Works matching IS 09574522 AND DT 2012 AND VI 23 AND IP 4
1
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 817, doi. 10.1007/s10854-011-0499-2
- Serena Saw, W.;
- Mariatti, M.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 865, doi. 10.1007/s10854-011-0508-5
- Zhang, Lu;
- Wu, Yugong;
- Guo, Xiaozan;
- Wang, Zhiyuan;
- Zou, Yanan
- Article
3
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 858, doi. 10.1007/s10854-011-0506-7
- Wu, Zhengcui;
- Jiang, Lidan;
- Chen, Huamao;
- Xu, Chengrong;
- Wang, Xiuhua
- Article
4
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 837, doi. 10.1007/s10854-011-0503-x
- Konwer, Surajit;
- Barthakur, Lakhya;
- Dolui, Swapan
- Article
5
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 870, doi. 10.1007/s10854-011-0509-4
- Du, Yong;
- Cai, Kefeng;
- Shen, Shirley;
- An, Baijun;
- Qin, Zhen;
- Casey, Philip
- Article
6
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 851, doi. 10.1007/s10854-011-0505-8
- Peng, Changwen;
- Zhang, Huimin;
- Chang, Aimin;
- Guan, Fang;
- Zhang, Bo;
- Zhao, Pengjun
- Article
7
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 825, doi. 10.1007/s10854-011-0501-z
- Chen, Yih-Chien;
- Yao, Shi-Li
- Article
8
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 846, doi. 10.1007/s10854-011-0504-9
- Shao, Bin;
- Qiu, Jinhao;
- Zhu, Kongjun;
- Pang, Xuming;
- Meng, Qinghua
- Article
9
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 897, doi. 10.1007/s10854-011-0517-4
- Guo, Dongyun;
- Goto, Takashi;
- Wang, Chuanbin;
- Shen, Qiang;
- Zhang, Lianmeng
- Article
10
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 889, doi. 10.1007/s10854-011-0514-7
- Chiou, Ai-Huei;
- Chang, Yu-Ming;
- Wu, Wen-Fa;
- Chou, Chang-Ping;
- Hsu, Chun-Yao
- Article
11
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 940, doi. 10.1007/s10854-011-0524-5
- Guo, Dongyun;
- Mao, Wei;
- Qin, Yan;
- Huang, Zhixiong;
- Wang, Chuanbin;
- Shen, Qiang;
- Zhang, Lianmeng
- Article
12
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 882, doi. 10.1007/s10854-011-0513-8
- Article
13
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 877, doi. 10.1007/s10854-011-0510-y
- Mani Rahulan, K.;
- Vinitha, G.;
- Ganesan, S.;
- Philip, Reji;
- Aruna, P.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 928, doi. 10.1007/s10854-011-0522-7
- Yildirim, G.;
- Varilci, A.;
- Akdogan, M.;
- Terzioglu, C.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 909, doi. 10.1007/s10854-011-0519-2
- Patil, A.;
- Hankare, P.;
- Gaikawad, A.;
- Garadkar, K.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 913, doi. 10.1007/s10854-011-0520-9
- Iyevlev, V.;
- Sumets, M.;
- Kostyuchenko, A.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 921, doi. 10.1007/s10854-011-0521-8
- Lei, Yajie;
- Zhao, Rui;
- Xu, Mingzhen;
- Zhao, Xin;
- Yang, Xulin;
- Guo, Heng;
- Zhong, Jiachun;
- Liu, Xiaobo
- Article
18
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 901, doi. 10.1007/s10854-011-0518-3
- Raj, P.;
- Xiang, Shu;
- Kumar, Manish;
- Abothu, Isaac;
- Hwang, Jin-Hyun;
- Liu, Yuzi;
- Yamamoto, Hiroshi;
- Tummala, Rao
- Article
19
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 936, doi. 10.1007/s10854-011-0523-6
- Article
20
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 972, doi. 10.1007/s10854-011-0529-0
- Article
21
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 952, doi. 10.1007/s10854-011-0526-3
- Kanagesan, S.;
- Jesurani, S.;
- Velmurugan, R.;
- Kalaivani, T.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 945, doi. 10.1007/s10854-011-0525-4
- D'Urzo, Lucia;
- Schaltin, Stijn;
- Shkurankov, Andrey;
- Plank, Harald;
- Kothleitner, Gerald;
- Gspan, Christian;
- Binnemans, Koen;
- Fransaer, Jan
- Article
23
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 956, doi. 10.1007/s10854-011-0527-2
- Raut, B.;
- Godse, P.;
- Pawar, S.;
- Chougule, M.;
- Patil, V.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 964, doi. 10.1007/s10854-011-0528-1
- Li, Zhao-Hui;
- Cho, Eou-Sik;
- Kwon, Sang;
- Dagenais, Mario
- Article
25
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 832, doi. 10.1007/s10854-011-0502-y
- Liu, Hui;
- Yang, Jing;
- Hua, Zhong;
- Zhang, Yong;
- Liu, Yang;
- Cao, Jian;
- Fei, Lian;
- Cheng, Xin
- Article