Title: Surface observation of LaNiO<sub>3</sub>/MgO (100) structure.
Authors: Kim, B. H.; An, J. H.; Hwang, K. S.
Abstract: The article reports on an atomic force microscope (AFM) study on the polycrystalline LaNiO3 thin films on MgO substrate, with particular interest being paid to the influence of substrate on the surface morphology and roughness. The authors obtained a graphical impression of the surface microstructure by directly viewing the three-dimensional AFM images.
Subjects: ATOMIC force microscopy; SCANNING probe microscopy; POLYCRYSTALS; THIN films; MAGNESIUM oxide; SCANNING electron microscopy
Publication: Journal of Materials Science, 2006, Vol 41, Issue 7, p2165
ISSN: 0022-2461
Publication type: Academic Journal
DOI: 10.1007/s10853-006-5193-z

Surface observation of LaNiO<sub>3</sub>/MgO (100) structure.

Kim, B. H.; An, J. H.; Hwang, K. S.