Works matching IS 09574522 AND DT 2010 AND VI 21 AND IP 6
1
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 630, doi. 10.1007/s10854-009-9968-2
- Xiang Shen;
- Yanxin Wang;
- Xiang Yang;
- Liqiang Lu;
- Liang Huang
- Article
2
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 608, doi. 10.1007/s10854-009-9965-5
- Çadırlı, E.;
- Böyük, U.;
- Engin, S.;
- Kaya, H.;
- Maraşlı, N.;
- Keşlioğlu, K.;
- Ülgen, A.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 625, doi. 10.1007/s10854-009-9967-3
- Qiaoji Zheng;
- Dunmin Lin;
- Xiaochun Wu;
- Chenggang Xu;
- Chun Yang;
- Kwok, K. W.
- Article
4
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 595, doi. 10.1007/s10854-009-9963-7
- Manivannan, S.;
- Je Hwang Ryu;
- Jin Jang;
- Kyu Chang Park
- Article
5
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 578, doi. 10.1007/s10854-009-9960-x
- Senthilkumar, V.;
- Vickraman, P.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 619, doi. 10.1007/s10854-009-9966-4
- Jun Yan;
- Zhuangjun Fan;
- Tong Wei;
- Milin Zhang
- Article
7
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 635, doi. 10.1007/s10854-009-9969-1
- Liang Zhang;
- Song-bai Xue;
- Li-li Gao;
- Zhong Sheng;
- Guang Zeng;
- Yan Chen;
- Sheng-lin Yu
- Article
8
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 571, doi. 10.1007/s10854-009-9959-3
- Shojaee, Seyyed Ali;
- Shahraki, Mohammad Maleki;
- Sani, Mohammad Ali Faghihi;
- Nemati, Ali;
- Yousefi, Abbas
- Article
9
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 584, doi. 10.1007/s10854-009-9961-9
- Article
10
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 589, doi. 10.1007/s10854-009-9962-8
- Hua Wang;
- Mu-hui Xu;
- Ji-wen Xu;
- Ming-fang Ren;
- Ling Yang
- Article
11
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 554, doi. 10.1007/s10854-009-9956-6
- Zhiyue Han;
- Jingchang Zhang;
- Xiuying Yang;
- Hong Zhu;
- Weiliang Cao
- Article
12
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 535, doi. 10.1007/s10854-009-9953-9
- Article
13
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 548, doi. 10.1007/s10854-009-9955-7
- Pascuta, Petru;
- Lungu, Rares;
- Ardelean, Ioan
- Article
14
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 540, doi. 10.1007/s10854-009-9954-8
- Article
15
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 562, doi. 10.1007/s10854-009-9957-5
- Xiaotun Qiu;
- Welch, David;
- Christen, Jennifer;
- Jie Zhu;
- Jon Oiler;
- Cunjiang Yu;
- Ziyu Wang;
- Hongyu Yu
- Article
16
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 567, doi. 10.1007/s10854-009-9958-4
- Sahu, Satyajit;
- Sharma, Ashwani K.;
- Cook, Michael J.;
- Ray, Asim K.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 603, doi. 10.1007/s10854-009-9964-6
- Shakoor, A.;
- Rizvi, T. Z.;
- Sulaiman, M.;
- Nasir, M.;
- Ishtiaq, M.
- Article