen absorbing functions of metal-oxide layered hydrogen storage materials studied by means of ion beam analysis.

Published in:

Surface & Interface Analysis: SIA, 2014, v. 46, n. 3, p. 113, doi. 10.1002/sia.5359

By:

Morita, Kenji;
Tsuchiya, Bun

Publication type:

Article

Nanoelectromechanical device fabrications by 3-D nanotechnology using focused-ion beams.

Published in:

Science & Technology of Advanced Materials, 2009, v. 10, n. 3, p. 1, doi. 10.1088/1468-6996/10/3/034501

By:

Kometani, Reo;
Ishihara, Sunao

Publication type:

Article

Carbon-backed thin tin (116Sn) isotope target fabrication by physical vapor deposition technique.

Published in:

Journal of Radioanalytical & Nuclear Chemistry, 2020, v. 326, n. 1, p. 97, doi. 10.1007/s10967-020-07316-0

By:

Deb, Nabendu Kumar;
Kalita, Kushal;
Giri, Pankaj Kumar;
Abhilash, S. R.;
Umapathy, G. R.;
Biswas, Rohan;
Das, Amar;
Kabiraj, D.;
Chopra, S.;
Bhuyan, M.

Publication type:

Article

Synthesis of SnO2/CuO/SnO2 Multi-layered Structure for Photoabsorption: Compositional and Some Interfacial Structural Studies.

Published in:

Journal of Nigerian Society of Physical Sciences, 2021, p. 74, doi. 10.46481/jnsps.2021.160

By:

Animasahun, L. O.;
Taleatu, B. A.;
Adewinbi, S. A.;
Bolarinwa, H. S.;
Fasasi, A. Y.

Publication type:

Article

Study of a SiO2/Si Structure Implanted with 64Zn+ and 16O+ Ions and Heat Treated in a Neutral Inert Environment.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2019, v. 13, n. 3, p. 382, doi. 10.1134/S1027451019030169

By:

Privezentsev, V. V.;
Kulikauskas, V. S.;
Zatekin, V. V.;
Zinenko, V. I.;
Agafonov, Yu. A.;
Egorov, V. K.;
Steinman, E. A.;
Tereshchenko, A. N.;
Shcherbachev, K. D.

Publication type:

Article

Microanálisis de capas pictóricas en esculturas policromadas.

Published in:

Nucleus, 2008, n. 44, p. 34

By:

Mendoza Cuevas, Ariadna

Publication type:

Article

Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure.

Published in:

Semiconductor Physics, Quantum Electronics & Optoelectronics, 2008, v. 11, n. 3, p. 252, doi. 10.15407/spqeo11.03.252

By:

Kurbatov, D.;
Opanasyuk, A.;
Denisenko, V.;
Kramchenkov, A.;
Zaharets, M.

Publication type:

Article

NUMERICAL SIMULATION OF PROTON BACKSCATTERING SPECTRA IN GEANT4 TOOLKIT.

Published in:

Lithuanian Journal of Physics, 2024, v. 64, n. 1, p. 48, doi. 10.3952/physics.2024.64.1.5

By:

Lingis, D.;
Gaspariūnas, M.;
Kovalevskij, V.;
Plukis, A.;
Remeikis, V.

Publication type:

Article

The Influence of Ion Implantation on the Optical Parameters - Refraction and Extinction Coefficients of the Oxygen-Enriched Layers Covering GaAs Implanted with Indium Ions.

Published in:

Acta Physica Polonica: A, 2009, v. 116, p. S.129, doi. 10.12693/APhysPolA.116.S-129

By:

Rzodkiewicz, W.;
Kulik, M.;
Pyszniak, K.;
Kobzev, A. P.

Publication type:

Article

Co‐implantation of Er and Yb ions into single‐crystalline and nano‐crystalline diamond.

Published in:

Surface & Interface Analysis: SIA, 2018, v. 50, n. 11, p. 1218, doi. 10.1002/sia.6407

By:

Cajzl, Jakub;
Akhetova, Banu;
Nekvindová, Pavla;
Macková, Anna;
Malinský, Petr;
Oswald, Jiří;
Remeš, Zdeněk;
Varga, Marián;
Kromka, Alexander

Publication type:

Article

Time-evolution of Electrophoretically Deposited CdSe Nanocrystal Films.

Published in:

Journal of the Tennessee Academy of Science, 2014, v. 89, n. 1, p. 36

By:

Smith, Nathanael J.;
Johnston, Jamin M.

Publication type:

Article

Interaction of Ce(dbp)3 with surface of aluminium alloy 2024-T3 using macroscopic models of intermetallic phases.

