Applications of Mixed-Signal Technology in Digital Testing.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 209, doi. 10.1007/s10836-016-5576-2
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2016 AND VI 32 AND IP 2
Results: 12
1
2
Editorial.
- Published in:
- 2016
- By:
- Publication type:
- Editorial
3
Exemplar-based Failure Triage for Regression Design Debugging.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 125, doi. 10.1007/s10836-016-5577-1
- By:
- Publication type:
- Article
4
Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAM.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 111, doi. 10.1007/s10836-016-5570-8
- By:
- Publication type:
- Article
5
A CMOS Ripple Detector for Voltage Regulator Testing.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 227, doi. 10.1007/s10836-016-5566-4
- By:
- Publication type:
- Article
6
Design and Temperature Reliability Testing for A 0.6-2.14GHz Broadband Power Amplifier.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 235, doi. 10.1007/s10836-016-5571-7
- By:
- Publication type:
- Article
7
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 137, doi. 10.1007/s10836-016-5573-5
- By:
- Publication type:
- Article
8
New Boolean Equation for Orthogonalizing of Disjunctive Normal Form based on the Method of Orthogonalizing Difference-Building.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 197, doi. 10.1007/s10836-016-5572-6
- By:
- Publication type:
- Article
9
An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible Circuits.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 175, doi. 10.1007/s10836-016-5574-4
- By:
- Publication type:
- Article
10
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 109, doi. 10.1007/s10836-016-5575-3
- Publication type:
- Article
11
Exploration of Noise Impact on Integrated Bulk Current Sensors.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 163, doi. 10.1007/s10836-016-5579-z
- By:
- Publication type:
- Article
12
A Hybrid Fault-Tolerant Architecture for Highly Reliable Processing Cores.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 147, doi. 10.1007/s10836-016-5578-0
- By:
- Publication type:
- Article