Modeling of Physical Defects in PN Junction Based Graphene Devices.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 357, doi. 10.1007/s10836-014-5458-4
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2014 AND VI 30 AND IP 3
Results: 12
1
2
Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 329, doi. 10.1007/s10836-014-5453-9
- By:
- Publication type:
- Article
3
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 317, doi. 10.1007/s10836-014-5457-5
- By:
- Publication type:
- Article
4
The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 377, doi. 10.1007/s10836-014-5448-6
- By:
- Publication type:
- Article
5
Verilog HDL Simulator Technology: A Survey.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 255, doi. 10.1007/s10836-014-5449-5
- By:
- Publication type:
- Article
6
Research on the Efficiency Improvement of Design for Testability Using Test Point Allocation.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 371, doi. 10.1007/s10836-014-5450-z
- By:
- Publication type:
- Article
7
Editorial.
- Published in:
- 2014
- By:
- Publication type:
- Editorial
8
Benefits of Partitioning in a Projection-based and Realizable Model-order Reduction Flow.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 271, doi. 10.1007/s10836-014-5451-y
- By:
- Publication type:
- Article
9
A Novel Approach for Analog Circuit Fault Prognostics Based on Improved RVM.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 343, doi. 10.1007/s10836-014-5454-8
- By:
- Publication type:
- Article
10
GPUs Neutron Sensitivity Dependence on Data Type.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 307, doi. 10.1007/s10836-014-5456-6
- By:
- Publication type:
- Article
11
Learning-oriented Property Decomposition for Automated Generation of Directed Tests.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 287, doi. 10.1007/s10836-014-5452-x
- By:
- Publication type:
- Article
12
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 253, doi. 10.1007/s10836-014-5455-7
- Publication type:
- Article