Works matching IS 09238174 AND DT 2014 AND VI 30 AND IP 2

Results: 10

An On-Chip Sensor to Monitor NBTI Effects in SRAMs.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 2, p. 159, doi. 10.1007/s10836-014-5444-x

By:

Ceratti, A.;
Copetti, T.;
Bolzani, L.;
Vargas, F.;
Fagundes, R.

Publication type:

Article

Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent Undersampling.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 2, p. 213, doi. 10.1007/s10836-014-5442-z

By:

Bhatta, Debesh;
Banerjee, Aritra;
Deyati, Sabyasachi;
Tzou, Nicholas;
Chatterjee, Abhijit

Publication type:

Article

Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 2, p. 237, doi. 10.1007/s10836-014-5441-0

By:

Yuan, Haiying;
Mei, Jiaping;
Song, Hongying;
Guo, Kun

Publication type:

Article

An RTN Variation Tolerant SRAM Screening Test Design with Gaussian Mixtures Approximations of Long-Tail Distributions.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 2, p. 171, doi. 10.1007/s10836-014-5439-7

By:

Somha, Worawit;
Yamauchi, Hiroyuki

Publication type:

Article

Developing Inherently Resilient Software Against Soft-Errors Based on Algorithm Level Inherent Features.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 2, p. 193, doi. 10.1007/s10836-014-5438-8

By:

Arasteh, Bahman;
Miremadi, Seyed;
Rahmani, Amir

Publication type:

Article

Soft Fault Diagnosis of Analog Circuits via Frequency Response Function Measurements.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 2, p. 243, doi. 10.1007/s10836-014-5445-9

By:

Xie, Yongle;
Li, Xifeng;
Xie, Sanshan;
Xie, Xuan;
Zhou, Qizhong

Publication type:

Article

Error Correction Schemes with Erasure Information for Fast Memories.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 2, p. 183, doi. 10.1007/s10836-014-5440-1

By:

Evain, Samuel;
Savin, Valentin;
Gherman, Valentin

Publication type:

Article

Editorial.

Published in:

2014

By:

Agrawal, Vishwani

Publication type:

Editorial

A Test Time Theorem and its Applications.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 2, p. 229, doi. 10.1007/s10836-014-5447-7

By:

Venkataramani, Praveen;
Sindia, Suraj;
Agrawal, Vishwani

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2014, v. 30, n. 2, p. 157, doi. 10.1007/s10836-014-5443-y
Publication type:: Article