Works matching IS 09574522 AND DT 2010 AND VI 21 AND IP 4
1
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 355, doi. 10.1007/s10854-009-9920-5
- Patil, V. B.;
- Pawar, S. G.;
- Patil, S. L.;
- Krupanidhi, S. B.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 338, doi. 10.1007/s10854-009-9917-0
- Article
3
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 349, doi. 10.1007/s10854-009-9919-y
- Cui Chuanwen;
- Shi Feng;
- Li Yuguo;
- Wang Shuyun
- Article
4
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 326, doi. 10.1007/s10854-009-9914-3
- Shenghuang Lin;
- Zhiming Chen;
- Bo Liu;
- Lianbi Li;
- Xianfeng Feng
- Article
5
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 317, doi. 10.1007/s10854-009-9913-4
- Wei Cai;
- Chunlin Fu;
- Jiacheng Gao;
- Xiaoling Deng
- Article
6
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 360, doi. 10.1007/s10854-009-9921-4
- Smatko, V.;
- Golovanov, V.;
- Liu, C. C.;
- Kiv, A.;
- Fuks, D.;
- Donchev, I.;
- Ivanovskaya, M.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 364, doi. 10.1007/s10854-009-9922-3
- Changrong Zhou;
- Xinyu Liu;
- Weizhou Li;
- Changlai Yuan
- Article
8
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 343, doi. 10.1007/s10854-009-9918-z
- Senthilkumar, V.;
- Vickraman, P.;
- Jayachandran, M.;
- Sanjeeviraja, C.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 368, doi. 10.1007/s10854-009-9925-0
- Haibo Yang;
- Ying Lin;
- Jianfeng Zhu;
- Fen Wang
- Article
10
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 380, doi. 10.1007/s10854-009-9928-x
- Zhike Liu;
- Yajun Qi;
- Chaojing Lu
- Article
11
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 373, doi. 10.1007/s10854-009-9926-z
- Muftah, G. E. A.;
- Samantilleke, A. P.;
- Warren, P. D.;
- Heavens, S. N.;
- Dharmadasa, I. M.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 385, doi. 10.1007/s10854-009-9929-9
- Chun-Shin Yeh;
- Dau-Chung Wang;
- Bohr-Ran Huang;
- Shih-Fong Lee;
- Jung-Fu Hsu;
- Jen-Yuan Mao
- Article
13
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 393, doi. 10.1007/s10854-009-9930-3
- Prathap, P.;
- Reddy, A. Suryanarayana;
- Revathi, N.;
- Subbaiah, Y. P. Venkata;
- Reddy, K. T.Ramakrishna
- Article
14
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 331, doi. 10.1007/s10854-009-9916-1
- Gaponov, A. V.;
- Glot, A. B.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 399, doi. 10.1007/s10854-009-9931-2
- Kapil, Atul;
- Taunk, Manish;
- Chand, Subhash
- Article
16
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 405, doi. 10.1007/s10854-009-9933-0
- Article
17
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 416, doi. 10.1007/s10854-009-9935-y
- Xiao Lou;
- Wenjian Weng;
- Kui Cheng;
- Chenlu Song;
- Piyi Du;
- Ge Shen;
- Gaorong Han
- Article
18
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 410, doi. 10.1007/s10854-009-9934-z
- Article