Works matching IS 09238174 AND DT 2023 AND VI 39 AND IP 3

Results: 10

Editorial.

Published in:

2023

By:

Agrawal, Vishwani D.

Publication type:

Correction Notice

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2023, v. 39, n. 3, p. 265, doi. 10.1007/s10836-023-06073-8
Publication type:: Article

Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 3, p. 371, doi. 10.1007/s10836-023-06071-w

By:

Rathor, Vijaypal Singh;
Singh, Deepak;
Singh, Simranjit;
Sajwan, Mohit

Publication type:

Article

A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 3, p. 347, doi. 10.1007/s10836-023-06070-x

By:

Arasteh, Bahman;
Gharehchopogh, Farhad Soleimanian;
Gunes, Peri;
Kiani, Farzad;
Torkamanian-Afshar, Mahsa

Publication type:

Article

Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 3, p. 275, doi. 10.1007/s10836-023-06068-5

By:

Coulié, K.;
Aziza, H.;
Rahajandraibe, W.

Publication type:

Article

Incomplete Testing of SOC.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 3, p. 387, doi. 10.1007/s10836-023-06067-6

By:

Singh, Kunwer Mrityunjay;
Deka, Jatindra;
Biswas, Santosh

Publication type:

Article

A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 3, p. 323, doi. 10.1007/s10836-023-06066-7

By:

Biswal, Pradeep Kumar

Publication type:

Article

Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 3, p. 289, doi. 10.1007/s10836-023-06064-9

By:

Huang, Zhengfeng;
Wang, Hao;
Ma, Dongxing;
Liang, Huaguo;
Ouyang, Yiming;
Yan, Aibin

Publication type:

Article

Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 3, p. 267, doi. 10.1007/s10836-023-06063-w

By:

Jooß, Benedikt;
Schramm, Dieter

Publication type:

Article

BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems.

Published in:

Journal of Electronic Testing, 2023, v. 39, n. 3, p. 303, doi. 10.1007/s10836-023-06062-x

By:

Deyati, Sabyasachi;
Muldrey, Barry;
Chatterjee, Abhijit

Publication type:

Article