Works matching IS 09238174 AND DT 2013 AND VI 29 AND IP 5
1
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 647, doi. 10.1007/s10836-013-5409-5
- Bombieri, Nicola;
- Ebeid, Emad;
- Fummi, Franco;
- Lora, Michele
- Article
2
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 685, doi. 10.1007/s10836-013-5406-8
- Article
3
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 619, doi. 10.1007/s10836-013-5412-x
- Article
4
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 625, doi. 10.1007/s10836-013-5404-x
- Article
5
- 2013
- Ray, Sandip;
- Bhadra, Jay;
- Abadir, Magdy;
- Wang, Li-C
- Editorial
6
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 715, doi. 10.1007/s10836-013-5407-7
- Article
7
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 635, doi. 10.1007/s10836-013-5405-9
- Sousa, Marcelo;
- Sen, Alper
- Article
8
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 697, doi. 10.1007/s10836-013-5410-z
- Uygur, Gürkan;
- Sattler, Sebastian
- Article
9
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 669, doi. 10.1007/s10836-013-5403-y
- Liu, Lingyi;
- Vasudevan, Shobha
- Article