Works matching IS 09238174 AND DT 2023 AND VI 39 AND IP 2

Results: 10

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2023, v. 39, n. 2, p. 125, doi. 10.1007/s10836-023-06069-4
Publication type:: Article

Editorial.

Published in:

2023

By:

Agrawal, Vishwani D.

Publication type:

Editorial

Design of INV/BUFF Logic Locking For Enhancing the Hardware Security.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 2, p. 141, doi. 10.1007/s10836-023-06061-y

By:

Naveenkumar, R.;
Sivamangai, N. M.;
Napolean, A.;
Priya, S. Sridevi Sathya;
Ashika, S. V.

Publication type:

Article

Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 2, p. 227, doi. 10.1007/s10836-023-06060-z

By:

Jiang, Hui;
Zhang, Fanchen;
Dworak, Jennifer;
Nepal, Kundan;
Manikas, Theodore

Publication type:

Article

Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 2, p. 171, doi. 10.1007/s10836-023-06059-6

By:

Melis, Tommaso;
Simeu, Emmanuel;
Auvray, Etienne;
Saury, Luc

Publication type:

Article

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 2, p. 155, doi. 10.1007/s10836-023-06058-7

By:

El Badawi, H.;
Azais, F.;
Bernard, S.;
Comte, M.;
Kerzerho, V.;
Lefevre, F.

Publication type:

Article

Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 2, p. 189, doi. 10.1007/s10836-023-06057-8

By:

Song, Tai;
Huang, Zhengfeng;
Guo, Xiaohui;
Milos, Krstic

Publication type:

Article

A Tunable Concurrent BIST Design Based on Reconfigurable LFSR.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 2, p. 245, doi. 10.1007/s10836-023-06055-w

By:

Menbari, Ahmad;
Jahanirad, Hadi

Publication type:

Article

Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 2, p. 129, doi. 10.1007/s10836-023-06054-x

By:

Tang, Wenjing;
Su, Jing;
Gao, Yuchan

Publication type:

Article

Multiple Retest Systems for Screening High-Quality Chips.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 2, p. 207, doi. 10.1007/s10836-023-06051-0

By:

Yeh, Chung-Huang;
Chen, Jwu E.

Publication type:

Article