Works matching IS 09238174 AND DT 2016 AND VI 32 AND IP 3

Results: 15

A New Capacitance-to-Frequency Converter for On-Chip Capacitance Measurement and Calibration in CMOS Technology.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 393, doi. 10.1007/s10836-016-5584-2

By:

Zhu, Dongdi;
Mo, Jiongjiong;
Xu, Shiyi;
Shang, Yongheng;
Wang, Zhiyu;
Huang, Zhengliang;
Yu, Faxin

Publication type:

Article

Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 257, doi. 10.1007/s10836-016-5582-4

By:

Ishida, Masahiro;
Nakura, Toru;
Kusaka, Takashi;
Komatsu, Satoshi;
Asada, Kunihiro

Publication type:

Article

A Fast Statistical Soft Error Rate Estimation Method for Nano-scale Combinational Circuits.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 291, doi. 10.1007/s10836-016-5583-3

By:

Raji, Mohsen;
Ghavami, Behnam

Publication type:

Article

Real-Time Adaptive Test Algorithm Including Test Escape Estimation Method.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 369, doi. 10.1007/s10836-016-5585-1

By:

Streitwieser, Christian

Publication type:

Article

An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 385, doi. 10.1007/s10836-016-5586-0

By:

Chen, Qingyu;
Wang, Haibin;
Chen, Li;
Li, Lixiang;
Zhao, Xing;
Liu, Rui;
Chen, Mo;
Li, Xuantian

Publication type:

Article

High Performance Significance Approximation Error Tolerance Adder for Image Processing Applications.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 377, doi. 10.1007/s10836-016-5587-z

By:

Jothin, R.;
Vasanthanayaki, C.

Publication type:

Article

Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 245, doi. 10.1007/s10836-016-5588-y

By:

Aleksejev, Igor;
Devadze, Sergei;
Jutman, Artur;
Shibin, Konstantin

Publication type:

Article

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 273, doi. 10.1007/s10836-016-5589-x

By:

Jenihhin, Maksim;
Squillero, Giovanni;
Copetti, Thiago;
Tihhomirov, Valentin;
Kostin, Sergei;
Gaudesi, Marco;
Vargas, Fabian;
Raik, Jaan;
Sonza Reorda, Matteo;
Bolzani Poehls, Leticia;
Ubar, Raimund;
Medeiros, Guilherme

Publication type:

Article

Side-Channel Information Characterisation Based on Cascade-Forward Back-Propagation Neural Network.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 345, doi. 10.1007/s10836-016-5590-4

By:

Saeedi, Ehsan;
Hossain, Md;
Kong, Yinan

Publication type:

Article

NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 315, doi. 10.1007/s10836-016-5592-2

By:

Copetti, T.;
Cardoso Medeiros, G.;
Bolzani Poehls, L.;
Vargas, F.

Publication type:

Article

Impact of Fin-Height on SRAM Soft Error Sensitivity and Cell Stability.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 307, doi. 10.1007/s10836-016-5591-3

By:

Villacorta, Hector;
Segura, Jaume;
Champac, Victor

Publication type:

Article

Security Path: An Emerging Design Methodology to Protect the FPGA IPs Against Passive/Active Design Tampering.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 329, doi. 10.1007/s10836-016-5593-1

By:

Zamanzadeh, Sharareh;
Jahanian, Ali

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2016, v. 32, n. 3, p. 243, doi. 10.1007/s10836-016-5594-0
Publication type:: Article

Editorial.

Published in:

2016

By:

Agrawal, Vishwani

Publication type:

Editorial

Automatic Feature Selection of Hardware Layout: A Step toward Robust Hardware Trojan Detection.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 357, doi. 10.1007/s10836-016-5581-5

By:

Nasr, Abdurrahman;
Abdulmageed, Mohamed

Publication type:

Article