Works matching IS 09238174 AND DT 2024 AND VI 40 AND IP 1
Results: 12
2023 JETTA Reviewers.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 3, doi. 10.1007/s10836-024-06111-z
- Publication type:
- Article
Editorial.
- Published in:
- 2024
- By:
- Publication type:
- Editorial
Non-Invasive Hardware Trojans Modeling and Insertion: A Formal Verification Approach.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 117, doi. 10.1007/s10836-024-06100-2
- By:
- Publication type:
- Article
Design and Verification of an Asynchronous NoC Router Architecture for GALS Systems.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 61, doi. 10.1007/s10836-024-06104-y
- By:
- Publication type:
- Article
Reactant and Waste Minimization during Sample Preparation on Micro-Electrode-Dot-Array Digital Microfluidic Biochips using Splitting Trees.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 87, doi. 10.1007/s10836-024-06103-z
- By:
- Publication type:
- Article
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 75, doi. 10.1007/s10836-024-06102-0
- By:
- Publication type:
- Article
Research on the Reliability of Interconnected Solder Joints of Copper Pillars under Random Vibration.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 107, doi. 10.1007/s10836-024-06101-1
- By:
- Publication type:
- Article
A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 45, doi. 10.1007/s10836-024-06105-x
- By:
- Publication type:
- Article
Analysis of the Lifecycles of Automotive Resistor Lead in Random Vibration.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 101, doi. 10.1007/s10836-024-06099-6
- By:
- Publication type:
- Article
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 19, doi. 10.1007/s10836-024-06098-7
- By:
- Publication type:
- Article
An End-to-End Mutually Exclusive Autoencoder Method for Analog Circuit Fault Diagnosis.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 5, doi. 10.1007/s10836-023-06097-0
- By:
- Publication type:
- Article
General Fault and Soft-Error Tolerant Phase-Locked Loop by Enhanced TMR using A Synchronization-before-Voting Scheme.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 1, p. 31, doi. 10.1007/s10836-023-06095-2
- By:
- Publication type:
- Article