Works matching IS 09238174 AND DT 2018 AND VI 34 AND IP 4

Results: 11

High Performance Static Segment On-Chip Memory for Image Processing Applications.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 389, doi. 10.1007/s10836-018-5742-9

By:

Jothin, R.;
Vasanthanayaki, C.

Publication type:

Article

Test Technology Newsletter.

Published in:: 2018
Publication type:: Proceeding

Editorial.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 371, doi. 10.1007/s10836-018-5743-8

By:

Agrawal, Vishwani D.

Publication type:

Article

Low-Power Resonant Clocking Using Soft Error Robust Energy Recovery Flip-Flops.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 471, doi. 10.1007/s10836-018-5737-6

By:

Islam, Riadul

Publication type:

Article

Leakage-Aware Droop Measurement Built-in Self-Test Circuit for Digital Low-Dropout Regulators.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 405, doi. 10.1007/s10836-018-5744-7

By:

Dirican, Aydin;
Ozmen, Cagatay;
Margala, Martin

Publication type:

Article

Hardware Trojan Detection Using an Advised Genetic Algorithm Based Logic Testing.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 461, doi. 10.1007/s10836-018-5739-4

By:

Nourian, M. A.;
Fazeli, M.;
Hely, D.

Publication type:

Article

An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 417, doi. 10.1007/s10836-018-5738-5

By:

Silva, Felipe;
Silveira, Jardel;
Silveira, Jarbas;
Marcon, César;
Vargas, Fabian;
Lima, Otávio

Publication type:

Article

Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 435, doi. 10.1007/s10836-018-5741-x

By:

Lu, Shyue-Kung;
Jheng, Hao-Cheng;
Lin, Hao-Wei;
Hashizume, Masaki

Publication type:

Article

Test and Reliability in Approximate Computing.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 375, doi. 10.1007/s10836-018-5734-9

By:

Anghel, Lorena;
Benabdenbi, Mounir;
Bosio, Alberto;
Traiola, Marcello;
Vatajelu, Elena Ioana

Publication type:

Article

Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 447, doi. 10.1007/s10836-018-5733-x

By:

Zhang, Ying;
Ling, Li;
Jiang, Jianhui;
Xiao, Jie

Publication type:

Article

Fault Tolerance Mechanisms for FPGA-Based Regular Expression Matching.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 487, doi. 10.1007/s10836-018-5736-7

By:

Leipnitz, Marcos T.;
Nazar, Gabriel L.

Publication type:

Article