Editorial.
- Published in:
- 2018
- By:
- Publication type:
- Proceeding
Works matching IS 09238174 AND DT 2018 AND VI 34 AND IP 3
Results: 15
1
2
Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 337, doi. 10.1007/s10836-018-5724-y
- By:
- Publication type:
- Article
3
Test Technology Newsletter.
- Published in:
- 2018
- Publication type:
- Proceeding
4
A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 321, doi. 10.1007/s10836-018-5730-0
- By:
- Publication type:
- Article
5
Digital Predistortion for Spectrum Compliance in the Internet of Things.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 255, doi. 10.1007/s10836-018-5729-6
- By:
- Publication type:
- Article
6
Gate Oxide Short Defect Model in FinFETs.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 351, doi. 10.1007/s10836-018-5727-8
- By:
- Publication type:
- Article
7
Security Enhancements of a Mutual Authentication Protocol Used in a HF Full-Fledged RFID Tag.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 291, doi. 10.1007/s10836-018-5725-x
- By:
- Publication type:
- Article
8
Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 213, doi. 10.1007/s10836-018-5731-z
- By:
- Publication type:
- Article
9
Reliability Testing of 3D-Printed Electromechanical Scanning Devices.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 363, doi. 10.1007/s10836-018-5722-0
- By:
- Publication type:
- Article
10
Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST Applications.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 263, doi. 10.1007/s10836-018-5720-2
- By:
- Publication type:
- Article
11
Golden-Free Processor Hardware Trojan Detection Using Bit Power Consistency Analysis.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 305, doi. 10.1007/s10836-018-5715-z
- By:
- Publication type:
- Article
12
On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 281, doi. 10.1007/s10836-018-5710-4
- By:
- Publication type:
- Article
13
A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 215, doi. 10.1007/s10836-017-5700-y
- By:
- Publication type:
- Article
14
A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 313, doi. 10.1007/s10836-018-5713-1
- By:
- Publication type:
- Article
15
Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 233, doi. 10.1007/s10836-018-5708-y
- By:
- Publication type:
- Article