Works matching IS 09238174 AND DT 2021 AND VI 37 AND IP 5/6

Results: 13

Editorial.

Published in:

2021

By:

Agrawal, Vishwani D.

Publication type:

Editorial

2020 JETTA-TTTC Best Paper Award.

Published in:: Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 571, doi. 10.1007/s10836-021-05982-w
Publication type:: Article

TTTC Newsletter.

Published in:: 2021
Publication type:: Announcement

Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 633, doi. 10.1007/s10836-021-05980-y

By:

Jena, Sisir Kumar;
Biswas, Santosh;
Deka, Jatindra Kumar

Publication type:

Article

Stress-Aware Periodic Test of Interconnects.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 715, doi. 10.1007/s10836-021-05979-5

By:

Sadeghi-Kohan, Somayeh;
Hellebrand, Sybille;
Wunderlich, Hans-Joachim

Publication type:

Article

A Framework for Configurable Joint-Scan Design-for-Test Architecture.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 593, doi. 10.1007/s10836-021-05978-6

By:

Tudu, Jaynarayan T.;
Ahlawat, Satyadev;
Shukla, Sonali;
Singh, Virendra

Publication type:

Article

Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 685, doi. 10.1007/s10836-021-05977-7

By:

Georgoulopoulos, Nikolaos;
Hatzopoulos, Alkiviadis

Publication type:

Article

Reducing Aging Impacts in Digital Sensors via Run-Time Calibration.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 653, doi. 10.1007/s10836-021-05976-8

By:

Anik, Md Toufiq Hasan;
Ebrahimabadi, Mohammad;
Danger, Jean-Luc;
Guilley, Sylvain;
Karimi, Naghmeh

Publication type:

Article

On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 577, doi. 10.1007/s10836-021-05975-9

By:

Jayabalan, Muralidharan;
Srinivas, E.;
Shajin, Francis H.;
Rajesh, P.

Publication type:

Article

A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 701, doi. 10.1007/s10836-021-05974-w

By:

Yang, Xiaoyan;
Yang, Chenglin;
Wang, Houjun

Publication type:

Article

Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph Representations.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 613, doi. 10.1007/s10836-021-05973-x

By:

Petho, Zsombor;
Khan, Intiyaz;
Torok, Árpád

Publication type:

Article

A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 675, doi. 10.1007/s10836-021-05972-y

By:

Yoshikawa, Takefumi;
Ishimaru, Masahiro;
Iwata, Tatsuya;
Mori, Fuma;
Kobayashi, Kazutoshi

Publication type:

Article

Error-Efficient Approximate Multiplier Design using Rounding Based Approach for Image Smoothing Application.

Published in:

Journal of Electronic Testing, 2021, v. 37, n. 5/6, p. 623, doi. 10.1007/s10836-021-05971-z

By:

Rao, E. Jagadeeswara;
Samundiswary, P.

Publication type:

Article