Editorial.
- Published in:
- 2019
- By:
- Publication type:
- Editorial
Works matching IS 09238174 AND DT 2019 AND VI 35 AND IP 4
Results: 13
1
2
An Efficient Wavelet Based Transient Current Test towards Detection of Data Retention Faults in SRAM.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 473, doi. 10.1007/s10836-019-05819-7
- By:
- Publication type:
- Article
3
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 423, doi. 10.1007/s10836-019-05815-x
- Publication type:
- Article
4
Connectivity Test for System in Package Interconnects.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 559, doi. 10.1007/s10836-019-05810-2
- By:
- Publication type:
- Article
5
Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 485, doi. 10.1007/s10836-019-05817-9
- By:
- Publication type:
- Article
6
16- Layer PCB Channel Design with Minimum Crosstalk and Optimization of VIA and TDR Analysis.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 497, doi. 10.1007/s10836-019-05814-y
- By:
- Publication type:
- Article
7
Security Analysis and Improvement of the Pseudo-random Number Generator Based on Piecewise Logistic Map.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 519, doi. 10.1007/s10836-019-05818-8
- By:
- Publication type:
- Article
8
Enhanced Authentication Using Hybrid PUF with FSM for Protecting IPs of SoC FPGAs.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 543, doi. 10.1007/s10836-019-05808-w
- By:
- Publication type:
- Article
9
Hardware Trojan Detection Leveraging a Novel Golden Layout Model Towards Practical Applications.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 529, doi. 10.1007/s10836-019-05816-w
- By:
- Publication type:
- Article
10
Test Flow Selection for Stacked Integrated Circuits.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 425, doi. 10.1007/s10836-019-05813-z
- By:
- Publication type:
- Article
11
Electromagnetic Parameters Measurement of Sheet Using Separate Microstrip Line.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 567, doi. 10.1007/s10836-019-05809-9
- By:
- Publication type:
- Article
12
Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 459, doi. 10.1007/s10836-019-05812-0
- By:
- Publication type:
- Article
13
Test Generation for Bridging Faults in Reversible Circuits Using Path-Level Expressions.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 441, doi. 10.1007/s10836-019-05811-1
- By:
- Publication type:
- Article