Works matching IS 09238174 AND DT 2014 AND VI 30 AND IP 4

Results: 10

Editorial.

Published in:

2014

By:

Agrawal, Vishwani

Publication type:

Editorial

A Functional Approach for Testing the Reorder Buffer Memory.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 4, p. 469, doi. 10.1007/s10836-014-5461-9

By:

Di Carlo, S.;
Gaudesi, M.;
Sanchez, E.;
Sonza Reorda, M.

Publication type:

Article

The Use of Software Engineering Methods for Efficacious Test Program Creation: A Supportive Evidence Based Case Study.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 4, p. 457, doi. 10.1007/s10836-014-5462-8

By:

Vock, Stefan;
Escalona, Omar;
Turner, Colin;
Owens, Frank

Publication type:

Article

Recovery Time and Fault Tolerance Improvement for Circuits mapped on SRAM-based FPGAs.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 4, p. 425, doi. 10.1007/s10836-014-5463-7

By:

Ullah, Anees;
Sterpone, Luca

Publication type:

Article

An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation Extraction.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 4, p. 415, doi. 10.1007/s10836-014-5464-6

By:

Tahanout, Cherifa;
Tahi, Hakim;
Djezzar, Boualem;
Benabdelmomene, Abdelmadjid;
Goudjil, Mohamed;
Nadji, Becharia

Publication type:

Article

Enhanced Low Complex Double Error Correction Coding with Crosstalk Avoidance for Reliable On-Chip Interconnection Link.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 4, p. 387, doi. 10.1007/s10836-014-5465-5

By:

Maheswari, M.;
Seetharaman, G.

Publication type:

Article

Analog Fault Diagnosis Using Conic Optimization and Ellipsoidal Classifiers.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 4, p. 443, doi. 10.1007/s10836-014-5466-4

By:

El-Gamal, Mohamed;
Hassan, Abdel-Karim;
Ibrahim, Ahmad

Publication type:

Article

Fault Detection of Linear Analog Integrated Circuit in Network.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 4, p. 483, doi. 10.1007/s10836-014-5468-2

By:

Li, Deliang;
Huang, Kaoli;
Wang, Changlong

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2014, v. 30, n. 4, p. 385, doi. 10.1007/s10836-014-5467-3
Publication type:: Article

A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 4, p. 401, doi. 10.1007/s10836-014-5459-3

By:

Tran, D.;
Virazel, A.;
Bosio, A.;
Dilillo, L.;
Girard, P.;
Pravossoudovich, S.;
Wunderlich, H.-J.

Publication type:

Article