Published in:

Corrosion Engineering, Science & Technology, 2009, v. 44, n. 6, p. 416, doi. 10.1179/147842208X320333

By:

Scholes, F. H.;
Hughes, A. E.;
Jamieson, D.;
Inoue, K.;
Furman, S. A.;
Muster, T. H.;
Hardin, S. G.;
Lau, D.;
Harvey, T. G.;
Corrigan, P.;
Glenn, M.;
White, P. A.;
Mardel, J.;
Forsyth, M.

Publication type:

Article

Preferential Location of Dopants in the Amorphous Phase of Oriented Regioregular Poly(3‐hexylthiophene‐2,5‐diyl) Films Helps Reach Charge Conductivities of 3000 S cm−1.

Published in:

Advanced Functional Materials, 2022, v. 32, n. 30, p. 1, doi. 10.1002/adfm.202202075

By:

Zhong, Yuhan;
Untilova, Viktoriia;
Muller, Dominique;
Guchait, Shubhradip;
Kiefer, Céline;
Herrmann, Laurent;
Zimmermann, Nicolas;
Brosset, Marion;
Heiser, Thomas;
Brinkmann, Martin

Publication type:

Article

Full Control of Polarization in Ferroelectric Thin Films Using Growth Temperature to Modulate Defects.

Published in:

Advanced Electronic Materials, 2020, v. 6, n. 12, p. 1, doi. 10.1002/aelm.202000852

By:

Weymann, Christian;
Lichtensteiger, Céline;
Fernandez‐Peña, Stéphanie;
Naden, Aaron B.;
Dedon, Liv R.;
Martin, Lane W.;
Triscone, Jean‐Marc;
Paruch, Patrycja

Publication type:

Article

The Structure and Properties of a Hard Alloy Coating Deposited by High-Velocity Pulsed Plasma Jet onto a Copper Substrate.

Published in:

Technical Physics Letters, 2001, v. 27, n. 9, p. 749, doi. 10.1134/1.1405248

By:

Pogrebnyak, A. D.;
Il’yashenko, M. V.;
Kshnyakin, V. S.;
Tyurin, Yu. N.;
Ivanov, Yu. F.

Publication type:

Article

Atomic layer deposition of the titanium dioxide thin film from tetraethoxytitanium and water.

Published in:

Russian Journal of General Chemistry, 2010, v. 80, n. 6, p. 1091, doi. 10.1134/S1070363210060095

By:

Alekhin, A. P.;
Lapushkin, G. I.;
Markeev, A. M.;
Sigarev, A. A.;
Toknova, V. F.

Publication type:

Article

Effect of ion velocity on SHI-induced mixing in Ti/Bi system.

Published in:

Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2016, v. 171, n. 3/4, p. 290, doi. 10.1080/10420150.2016.1179309

By:

Bansal, Nisha;
Kumar, Sarvesh;
Khan, Saif Ahmad;
Chauhan, R.S.

Publication type:

Article

Investigation of energetic ion-induced mixing in Bi/Ge system.

Published in:

Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2014, v. 169, n. 10, p. 855, doi. 10.1080/10420150.2014.958748

By:

Bansal, Nisha;
Kumar, Sarvesh;
Pratap, Deepti;
Khan, Saif Ahmad;
Chauhan, R.S.

Publication type:

Article

Profiling measurements of metal ion distribution in thin polymer inclusion membranes by Rutherford backscattering spectrometry.

Published in:

Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2014, v. 169, n. 5, p. 388, doi. 10.1080/10420150.2013.865621

By:

Guedioura, B.;
Bendjaballah, N.;
Alioui, N.

Publication type:

Article

Investigation of ion beam mixing threshold value in Mn/Si system using swift heavy ions.

Published in:

Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2013, v. 168, n. 7/8, p. 607, doi. 10.1080/10420150.2013.798322

By:

Pratap, Deepti;
Kumar, Vijay;
Jain, Anshul;
Gupta, A.;
Kumar, Sarvesh;
Sulania, I.;
Tripathi, A.;
Chauhan, R.S.

Publication type:

Article

On the mechanism of damage buildup in gallium nitride.

Published in:

Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2013, v. 168, n. 6, p. 431, doi. 10.1080/10420150.2013.777445

By:

Turos, A.

Publication type:

Article

The effect of TiN nanoparticles deposition with different number of shots on SS316L by plasma focus device.

Published in:

Radiation Effects & Defects in Solids: Incorporating Plasma Techniques & Plasma Phenomena, 2013, v. 168, n. 3, p. 188, doi. 10.1080/10420150.2013.767251

By:

Omrani, Malihe;
Amrollahi, Reza;
Habibi, Morteza

Publication type:

Article