Works matching IS 09238174 AND DT 2024 AND VI 40 AND IP 2
1
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 137, doi. 10.1007/s10836-024-06120-y
- Article
2
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 139, doi. 10.1007/s10836-024-06117-7
- Roy, Soham;
- Millican, Spencer K.;
- Agrawal, Vishwani D.
- Article
3
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 229, doi. 10.1007/s10836-024-06116-8
- Arasteh, Bahman;
- Golshan, Sahar;
- Shami, Shiva;
- Kiani, Farzad
- Article
4
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 199, doi. 10.1007/s10836-024-06115-9
- Bosio, Alberto;
- Germiniani, Samuele;
- Pravadelli, Graziano;
- Traiola, Marcello
- Article
5
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 185, doi. 10.1007/s10836-024-06114-w
- Cao, Rongxing;
- Liu, Yan;
- Cai, Yulong;
- Mei, Bo;
- Zhao, Lin;
- Tian, Jiayu;
- Cui, Shuai;
- Lv, He;
- Zeng, Xianghua;
- Xue, Yuxiong
- Article
6
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 171, doi. 10.1007/s10836-024-06113-x
- Ahirwar, Rachana;
- Pattanaik, Manisha;
- Srivastava, Pankaj
- Article
7
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 275, doi. 10.1007/s10836-024-06112-y
- Wen, Ching-Yi;
- Huang, Shi-Yu
- Article
8
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 159, doi. 10.1007/s10836-024-06109-7
- Liu, Baojun;
- Cai, Li;
- Li, Chuang
- Article
9
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 215, doi. 10.1007/s10836-024-06107-9
- Rodriguez Condia, Josie E.;
- Guerrero-Balaguera, Juan-David;
- Patiño Núñez, Edwar J.;
- Limas, Robert;
- Sonza Reorda, Matteo
- Article
10
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 259, doi. 10.1007/s10836-024-06106-w
- Bokka, Raveendranadh;
- Sadasivam, Tamilselvan
- Article
11
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 245, doi. 10.1007/s10836-024-06108-8
- Copetti, T. S.;
- Fieback, M.;
- Gemmeke, T.;
- Hamdioui, S.;
- Poehls, L. M. Bolzani
- Article