Works matching IS 09238174 AND DT 2016 AND VI 32 AND IP 4
Results: 11
A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 4, p. 407, doi. 10.1007/s10836-016-5599-8
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- Publication type:
- Article
A New Approach for Modeling Inconsistencies in Digital-Assisted Analog Design.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 4, p. 491, doi. 10.1007/s10836-016-5600-6
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- Publication type:
- Article
Fault Diagnosis in Highly Dependable Medical Wearable Systems.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 4, p. 467, doi. 10.1007/s10836-016-5602-4
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- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 4, p. 401, doi. 10.1007/s10836-016-5603-3
- Publication type:
- Article
A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 4, p. 423, doi. 10.1007/s10836-016-5604-2
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- Publication type:
- Article
An Efficient Contact Screening Method and its Application to High-Reliability Non-Volatile Memories.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 4, p. 447, doi. 10.1007/s10836-016-5605-1
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- Publication type:
- Article
Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 4, p. 481, doi. 10.1007/s10836-016-5606-0
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- Publication type:
- Article
A Wideband Digital-to-Frequency Converter with Built-In Mechanism for Self-Interference Mitigation.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 4, p. 437, doi. 10.1007/s10836-016-5607-z
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- Publication type:
- Article
Guest Editorial: Analog, Mixed-Signal and RF Testing.
- Published in:
- 2016
- By:
- Publication type:
- Editorial
Editorial.
- Published in:
- 2016
- By:
- Publication type:
- Editorial
The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 4, p. 459, doi. 10.1007/s10836-016-5597-x
- By:
- Publication type:
- Article