Works matching IS 09574522 AND DT 2009 AND VI 20 AND IP 1
Results: 14
Failure behaviors of BGA solder joints under various loading conditions of high-speed shear test.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 17, doi. 10.1007/s10854-008-9588-2
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- Article
An alternative process for electroless copper plating on polyester fabric.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 33, doi. 10.1007/s10854-008-9594-4
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- Article
Capacitance and resistance measurements of SnO<sub>2</sub> thick-films.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 25, doi. 10.1007/s10854-008-9590-8
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- Article
The influence of area/volume ratio on microstructure and non-Ohmic properties of SnO<sub>2</sub>-based varistor ceramic blocks.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 49, doi. 10.1007/s10854-008-9602-8
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- Article
Thermally stable and low-resistance W/Ti/Au contacts to n-type GaN.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 9, doi. 10.1007/s10854-008-9586-4
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- Article
Microwave dielectric properties of 3Li<sub>2</sub>O–Nb<sub>2</sub>O<sub>5</sub>–3TiO<sub>2</sub> ceramics with Li<sub>2</sub>O–V<sub>2</sub>O<sub>5</sub> additions.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 39, doi. 10.1007/s10854-008-9600-x
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- Article
Stability of AuSn eutectic solder cap on Au socket during reflow.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 55, doi. 10.1007/s10854-008-9606-4
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- Article
Structural, optical, magnetic and electrical properties of Zn<sub>1− x </sub>Co<sub> x </sub>O thin films.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 60, doi. 10.1007/s10854-008-9607-3
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- Article
Electron beam induced second-harmonic generation in Er<sup>3+</sup> doped PbO–GeO<sub>2</sub> glasses containing silver nanoparticles.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 87, doi. 10.1007/s10854-008-9617-1
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- Article
Influence of thickness on nanomechanical behavior of Black Diamond™ low dielectric thin films for interconnect and packaging applications.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 74, doi. 10.1007/s10854-008-9610-8
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- Article
Photoelectrochemical properties of brush plated Cd<sub> x </sub>Zn<sub>1− x </sub>Se films.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 92, doi. 10.1007/s10854-008-9618-0
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- Article
Studies of BaTiO<sub>3</sub> thin films on different bottom electrode.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 44, doi. 10.1007/s10854-008-9601-9
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- Article
Effect of β-irradiation on photoluminescence of MOCVD grown GaN.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 14, doi. 10.1007/s10854-008-9587-3
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- Article
Sintering mechanisms in aluminum nitride with Y or Ca-containing additive.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 1, doi. 10.1007/s10854-008-9737-7
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- Article