Editorial.
- Published in:
- 2020
- By:
- Publication type:
- Editorial
Works matching IS 09238174 AND DT 2020 AND VI 36 AND IP 2
Results: 12
1
2
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 145, doi. 10.1007/s10836-020-05874-5
- Publication type:
- Article
3
Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 183, doi. 10.1007/s10836-020-05873-6
- By:
- Publication type:
- Article
4
Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 239, doi. 10.1007/s10836-020-05872-7
- By:
- Publication type:
- Article
5
Speed-Up in Test Methods Using Probabilistic Merit Indicators.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 285, doi. 10.1007/s10836-020-05871-8
- By:
- Publication type:
- Article
6
A Novel Approach of Data Content Zeroization Under Memory Attacks.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 147, doi. 10.1007/s10836-020-05867-4
- By:
- Publication type:
- Article
7
Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 169, doi. 10.1007/s10836-020-05870-9
- By:
- Publication type:
- Article
8
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 271, doi. 10.1007/s10836-020-05869-2
- By:
- Publication type:
- Article
9
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 189, doi. 10.1007/s10836-020-05868-3
- By:
- Publication type:
- Article
10
Automated Bug Resistant Test Intent with Register Header Database for Optimized Verification.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 219, doi. 10.1007/s10836-020-05866-5
- By:
- Publication type:
- Article
11
An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic Biochips.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 205, doi. 10.1007/s10836-020-05865-6
- By:
- Publication type:
- Article
12
Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 255, doi. 10.1007/s10836-020-05864-7
- By:
- Publication type:
- Article