Works matching DE "STRAY current measurement"
1
- Engineering, Technology & Applied Science Research, 2013, v. 3, n. 6, p. 544, doi. 10.48084/etasr.418
- Pylarinos, D.;
- Theofilatos, K.;
- Siderakis, K.;
- Thalassinakis, E.
- Article
2
- Journal of Low Power Electronics & Applications, 2014, v. 4, n. 3, p. 252, doi. 10.3390/jlpea4030252
- Bolus, Jonathan F.;
- Calhoun, Benton H.;
- Blalock, Travis N.
- Article
3
- Journal of Low Power Electronics & Applications, 2014, v. 4, n. 3, p. 231, doi. 10.3390/jlpea4030231
- Redd, Bennion;
- Kellis, Spencer;
- Gaskin, Nathaniel;
- Brown, Richard
- Article
4
- Journal of Materials Science, 2014, v. 49, n. 15, p. 5355, doi. 10.1007/s10853-014-8243-y
- Gupta, Surbhi;
- Tomar, Monika;
- James, A.;
- Gupta, Vinay
- Article
5
- Journal of Materials Science, 2013, v. 48, n. 9, p. 3511, doi. 10.1007/s10853-013-7144-9
- Hejazi, M.;
- Taghaddos, E.;
- Safari, A.
- Article
6
- Journal of Materials Science, 2013, v. 48, n. 3, p. 1180, doi. 10.1007/s10853-012-6857-5
- Ma, Beihai;
- Chao, Sheng;
- Narayanan, Manoj;
- Liu, Shanshan;
- Tong, Sheng;
- Koritala, Rachel;
- Balachandran, Uthamalingam
- Article
7
- Crystal Research & Technology, 2016, v. 51, n. 12, p. 696, doi. 10.1002/crat.201600073
- Wang, Zan;
- Jiang, Wei;
- Li, San-Xi;
- Song, De-Zhi
- Article
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 3, p. 56, doi. 10.1049/el.2012.3847
- Article
9
- Journal of Circuits, Systems & Computers, 2013, v. 22, n. 5, p. -1, doi. 10.1142/S0218126613500382
- ZHANG, TIEFEI;
- CHEN, TIANZHOU;
- WU, JIANZHONG;
- QU, YOUTIAN
- Article
10
- IET Science, Measurement & Technology (Wiley-Blackwell), 2021, v. 15, n. 4, p. 376, doi. 10.1049/smt2.12039
- Das, Arup Kumar;
- Dalai, Sovan;
- Chatterjee, Biswendu
- Article
