Works matching IS 09238174 AND DT 2017 AND VI 33 AND IP 6

Results: 11

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2017, v. 33, n. 6, p. 695, doi. 10.1007/s10836-017-5690-9
Publication type:: Article

Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 6, p. 751, doi. 10.1007/s10836-017-5693-6

By:

Raiola, Pascal;
Burchard, Jan;
Neubauer, Felix;
Erb, Dominik;
Becker, Bernd

Publication type:

Article

Study on Magnetic Probe Calibration in Near-field Measurement System for EMI Application.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 6, p. 741, doi. 10.1007/s10836-017-5691-8

By:

Tian, Gengxin;
Li, Jun;
Liu, Xiaofang;
Wan, Lixi;
Cao, Liqiang

Publication type:

Article

A Low Power Online Test Method for FPGA Single Solder Joint Resistance.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 6, p. 775, doi. 10.1007/s10836-017-5698-1

By:

Wang, Nantian;
Ma, Xiaoyu;
Xu, Xiaobin;
Rui, Ziqiao

Publication type:

Article

Editorial.

Published in:

2017

By:

Agrawal, Vishwani

Publication type:

Editorial

2016 JETTA-TTTC Best Paper Award.

Published in:: Journal of Electronic Testing, 2017, v. 33, n. 6, p. 691, doi. 10.1007/s10836-017-5689-2
Publication type:: Article

A Reliability-Aware Methodology to Isolate Timing-Critical Paths under Aging.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 6, p. 721, doi. 10.1007/s10836-017-5692-7

By:

Srivastava, Ankush;
Singh, Virendra;
Singh, Adit;
Saluja, Kewal

Publication type:

Article

A Study of PN Junction Diffusion Capacitance of MOSFET in Presence of Single Event Transient.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 6, p. 769, doi. 10.1007/s10836-017-5694-5

By:

Yi, Tengyue;
Liu, Yi;
Yang, Yintang

Publication type:

Article

2016-2017 JETTA Reviewers.

Published in:: Journal of Electronic Testing, 2017, v. 33, n. 6, p. 693, doi. 10.1007/s10836-017-5695-4
Publication type:: Article

A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 6, p. 709, doi. 10.1007/s10836-017-5696-3

By:

Duan, Yan;
Chen, Tao;
Chen, Degang

Publication type:

Article

A Diagnostics Method for Analog Circuits Based on Improved Kernel Entropy Component Analysis.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 6, p. 697, doi. 10.1007/s10836-017-5697-2

By:

Yuan, Zhijie;
He, Yigang;
Yuan, Lifen;
Cheng, Zhen

Publication type:

Article